{"id":"https://openalex.org/W2799698447","doi":"https://doi.org/10.1109/irps.2018.8353693","title":"Single-event effects on optical transceiver","display_name":"Single-event effects on optical transceiver","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2799698447","doi":"https://doi.org/10.1109/irps.2018.8353693","mag":"2799698447"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353693","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069721390","display_name":"K. J. Lezon","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"K. J. Lezon","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025156540","display_name":"Shi-Jie Wen","orcid":"https://orcid.org/0009-0002-7478-2351"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.-J. Wen","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Y.-F. Dan","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y.-F. Dan","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059785478","display_name":"Ricardo Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Wong","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5069721390"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0349005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"P","last_page":"SE.6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.9317779541015625},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6271913051605225},{"id":"https://openalex.org/keywords/optical-communication","display_name":"Optical communication","score":0.47389355301856995},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4647611379623413},{"id":"https://openalex.org/keywords/transfer","display_name":"Transfer (computing)","score":0.4388121962547302},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4271978735923767},{"id":"https://openalex.org/keywords/optical-performance-monitoring","display_name":"Optical performance monitoring","score":0.42495235800743103},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3075040280818939},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22929143905639648},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.16849496960639954},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.13161838054656982},{"id":"https://openalex.org/keywords/wavelength-division-multiplexing","display_name":"Wavelength-division multiplexing","score":0.11565455794334412},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.07197505235671997}],"concepts":[{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.9317779541015625},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6271913051605225},{"id":"https://openalex.org/C129404179","wikidata":"https://www.wikidata.org/wiki/Q1469765","display_name":"Optical communication","level":2,"score":0.47389355301856995},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4647611379623413},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.4388121962547302},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4271978735923767},{"id":"https://openalex.org/C26840048","wikidata":"https://www.wikidata.org/wiki/Q7098880","display_name":"Optical performance monitoring","level":4,"score":0.42495235800743103},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3075040280818939},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22929143905639648},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.16849496960639954},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.13161838054656982},{"id":"https://openalex.org/C160724564","wikidata":"https://www.wikidata.org/wiki/Q1620670","display_name":"Wavelength-division multiplexing","level":3,"score":0.11565455794334412},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.07197505235671997},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353693","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353693","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2129681561","https://openalex.org/W2132962860","https://openalex.org/W2145938977"],"related_works":["https://openalex.org/W1874071567","https://openalex.org/W2914759486","https://openalex.org/W2153110104","https://openalex.org/W2060627912","https://openalex.org/W3048850972","https://openalex.org/W2112924201","https://openalex.org/W4254359841","https://openalex.org/W2478769118","https://openalex.org/W3142785482","https://openalex.org/W1561682674"],"abstract_inverted_index":{"All":[0],"communications":[1],"systems":[2],"use":[3],"optical":[4,29,52],"modules":[5,31],"to":[6],"achieve":[7],"data":[8],"transfer":[9],"speeds":[10],"in":[11,28],"the":[12,23],"10's":[13],"of":[14,25,51],"GBPS":[15],"range.":[16],"With":[17],"increasing":[18],"reliance":[19],"on":[20],"communication":[21],"systems,":[22],"impact":[24],"soft":[26,44],"errors":[27],"transceiver":[30],"has":[32],"become":[33],"a":[34],"primary":[35],"concern":[36],"for":[37],"system":[38],"performance.":[39],"This":[40],"paper":[41],"examines":[42],"neutron-induced":[43],"error":[45],"rates":[46],"and":[47],"associated":[48],"failure":[49],"modes":[50],"transceivers.":[53]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}