{"id":"https://openalex.org/W2802874414","doi":"https://doi.org/10.1109/irps.2018.8353605","title":"Reliability of next-generation field-effect transistors with transition metal dichalcogenides","display_name":"Reliability of next-generation field-effect transistors with transition metal dichalcogenides","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2802874414","doi":"https://doi.org/10.1109/irps.2018.8353605","mag":"2802874414"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353605","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353605","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003579890","display_name":"Yu. Yu. Illarionov","orcid":"https://orcid.org/0000-0003-4323-1389"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]},{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["AT","RU"],"is_corresponding":true,"raw_author_name":"Yu. Yu. Illarionov","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Austria","Ioffe Physical-Technical Institute, Russia"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Ioffe Physical-Technical Institute, Russia","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022640203","display_name":"Aday J. Molina\u2010Mendoza","orcid":"https://orcid.org/0000-0001-6830-4092"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"A.J. Molina-Mendoza","raw_affiliation_strings":["Institute for Photonics, TU Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Photonics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077464890","display_name":"Michael Waltl","orcid":"https://orcid.org/0000-0001-6042-759X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Waltl","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047987940","display_name":"Theresia Knobloch","orcid":"https://orcid.org/0000-0001-5156-9510"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"T. Knobloch","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009096098","display_name":"Marco M. Furchi","orcid":"https://orcid.org/0000-0002-0502-7662"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M.M. Furchi","raw_affiliation_strings":["Institute for Photonics, TU Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Photonics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012113227","display_name":"Thomas Mueller","orcid":"https://orcid.org/0000-0003-1343-5719"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"T. Mueller","raw_affiliation_strings":["Institute for Photonics, TU Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Photonics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"T. Grasser","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5003579890"],"corresponding_institution_ids":["https://openalex.org/I145847075","https://openalex.org/I95568926"],"apc_list":null,"apc_paid":null,"fwci":0.2912,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.49421149,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"5A.5","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12046","display_name":"MXene and MAX Phase Materials","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4434199035167694},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3690130412578583},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3613731265068054},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.338290810585022},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3270062208175659},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21390894055366516},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.15743455290794373},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11789524555206299}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4434199035167694},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3690130412578583},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3613731265068054},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.338290810585022},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3270062208175659},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21390894055366516},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.15743455290794373},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11789524555206299},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353605","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353605","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321181","display_name":"Austrian Science Fund","ror":"https://ror.org/013tf3c58"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1849445681","https://openalex.org/W1983299673","https://openalex.org/W1999356668","https://openalex.org/W2011189565","https://openalex.org/W2019638401","https://openalex.org/W2022832723","https://openalex.org/W2026386847","https://openalex.org/W2035615910","https://openalex.org/W2037429351","https://openalex.org/W2048682471","https://openalex.org/W2058122340","https://openalex.org/W2079689884","https://openalex.org/W2096421416","https://openalex.org/W2114859176","https://openalex.org/W2147873145","https://openalex.org/W2160741827","https://openalex.org/W2163081550","https://openalex.org/W2294362686","https://openalex.org/W2318692914","https://openalex.org/W2328412715","https://openalex.org/W2465510599","https://openalex.org/W2505736583","https://openalex.org/W2524462216","https://openalex.org/W2528558896","https://openalex.org/W2615204552","https://openalex.org/W2617425872","https://openalex.org/W2621126165","https://openalex.org/W2735803388","https://openalex.org/W2765336661","https://openalex.org/W3101558650"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"We":[0],"perform":[1],"a":[2,69],"detailed":[3],"reliability":[4,138],"study":[5,131],"of":[6,43,52,71,83,106,123,139],"MoS":[7],"<sub":[8,13,18,23,33,112],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[9,14,19,24,34,113],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[10,15,20,25,35,114],",":[11,16],"MoSe":[12],"MoTe":[17],"and":[21,55,86,119,143],"WS":[22],"field-effect":[26],"transistors":[27],"fabricated":[28],"on":[29,50,147],"the":[30,41,53,80,84,96,104,117,124,137],"same":[31],"SiO":[32,111],"/Si":[36],"substrate.":[37],"First":[38],"we":[39,78],"analyze":[40],"sensitivity":[42],"these":[44,140],"devices":[45],"to":[46,68,116,149],"adsorbate-type":[47],"trapping":[48,73],"sites":[49],"top":[51],"channel":[54,126],"show":[56,94],"that":[57,95],"their":[58],"contribution":[59],"can":[60,99],"be":[61,100],"minimized":[62],"at":[63],"high":[64],"temperatures,":[65],"which":[66],"leads":[67],"domination":[70],"charge":[72],"by":[74,103],"oxide":[75],"traps.":[76],"Then":[77],"compare":[79],"high-temperature":[81],"dynamics":[82],"hysteresis":[85],"bias-temperature":[87],"instabilities":[88],"for":[89],"different":[90],"devices.":[91],"Our":[92],"results":[93],"observed":[97],"differences":[98],"partially":[101],"explained":[102],"alignment":[105],"known":[107],"defect":[108],"bands":[109],"in":[110],"relative":[115],"conduction":[118],"valence":[120],"band":[121],"edges":[122],"two-dimensional":[125],"materials.":[127],"As":[128],"such,":[129],"our":[130],"provides":[132],"strong":[133],"fundamental":[134],"insights":[135],"into":[136],"new":[141],"technologies":[142],"opens":[144],"further":[145],"perspectives":[146],"how":[148],"reach":[150],"commercial":[151],"quality":[152],"standards.":[153]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}