{"id":"https://openalex.org/W2944950085","doi":"https://doi.org/10.1109/irps.2019.8720513","title":"SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET","display_name":"SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2944950085","doi":"https://doi.org/10.1109/irps.2019.8720513","mag":"2944950085"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720513","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720513","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102998461","display_name":"Taiki Uemura","orcid":"https://orcid.org/0000-0002-6028-547X"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Taiki Uemura","raw_affiliation_strings":["Technology Quality & Reliability, Samsung Electronics, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Quality & Reliability, Samsung Electronics, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082747615","display_name":"Soon Young Lee","orcid":"https://orcid.org/0000-0002-3160-577X"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soonyoung Lee","raw_affiliation_strings":["Technology Quality & Reliability, Samsung Electronics, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Quality & Reliability, Samsung Electronics, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054282687","display_name":"Dahye Min","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dahye Min","raw_affiliation_strings":["Technology Quality & Reliability, Samsung Electronics, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Quality & Reliability, Samsung Electronics, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007759424","display_name":"Ihlhwa Moon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ihlhwa Moon","raw_affiliation_strings":["Technology Quality & Reliability, Samsung Electronics, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Quality & Reliability, Samsung Electronics, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053980697","display_name":"Seungbae Lee","orcid":"https://orcid.org/0000-0003-3368-2506"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungbae Lee","raw_affiliation_strings":["Technology Quality & Reliability, Samsung Electronics, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Quality & Reliability, Samsung Electronics, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010124316","display_name":"Sangwoo Pae","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangwoo Pae","raw_affiliation_strings":["Technology Quality & Reliability, Samsung Electronics, Korea"],"affiliations":[{"raw_affiliation_string":"Technology Quality & Reliability, Samsung Electronics, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102998461"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.3631,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.60342881,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.8730954527854919},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.861240029335022},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.7749005556106567},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7237438559532166},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6255147457122803},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4944758415222168},{"id":"https://openalex.org/keywords/flip","display_name":"Flip","score":0.4794146716594696},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33917152881622314},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33480244874954224},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.24378129839897156},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.24077755212783813},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20085662603378296},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17758271098136902},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1157623827457428},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.08479815721511841},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.08052846789360046},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.05911853909492493}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.8730954527854919},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.861240029335022},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.7749005556106567},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7237438559532166},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6255147457122803},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4944758415222168},{"id":"https://openalex.org/C2776591724","wikidata":"https://www.wikidata.org/wiki/Q5459651","display_name":"Flip","level":3,"score":0.4794146716594696},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33917152881622314},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33480244874954224},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.24378129839897156},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.24077755212783813},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20085662603378296},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17758271098136902},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1157623827457428},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.08479815721511841},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.08052846789360046},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.05911853909492493},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C190283241","wikidata":"https://www.wikidata.org/wiki/Q14599311","display_name":"Apoptosis","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720513","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720513","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1981279817","https://openalex.org/W1990608831","https://openalex.org/W2011374286","https://openalex.org/W2050431855","https://openalex.org/W2093096313","https://openalex.org/W2106672998","https://openalex.org/W2122995125","https://openalex.org/W2144482650","https://openalex.org/W2154663356","https://openalex.org/W2166448630","https://openalex.org/W2167002145","https://openalex.org/W2559479334","https://openalex.org/W2801372096","https://openalex.org/W2801879797","https://openalex.org/W3089937351"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W1523508240","https://openalex.org/W2622269177","https://openalex.org/W2086616086","https://openalex.org/W2978528242","https://openalex.org/W2165400042","https://openalex.org/W2130033702","https://openalex.org/W2081303028","https://openalex.org/W2160088500","https://openalex.org/W3140581668"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"soft":[3],"error":[4],"immune":[5],"flip-flop":[6],"(SEIFF)":[7],"for":[8],"mitigating":[9],"single":[10,20],"event":[11,21],"upset":[12],"(SEU)":[13],"in":[14,24,39,50],"flip-flops":[15],"(FFs)":[16],"and":[17,33,43],"impact":[18],"of":[19],"transient":[22],"(SET)":[23],"combinational-logic.":[25],"SEIFF":[26,51],"mitigates":[27],"the":[28,47],"SET":[29],"without":[30],"enlarging":[31],"setup-time":[32],"delay;":[34],"there":[35],"is":[36],"no":[37],"overhead":[38],"circuit":[40],"performance.":[41],"Alpha":[42],"proton":[44],"tests":[45],"validate":[46],"mitigation":[48],"efficiency":[49],"manufactured":[52],"on":[53],"10":[54],"nm":[55],"FinFET":[56],"technology.":[57]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-04-15T08:11:43.952461","created_date":"2025-10-10T00:00:00"}