{"id":"https://openalex.org/W2800040690","doi":"https://doi.org/10.1109/irps.2018.8353668","title":"Oxide breakdown path for optical sensing at the nanoscale level","display_name":"Oxide breakdown path for optical sensing at the nanoscale level","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2800040690","doi":"https://doi.org/10.1109/irps.2018.8353668","mag":"2800040690"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081644254","display_name":"Yu Zhou","orcid":"https://orcid.org/0000-0002-9810-5307"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Y. Zhou","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003039060","display_name":"D. S. Ang","orcid":"https://orcid.org/0000-0002-8139-1984"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"D. S. Ang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024325621","display_name":"Pranav Sairam Kalaga","orcid":"https://orcid.org/0000-0003-4188-970X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"P. S. Kalaga","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043333219","display_name":"Sankara Rao Gollu","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"S. R. Gollu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":0.1589,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52037884,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanoscopic-scale","display_name":"Nanoscopic scale","score":0.7880055904388428},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.7005631923675537},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.675318717956543},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6652659177780151},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5502901673316956},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.3397161662578583}],"concepts":[{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.7880055904388428},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.7005631923675537},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.675318717956543},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6652659177780151},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5502901673316956},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3397161662578583},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353668","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353668","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1500529059","https://openalex.org/W1578191429","https://openalex.org/W1633815251","https://openalex.org/W1964092902","https://openalex.org/W1966781362","https://openalex.org/W1968619653","https://openalex.org/W1990446506","https://openalex.org/W2020647206","https://openalex.org/W2047108596","https://openalex.org/W2091824526","https://openalex.org/W2093192991","https://openalex.org/W2153296269","https://openalex.org/W2169406675","https://openalex.org/W2605219475","https://openalex.org/W2609541708","https://openalex.org/W2755708766","https://openalex.org/W2782305374","https://openalex.org/W6747410796"],"related_works":["https://openalex.org/W2118201341","https://openalex.org/W2598170996","https://openalex.org/W2069100991","https://openalex.org/W137855995","https://openalex.org/W4293456647","https://openalex.org/W2054303101","https://openalex.org/W3131347541","https://openalex.org/W3133399150","https://openalex.org/W2014700862","https://openalex.org/W2109976211"],"abstract_inverted_index":{"Visible-light-controlled":[0],"resistance":[1],"switching":[2,14],"of":[3],"the":[4,18,27,33,39,48,56,62,71,80],"nanoscale":[5,87],"oxide":[6,22],"breakdown":[7,23,81],"path":[8,82],"is":[9,36,41,45,50,59,64,68,73],"demonstrated.":[10],"Two":[11],"distinct":[12],"digital":[13],"behaviors":[15],"pertaining":[16],"to":[17],"soft":[19,31],"and":[20,44,67],"hard":[21,54],"are":[24],"revealed":[25],"for":[26],"first":[28],"time.":[29],"For":[30,53],"breakdown,":[32,55],"leakage":[34,57],"current":[35,58],"decreased":[37,69],"when":[38,47,61,70],"light":[40,49,63,72],"turned":[42,51,65,74],"on,":[43],"increased":[46,60],"off.":[52,75],"on":[66],"The":[76],"results":[77],"suggest":[78],"that":[79],"may":[83],"function":[84],"as":[85],"a":[86],"optical":[88],"sensor.":[89]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}