{"id":"https://openalex.org/W2944851804","doi":"https://doi.org/10.1109/irps.2019.8720462","title":"Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors","display_name":"Characterization and Modeling of the Transient Safe Operating Area in LDMOS Transistors","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2944851804","doi":"https://doi.org/10.1109/irps.2019.8720462","mag":"2944851804"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720462","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720462","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100455126","display_name":"Hang Li","orcid":"https://orcid.org/0000-0001-9993-4986"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hang Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078138605","display_name":"Kalpathy B. Sundaram","orcid":"https://orcid.org/0000-0003-0969-7118"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kalpathy B. Sundaram","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Central Florida, Orlando, FL, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103467160","display_name":"Yuanzhong Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuanzhong Zhou","raw_affiliation_strings":["ADI Global Electrostatic Discharge Organization, Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"ADI Global Electrostatic Discharge Organization, Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004199779","display_name":"Javier A. Salcedo","orcid":"https://orcid.org/0000-0001-8999-2998"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Javier A. Salcedo","raw_affiliation_strings":["ADI Global Electrostatic Discharge Organization, Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"ADI Global Electrostatic Discharge Organization, Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110613093","display_name":"Jean-Jacques Hajjar","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jean-Jacques Hajjar","raw_affiliation_strings":["ADI Global Electrostatic Discharge Organization, Analog Devices, Inc., Wilmington, MA, USA"],"affiliations":[{"raw_affiliation_string":"ADI Global Electrostatic Discharge Organization, Analog Devices, Inc., Wilmington, MA, USA","institution_ids":["https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100455126"],"corresponding_institution_ids":["https://openalex.org/I106165777"],"apc_list":null,"apc_paid":null,"fwci":0.363,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.60322548,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"2019","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ldmos","display_name":"LDMOS","score":0.9837052822113037},{"id":"https://openalex.org/keywords/snapback","display_name":"Snapback","score":0.9674400091171265},{"id":"https://openalex.org/keywords/safe-operating-area","display_name":"Safe operating area","score":0.8747396469116211},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.8157632350921631},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.6491491198539734},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4995536804199219},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49436020851135254},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47829824686050415},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.46697282791137695},{"id":"https://openalex.org/keywords/overcurrent","display_name":"Overcurrent","score":0.41373807191848755},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39065268635749817},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3832918405532837},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37131762504577637},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.34355098009109497},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3339892625808716}],"concepts":[{"id":"https://openalex.org/C31672976","wikidata":"https://www.wikidata.org/wiki/Q4042432","display_name":"LDMOS","level":4,"score":0.9837052822113037},{"id":"https://openalex.org/C2779888857","wikidata":"https://www.wikidata.org/wiki/Q18378810","display_name":"Snapback","level":4,"score":0.9674400091171265},{"id":"https://openalex.org/C186339688","wikidata":"https://www.wikidata.org/wiki/Q233523","display_name":"Safe operating area","level":4,"score":0.8747396469116211},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.8157632350921631},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.6491491198539734},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4995536804199219},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49436020851135254},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47829824686050415},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.46697282791137695},{"id":"https://openalex.org/C47949032","wikidata":"https://www.wikidata.org/wiki/Q663542","display_name":"Overcurrent","level":3,"score":0.41373807191848755},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39065268635749817},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3832918405532837},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37131762504577637},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.34355098009109497},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3339892625808716},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps.2019.8720462","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720462","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"mag:3035594354","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=201902232791714552","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1566878101","https://openalex.org/W1594849970","https://openalex.org/W1609294441","https://openalex.org/W1944397681","https://openalex.org/W2031825211","https://openalex.org/W2043652590","https://openalex.org/W2044400375","https://openalex.org/W2061883726","https://openalex.org/W2114989898","https://openalex.org/W2119714772","https://openalex.org/W2134941569","https://openalex.org/W2145172612","https://openalex.org/W2164091802","https://openalex.org/W2537953064","https://openalex.org/W2797881461","https://openalex.org/W2889566212","https://openalex.org/W2901492807","https://openalex.org/W6634084949","https://openalex.org/W6684103279"],"related_works":["https://openalex.org/W3097634049","https://openalex.org/W1996450663","https://openalex.org/W2098972453","https://openalex.org/W2737719579","https://openalex.org/W2137383161","https://openalex.org/W2179658663","https://openalex.org/W1966439054","https://openalex.org/W2114989898","https://openalex.org/W2944851804","https://openalex.org/W2124187017"],"abstract_inverted_index":{"The":[0],"boundaries":[1,57],"that":[2],"determine":[3,54],"the":[4,14,47,56],"LDMOS":[5,35],"transient":[6,21,62],"safe":[7],"operating":[8],"area":[9],"are":[10],"presented.":[11],"It":[12],"includes":[13],"time-independent":[15],"electrical":[16],"SOA":[17,22],"(eSOA)":[18],"and":[19,60],"short-pulse":[20,61],"post":[23],"device":[24],"snapback.":[25],"A":[26],"compact":[27],"modeling":[28],"methodology":[29],"is":[30],"introduced":[31],"for":[32],"high":[33],"voltage":[34],"with":[36],"minimal":[37],"circuit":[38],"simulation":[39],"convergence":[40],"shortcomings.":[41],"By":[42],"adding":[43],"a":[44],"failure":[45],"monitor,":[46],"model":[48],"proposed":[49],"can":[50],"be":[51],"used":[52],"to":[53],"both":[55],"of":[58],"eSOA":[59],"SOA.":[63]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}