{"id":"https://openalex.org/W2946137148","doi":"https://doi.org/10.1109/irps.2019.8720514","title":"Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology","display_name":"Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946137148","doi":"https://doi.org/10.1109/irps.2019.8720514","mag":"2946137148"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720514","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091527464","display_name":"Lyuan Xu","orcid":"https://orcid.org/0000-0002-9791-0806"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"L. Xu","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047025182","display_name":"Jingchen Cao","orcid":"https://orcid.org/0000-0002-9250-8594"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Cao","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082031833","display_name":"Indranil Chatterjee","orcid":"https://orcid.org/0000-0002-8904-0580"},"institutions":[{"id":"https://openalex.org/I4210136903","display_name":"Airbus (Germany)","ror":"https://ror.org/04a3akw68","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210121748","https://openalex.org/I4210136903"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"I. Chatterjee","raw_affiliation_strings":["Airbus SE, Germany"],"affiliations":[{"raw_affiliation_string":"Airbus SE, Germany","institution_ids":["https://openalex.org/I4210136903"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010035590","display_name":"Shixi Wen","orcid":"https://orcid.org/0000-0002-4285-2506"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. -J. Wen","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, CA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109061221","display_name":"Robert Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Wong","raw_affiliation_strings":["Cisco Systems, Inc., San Jose, CA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems, Inc., San Jose, CA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081834179","display_name":"L. W. Massengill","orcid":"https://orcid.org/0000-0001-8170-6029"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. W. Massengill","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5091527464"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.44138188,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.8504381775856018},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5596418976783752},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5538792610168457},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5472237467765808},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.5268505811691284},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5131829380989075},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4627108573913574},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4311579763889313},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4294789135456085},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.425773561000824},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31474435329437256},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29390162229537964},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2554682493209839},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.20431166887283325},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1725761890411377},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.09286832809448242},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06888121366500854}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.8504381775856018},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5596418976783752},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5538792610168457},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5472237467765808},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.5268505811691284},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5131829380989075},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4627108573913574},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4311579763889313},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4294789135456085},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.425773561000824},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31474435329437256},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29390162229537964},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2554682493209839},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.20431166887283325},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1725761890411377},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.09286832809448242},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06888121366500854},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720514","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1570008958","https://openalex.org/W1965425138","https://openalex.org/W1974338211","https://openalex.org/W2019544124","https://openalex.org/W2037984196","https://openalex.org/W2054131667","https://openalex.org/W2092581164","https://openalex.org/W2128968556","https://openalex.org/W2137273775","https://openalex.org/W2149773199","https://openalex.org/W2162713172","https://openalex.org/W2325092268","https://openalex.org/W2584298940","https://openalex.org/W2766582323","https://openalex.org/W2769849891"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W764628369","https://openalex.org/W2155141467","https://openalex.org/W2990896947","https://openalex.org/W1502430142"],"abstract_inverted_index":{"Triple-well":[0],"designs":[1,27,46,56,65],"provide":[2],"excellent":[3],"noise":[4],"isolation":[5],"in":[6,98,103],"mixed-signal":[7],"circuits.":[8,21],"But":[9],"the":[10,48,90,99],"presence":[11],"of":[12,19,23,40,70,82,92],"deep-n-well":[13,100],"significantly":[14,58],"affects":[15],"Single-Event":[16],"(SE)":[17],"response":[18,39],"these":[20],"Comparison":[22],"dual-well":[24,41,55],"and":[25,42,73],"triple-well":[26,43,64],"for":[28,74,79],"recent":[29],"technologies":[30],"have":[31,57],"shown":[32],"inconsistent":[33],"results.":[34],"This":[35],"paper":[36],"presents":[37],"SE":[38,60,110],"flip-flop":[44],"(FF)":[45],"at":[47],"7-nm":[49],"bulk":[50],"FinFET":[51],"node.":[52],"Results":[53],"show":[54,84],"superior":[59],"performance":[61],"compared":[62],"to":[63,108],"over":[66],"a":[67],"wide":[68],"range":[69],"supply":[71],"voltages":[72],"different":[75,80],"particles.":[76],"TCAD":[77],"simulations":[78],"depths":[81],"p-well":[83,93,97],"that":[85],"collected":[86],"charge":[87,105],"increases":[88],"when":[89],"depth":[91],"decreases.":[94],"The":[95],"shallow":[96],"design":[101],"results":[102],"strong":[104],"confinement":[106],"leading":[107],"increased":[109],"cross":[111],"sections.":[112]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}