{"id":"https://openalex.org/W2799807780","doi":"https://doi.org/10.1109/irps.2018.8353603","title":"Impact of slow and fast oxide traps on In<inf>0.53</inf>Ga<inf>0.47</inf>As device operation studied using CET maps","display_name":"Impact of slow and fast oxide traps on In<inf>0.53</inf>Ga<inf>0.47</inf>As device operation studied using CET maps","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2799807780","doi":"https://doi.org/10.1109/irps.2018.8353603","mag":"2799807780"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353603","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353603","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040851808","display_name":"V. Putcha","orcid":"https://orcid.org/0000-0003-1907-5486"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"V. Putcha","raw_affiliation_strings":["ESAT department KU Leuven, Leuven, Belgium","IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT department KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068577719","display_name":"J. Franco","orcid":"https://orcid.org/0000-0002-7382-8605"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. Franco","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009024621","display_name":"Abhitosh Vais","orcid":"https://orcid.org/0000-0002-0317-7720"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. Vais","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058263075","display_name":"B. Kaczer","orcid":"https://orcid.org/0000-0002-1484-4007"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Kaczer","raw_affiliation_strings":["Interuniversitair Micro-Elektronica Centrum, Leuven, Vlaams-Brabant, BE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Interuniversitair Micro-Elektronica Centrum, Leuven, Vlaams-Brabant, BE","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035985445","display_name":"Sonja Sioncke","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Sioncke","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108124737","display_name":"D. Linten","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"D. Linten","raw_affiliation_strings":["IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020367935","display_name":"G. Groeseneken","orcid":"https://orcid.org/0000-0003-3763-2098"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Groeseneken","raw_affiliation_strings":["ESAT department KU Leuven, Leuven, Belgium","IMEC, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT department KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"IMEC, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3896,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4476604,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"5A.3","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.6852346658706665},{"id":"https://openalex.org/keywords/conduction-band","display_name":"Conduction band","score":0.6590518951416016},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.5977108478546143},{"id":"https://openalex.org/keywords/charge","display_name":"Charge (physics)","score":0.5865212082862854},{"id":"https://openalex.org/keywords/population","display_name":"Population","score":0.5646728873252869},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.5390152335166931},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.5314218997955322},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.47615882754325867},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46514832973480225},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34595152735710144},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3350856304168701},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27040010690689087},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15665912628173828},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.10877984762191772},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09609949588775635},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.07294610142707825},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.0706629753112793}],"concepts":[{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.6852346658706665},{"id":"https://openalex.org/C27067764","wikidata":"https://www.wikidata.org/wiki/Q528769","display_name":"Conduction band","level":3,"score":0.6590518951416016},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5977108478546143},{"id":"https://openalex.org/C188082385","wikidata":"https://www.wikidata.org/wiki/Q73792","display_name":"Charge (physics)","level":2,"score":0.5865212082862854},{"id":"https://openalex.org/C2908647359","wikidata":"https://www.wikidata.org/wiki/Q2625603","display_name":"Population","level":2,"score":0.5646728873252869},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.5390152335166931},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.5314218997955322},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47615882754325867},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46514832973480225},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34595152735710144},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3350856304168701},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27040010690689087},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15665912628173828},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.10877984762191772},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09609949588775635},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07294610142707825},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0706629753112793},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C99454951","wikidata":"https://www.wikidata.org/wiki/Q932068","display_name":"Environmental health","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353603","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353603","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1650491801","https://openalex.org/W1705599414","https://openalex.org/W1965579609","https://openalex.org/W1984408284","https://openalex.org/W1997197098","https://openalex.org/W2015324217","https://openalex.org/W2040887205","https://openalex.org/W2088389106","https://openalex.org/W2110256278","https://openalex.org/W2113631194","https://openalex.org/W2122520074","https://openalex.org/W2144788598","https://openalex.org/W2147381694","https://openalex.org/W2527118775","https://openalex.org/W2527597599","https://openalex.org/W2547320402","https://openalex.org/W2620968081","https://openalex.org/W2884978068"],"related_works":["https://openalex.org/W2007742350","https://openalex.org/W2380576232","https://openalex.org/W2937054111","https://openalex.org/W2066223521","https://openalex.org/W1993368695","https://openalex.org/W2245347530","https://openalex.org/W2011451034","https://openalex.org/W2116618780","https://openalex.org/W2045200579","https://openalex.org/W2562199502"],"abstract_inverted_index":{"Charge":[0],"trapping":[1,24,56,101],"in":[2,25,102,142],"the":[3,11,15,20,26,46,91,96,99,109,121],"gate-oxide":[4],"can":[5],"cause":[6],"significant":[7],"degradation":[8],"and":[9,30,44,59,83,116,137],"reduce":[10],"operating":[12,151],"lifetime":[13,148],"of":[14,22,37,49,70,95],"device.":[16],"Here,":[17],"we":[18],"study":[19,138],"kinetics":[21],"charge":[23,55,100],"InGaAs/Al2O3/HfO2gate-stack":[27],"using":[28],"Capture":[29],"Emission":[31],"Time":[32],"(CET)":[33],"maps.":[34],"The":[35,75],"existence":[36],"two":[38,67],"oxide":[39,61],"defect":[40,71,77,104,140],"bands,":[41],"respectively":[42],"above":[43],"below":[45],"conduction":[47],"band":[48],"InGaAs,":[50],"is":[51,87,106,133],"implied":[52],"by":[53],"sensing":[54],"at":[57],"positive":[58],"negative":[60],"electric":[62],"fields.":[63],"Within":[64],"each":[65],"band,":[66],"distinct":[68],"populations":[69,141],"states":[72,105],"are":[73],"observed.":[74],"first":[76],"population":[78,111],"with":[79,112],"relatively":[80,113],"higher":[81],"capture":[82,115],"emission":[84,117],"energy":[85,118],"barriers":[86,119],"found":[88],"to":[89,135,144],"affect":[90],"long":[92],"term":[93],"reliability":[94],"device":[97,122,147],"since":[98],"these":[103],"slow,":[107],"while":[108],"second":[110],"smaller":[114],"affects":[120],"stability":[123],"particularly":[124],"under":[125,149],"high":[126],"frequency":[127],"operation.":[128],"We":[129],"argue":[130],"that":[131],"it":[132],"essential":[134],"characterize":[136],"both":[139],"order":[143],"accurately":[145],"estimate":[146],"different":[150],"applications.":[152]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}