{"id":"https://openalex.org/W2801783236","doi":"https://doi.org/10.1109/irps.2018.8353682","title":"Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology","display_name":"Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2801783236","doi":"https://doi.org/10.1109/irps.2018.8353682","mag":"2801783236"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009854833","display_name":"H. Zhang","orcid":"https://orcid.org/0000-0003-3444-1296"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"H. Zhang","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101559611","display_name":"H. Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Jiang","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001937735","display_name":"Madison Eaker","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. R. Eaker","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069721390","display_name":"K. J. Lezon","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. J. Lezon","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075487517","display_name":"Balaji Narasimham","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Narasimham","raw_affiliation_strings":["Broadcom Corporation, Irvine, CA"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, Irvine, CA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051035672","display_name":"N. N. Mahatme","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"N. N. Mahatme","raw_affiliation_strings":["NXP Semiconductors, Austin, TX"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Austin, TX","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081834179","display_name":"L. W. Massengill","orcid":"https://orcid.org/0000-0001-8170-6029"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. W. Massengill","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Vanderbilt University, Nashville, TN"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5009854833"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.05084331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"P","last_page":"PR.1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.7307226061820984},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.6956650018692017},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6006592512130737},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5642811059951782},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5136293768882751},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4440476894378662},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3213478922843933},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.3086257576942444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.266944944858551},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.17363303899765015},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14040422439575195},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1028851568698883},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09346693754196167}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.7307226061820984},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.6956650018692017},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6006592512130737},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5642811059951782},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5136293768882751},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4440476894378662},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3213478922843933},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.3086257576942444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.266944944858551},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.17363303899765015},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14040422439575195},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1028851568698883},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09346693754196167},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W42037993","https://openalex.org/W42545666","https://openalex.org/W1515671919","https://openalex.org/W1534925464","https://openalex.org/W1607844737","https://openalex.org/W1975166224","https://openalex.org/W1995871244","https://openalex.org/W2000171858","https://openalex.org/W2084106057","https://openalex.org/W2130351941","https://openalex.org/W2137273775","https://openalex.org/W2138874069","https://openalex.org/W2151759197","https://openalex.org/W2169212403","https://openalex.org/W2524697621","https://openalex.org/W2525977727","https://openalex.org/W2603856766","https://openalex.org/W2621153661","https://openalex.org/W4285719527","https://openalex.org/W6632090173","https://openalex.org/W6680929498","https://openalex.org/W6684566051"],"related_works":["https://openalex.org/W4386278306","https://openalex.org/W2010558539","https://openalex.org/W2132046218","https://openalex.org/W2783525109","https://openalex.org/W2580259249","https://openalex.org/W4402040071","https://openalex.org/W4230846245","https://openalex.org/W3096667951","https://openalex.org/W4288068867","https://openalex.org/W102880045"],"abstract_inverted_index":{"Physical":[0],"unclonable":[1],"functions":[2],"(PUF)":[3],"have":[4,28,42,59],"been":[5,29,43,60],"used":[6],"to":[7,45],"securely":[8],"authenticate":[9],"devices":[10],"in":[11],"electronic":[12],"systems.":[13],"In":[14],"this":[15],"paper,":[16],"different":[17,48,71],"flip-flop":[18],"(FF)":[19],"designs":[20,50,66],"at":[21],"a":[22],"14/16-nm":[23],"bulk":[24],"FinFET":[25],"technology":[26],"node":[27],"evaluated":[30],"for":[31,51,67],"suitability":[32],"as":[33],"PUF":[34,52,58,68,76],"generator.":[35],"Reliability,":[36],"uniqueness,":[37],"uniformity":[38],"and":[39],"bit-aliasing":[40],"characteristics":[41],"considered":[44],"rank":[46],"order":[47],"FF":[49,65],"applications.":[53],"Aging":[54],"behaviors":[55],"of":[56,64],"FF-based":[57],"investigated.":[61],"Proper":[62],"choice":[63],"applications":[69],"during":[70],"product":[72],"life":[73],"stages":[74],"improves":[75],"performance.":[77]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}