{"id":"https://openalex.org/W2946360036","doi":"https://doi.org/10.1109/irps.2019.8720540","title":"Recent Updates to Transistor Level Reliability Analysis","display_name":"Recent Updates to Transistor Level Reliability Analysis","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946360036","doi":"https://doi.org/10.1109/irps.2019.8720540","mag":"2946360036"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720540","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720540","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027024294","display_name":"Art Schaldenbrand","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Art Schaldenbrand","raw_affiliation_strings":["Cadence Design Systems, Inc., Custom IC and PCB Group, San Jose, CA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Custom IC and PCB Group, San Jose, CA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047052112","display_name":"Jushan Xie","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jushan Xie","raw_affiliation_strings":["Cadence Design Systems, Inc., Custom IC and PCB Group, San Jose, CA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Custom IC and PCB Group, San Jose, CA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009755181","display_name":"H.Y. Elhak","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hany Elhak","raw_affiliation_strings":["Cadence Design Systems, Inc., Custom IC and PCB Group, San Jose, CA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Inc., Custom IC and PCB Group, San Jose, CA","institution_ids":["https://openalex.org/I66217453"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5027024294"],"corresponding_institution_ids":["https://openalex.org/I66217453"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.03633081,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8111386299133301},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7202068567276001},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6252539753913879},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5137087106704712},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4968107044696808},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4608800411224365},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.43526074290275574},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39201948046684265},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2531622052192688},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21282926201820374},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08086097240447998},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06509676575660706}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8111386299133301},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7202068567276001},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6252539753913879},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5137087106704712},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4968107044696808},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4608800411224365},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.43526074290275574},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39201948046684265},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2531622052192688},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21282926201820374},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08086097240447998},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06509676575660706},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720540","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720540","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1522481364","https://openalex.org/W1540821800","https://openalex.org/W1568009616","https://openalex.org/W1928777464","https://openalex.org/W1977366479","https://openalex.org/W1982214452","https://openalex.org/W1982515552","https://openalex.org/W2036537371","https://openalex.org/W2039518657","https://openalex.org/W2073484775","https://openalex.org/W2075614785","https://openalex.org/W2075695290","https://openalex.org/W2111642414","https://openalex.org/W2134777311","https://openalex.org/W2149848632","https://openalex.org/W2159087234","https://openalex.org/W2160893843","https://openalex.org/W2162734816","https://openalex.org/W2167724032","https://openalex.org/W2290288937","https://openalex.org/W2291301542","https://openalex.org/W4245661807","https://openalex.org/W6645949355","https://openalex.org/W6696752137"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Transistor":[0],"level":[1],"reliability":[2,27,47,69,88,107],"analysis":[3,70,89,121],"has":[4,19],"been":[5,20],"available":[6],"for":[7,30,49,59,68,76],"many":[8],"years.":[9],"However,":[10],"recently":[11],"new":[12,114],"challenges":[13,108],"have":[14],"emerged":[15],"as":[16],"FinFET":[17,41,50],"technology":[18],"adopted":[21],"to":[22,105],"maintain":[23],"process":[24,82],"scaling.":[25],"The":[26],"models":[28,48],"used":[29],"planar":[31],"CMOS":[32],"transistors":[33,51],"no":[34],"longer":[35],"fits":[36],"the":[37],"degradation":[38],"data":[39],"of":[40,119],"transistors.":[42],"New":[43],"and":[44,61,84,97,117,124],"more":[45],"accurate":[46],"are":[52],"needed.":[53],"Also,":[54],"increased":[55],"interest":[56],"in":[57],"design":[58],"automotive":[60],"industrial":[62],"applications":[63],"is":[64,74],"another":[65],"major":[66],"driver":[67],"development.":[71],"Another":[72],"consideration":[73],"accounting":[75],"factors":[77],"that":[78],"accelerate":[79],"device":[80],"aging:":[81],"variation":[83],"Temperature,":[85],"by":[86],"integrating":[87],"with":[90,122],"other":[91,92],"analyses:":[93],"Monte":[94],"Carlo":[95],"(MC)":[96],"self-heating":[98],"effect":[99],"(SHE).":[100],"In":[101],"this":[102],"paper,":[103],"solutions":[104],"various":[106],"will":[109],"be":[110],"explored":[111],"including":[112],"a":[113],"aging":[115,120],"model":[116],"integration":[118],"SHE":[123],"MC":[125],"analyses.":[126]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}