{"id":"https://openalex.org/W2802888400","doi":"https://doi.org/10.1109/irps.2018.8353676","title":"High-temperature and high-field cycling reliability of PZT films embedded within 130 nm CMOS","display_name":"High-temperature and high-field cycling reliability of PZT films embedded within 130 nm CMOS","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2802888400","doi":"https://doi.org/10.1109/irps.2018.8353676","mag":"2802888400"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031139888","display_name":"Glen Walters","orcid":"https://orcid.org/0000-0001-6371-8974"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"G. Walters","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005547873","display_name":"Paul Chojecki","orcid":"https://orcid.org/0000-0001-6023-2055"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Chojecki","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046619537","display_name":"Alexandra Garraud","orcid":"https://orcid.org/0000-0001-9464-1842"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Garraud","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086844810","display_name":"Toshikazu Nishida","orcid":"https://orcid.org/0000-0002-7148-2102"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Nishida","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida Gainesville, Florida, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083159302","display_name":"Scott R. Summerfelt","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Summerfelt","raw_affiliation_strings":["Analog Technology Development, Texas Instruments Dallas, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments Dallas, Texas, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067369502","display_name":"J. Antonio Travieso-Rodr\u00edguez","orcid":"https://orcid.org/0000-0002-9273-5762"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. A. Rodriguez","raw_affiliation_strings":["Analog Technology Development, Texas Instruments Dallas, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments Dallas, Texas, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023520412","display_name":"Antonio G. Acosta","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. G. Acosta","raw_affiliation_strings":["Analog Technology Development, Texas Instruments Dallas, Texas, USA"],"affiliations":[{"raw_affiliation_string":"Analog Technology Development, Texas Instruments Dallas, Texas, USA","institution_ids":["https://openalex.org/I74760111","https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5031139888"],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":0.0971,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.37237708,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"90","issue":null,"first_page":"P","last_page":"MY.3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coercivity","display_name":"Coercivity","score":0.6757758855819702},{"id":"https://openalex.org/keywords/temperature-cycling","display_name":"Temperature cycling","score":0.5868058800697327},{"id":"https://openalex.org/keywords/polarization","display_name":"Polarization (electrochemistry)","score":0.5405084490776062},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.4900180399417877},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4808995723724365},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.46113550662994385},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39693307876586914},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3964724838733673},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.2661428451538086},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.24318087100982666},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2077697515487671},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.11917188763618469},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1114586591720581},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.10400703549385071},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.10164821147918701},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.09758004546165466}],"concepts":[{"id":"https://openalex.org/C126530901","wikidata":"https://www.wikidata.org/wiki/Q432635","display_name":"Coercivity","level":2,"score":0.6757758855819702},{"id":"https://openalex.org/C177564732","wikidata":"https://www.wikidata.org/wiki/Q7698333","display_name":"Temperature cycling","level":3,"score":0.5868058800697327},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.5405084490776062},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.4900180399417877},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4808995723724365},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.46113550662994385},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39693307876586914},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3964724838733673},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.2661428451538086},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.24318087100982666},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2077697515487671},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.11917188763618469},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1114586591720581},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.10400703549385071},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.10164821147918701},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.09758004546165466}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.47999998927116394,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1529696635","https://openalex.org/W1989733783","https://openalex.org/W1990753061","https://openalex.org/W1998861002","https://openalex.org/W2025905384","https://openalex.org/W2065473156","https://openalex.org/W2081451611","https://openalex.org/W2092639597","https://openalex.org/W2095825059","https://openalex.org/W2254450385","https://openalex.org/W2441252030","https://openalex.org/W2542222318","https://openalex.org/W2769144886"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2044642251","https://openalex.org/W1979864087","https://openalex.org/W3093027776","https://openalex.org/W1986796332","https://openalex.org/W4283367861","https://openalex.org/W2909854803","https://openalex.org/W850259343","https://openalex.org/W2609179044","https://openalex.org/W2022128204"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,19,27,39,117],"systematic":[3],"reliability":[4],"study":[5],"of":[6,30,42,46],"PZT":[7],"polarization":[8,113],"retention":[9],"after":[10,50,109],"exposure":[11],"to":[12],"high":[13,80],"temperatures":[14],"and":[15,53,111],"high-field":[16],"cycling.":[17],"After":[18,115],"260":[20],"\u00b0C":[21],"Pb-free":[22],"solder":[23],"assembly":[24],"reflow-like":[25],"exposure,":[26],"signal":[28,118],"margin":[29,119],">10":[31,96,120],"\u03bcC/cm":[32,121],"<sup":[33,89,97,122],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[34,90,98,123],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[35,124],"is":[36,101,107,125],"achieved":[37],"at":[38,87],"read":[40,128],"voltage":[41,62,70,106],"1":[43],"V.":[44,131],"Extraction":[45],"the":[47,59,67],"Preisach":[48],"distribution":[49],"thermal":[51],"depolarization":[52],"restore":[54],"exhibits":[55],"an":[56],"increase":[57],"in":[58,104],"positive":[60],"coercive":[61,69,105],"by":[63,94],"45":[64],"%":[65],"while":[66],"negative":[68],"shows":[71],"minimal":[72],"deviation":[73],"(<;7":[74],"%).":[75],"Under":[76],"accelerated":[77],"aging":[78],"via":[79],"electric":[81],"fields":[82],"(2.4":[83],"V),":[84],"maximum":[85],"wake-up":[86],"10":[88],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">6</sup>":[91],"cycles":[92,100],"followed":[93],"fatigue":[95],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">8</sup>":[99],"observed.":[102],"Asymmetry":[103],"minimized":[108],"wakeup":[110],"remanent":[112],"maximized.":[114],"fatigue,":[116],"maintained":[126],"for":[127],"voltages":[129],">0.8":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}