{"id":"https://openalex.org/W2946028229","doi":"https://doi.org/10.1109/irps.2019.8720448","title":"Current Crowding Impact on Electromigration in Al Interconnects","display_name":"Current Crowding Impact on Electromigration in Al Interconnects","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946028229","doi":"https://doi.org/10.1109/irps.2019.8720448","mag":"2946028229"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101895184","display_name":"Young-Joon Park","orcid":"https://orcid.org/0000-0003-1137-6225"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Young-Joon Park","raw_affiliation_strings":["Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007138736","display_name":"Jungwoo Joh","orcid":"https://orcid.org/0000-0001-5289-9968"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jungwoo Joh","raw_affiliation_strings":["Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108223081","display_name":"Jayhoon Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jayhoon Chung","raw_affiliation_strings":["Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032818658","display_name":"S. Krishnan","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srikanth Krishnan","raw_affiliation_strings":["Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments, Dallas, TX, U.S.A","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101895184"],"corresponding_institution_ids":["https://openalex.org/I117023288","https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":0.2195,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.42135979,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current-crowding","display_name":"Current crowding","score":0.9730888605117798},{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9542206525802612},{"id":"https://openalex.org/keywords/current-density","display_name":"Current density","score":0.7350703477859497},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6925308704376221},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5191356539726257},{"id":"https://openalex.org/keywords/crowding","display_name":"Crowding","score":0.5166195034980774},{"id":"https://openalex.org/keywords/exponent","display_name":"Exponent","score":0.4540260434150696},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2669128179550171},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2667480707168579},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11268484592437744}],"concepts":[{"id":"https://openalex.org/C115900370","wikidata":"https://www.wikidata.org/wiki/Q5195096","display_name":"Current crowding","level":3,"score":0.9730888605117798},{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9542206525802612},{"id":"https://openalex.org/C207740977","wikidata":"https://www.wikidata.org/wiki/Q234072","display_name":"Current density","level":2,"score":0.7350703477859497},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6925308704376221},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5191356539726257},{"id":"https://openalex.org/C149333683","wikidata":"https://www.wikidata.org/wiki/Q5189188","display_name":"Crowding","level":2,"score":0.5166195034980774},{"id":"https://openalex.org/C2780388253","wikidata":"https://www.wikidata.org/wiki/Q5421508","display_name":"Exponent","level":2,"score":0.4540260434150696},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2669128179550171},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2667480707168579},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11268484592437744},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2007719944","https://openalex.org/W2029040443","https://openalex.org/W2060564243","https://openalex.org/W2073823633","https://openalex.org/W2081786181","https://openalex.org/W2083090974","https://openalex.org/W2129965353","https://openalex.org/W6679262977"],"related_works":["https://openalex.org/W1489748702","https://openalex.org/W2099750509","https://openalex.org/W2079340511","https://openalex.org/W2138918410","https://openalex.org/W2165885117","https://openalex.org/W4247632754","https://openalex.org/W2092886374","https://openalex.org/W4293577206","https://openalex.org/W2144151832","https://openalex.org/W2144890259"],"abstract_inverted_index":{"The":[0,92,131,145],"current":[1,28,41,64,89,109,114,127,186,214],"flow":[2],"through":[3],"interconnects":[4],"can":[5],"be":[6],"locally":[7],"crowded":[8,169,187],"and":[9,30,46,116,151,179,216],"its":[10,32],"impact":[11,33,72,95,174],"on":[12,34,73,120,135],"electromigration":[13],"(EM)":[14],"has":[15],"not":[16,176],"been":[17],"studied":[18],"well.":[19],"We":[20,37],"design":[21],"test":[22,31],"structures":[23],"with":[24,49,141,149],"different":[25],"levels":[26],"of":[27,43,94,99,101,138],"crowding":[29,42,103,128,215],"EM":[35,52,74,80,132,219],"Lifetime.":[36],"also":[38],"simulate":[39],"the":[40,50,67,71,102,107,113,117,136,139,173,180,192,198,201,211,218,224],"each":[44],"case":[45],"correlate":[47],"them":[48],"observed":[51],"lifetimes.":[53],"Even":[54],"if":[55],"there":[56],"is":[57,69,76,96,175,189,195],"localized":[58,177],"hot":[59],"spot":[60],"having":[61],"very":[62,163],"high":[63],"density":[65,90,115],"but":[66],"region":[68],"small,":[70],"lifetime":[75,81,133,182],"small.":[77],"For":[78],"example,":[79],"decreases":[82],"less":[83],"than":[84],"4%":[85],"for":[86,197,207,223],"24%":[87],"local":[88,108,126,213],"increase.":[91],"extent":[93],"a":[97,124,153,204],"function":[98],"length":[100,118],"as":[104,106],"well":[105],"density.":[110],"Including":[111],"both":[112],"effects":[119],"EM,":[121],"we":[122],"propose":[123],"quantifiable":[125],"factor":[129],"(LCCF).":[130],"depends":[134],"power":[137,143,146,193],"LCCF":[140,150,202],"variable":[142],"exponents.":[144],"exponent":[147,194],"increases":[148],"reaches":[152],"maximum":[154],"value":[155],"before":[156],"starting":[157],"to":[158,160,209],"decrease":[159],"zero.":[161,190],"At":[162],"large":[164],"LCCF,":[165],"when":[166],"currents":[167],"are":[168],"over":[170],"long":[171],"length,":[172],"anymore":[178],"additional":[181,185],"reduction":[183],"by":[184],"space":[188],"So":[191],"zero":[196],"case.":[199],"Utilizing":[200],"provides":[203],"practical":[205],"method":[206],"how":[208],"address":[210],"inevitable":[212],"enhance":[217],"check":[220],"accuracy":[221],"especially":[222],"analog":[225],"semiconductor":[226],"circuits.":[227]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}