{"id":"https://openalex.org/W2800592733","doi":"https://doi.org/10.1109/irps.2018.8353574","title":"Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics","display_name":"Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2800592733","doi":"https://doi.org/10.1109/irps.2018.8353574","mag":"2800592733"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353574","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353574","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030074312","display_name":"Alok Ranjan","orcid":"https://orcid.org/0000-0003-4592-1674"},"institutions":[{"id":"https://openalex.org/I4210123095","display_name":"Institute of Materials Research and Engineering","ror":"https://ror.org/02sepg748","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210123095","https://openalex.org/I91275662"]},{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"A. Ranjan","raw_affiliation_strings":["Engineering Product Development, Singapore University of Technology and Design, Singapore","Institute of Materials Research and Engineering, Singapore"],"affiliations":[{"raw_affiliation_string":"Engineering Product Development, Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]},{"raw_affiliation_string":"Institute of Materials Research and Engineering, Singapore","institution_ids":["https://openalex.org/I4210123095"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064500828","display_name":"Nagarajan Raghavan","orcid":"https://orcid.org/0000-0001-6735-3108"},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"N. Raghavan","raw_affiliation_strings":["Engineering Product Development, Singapore University of Technology and Design, Singapore"],"affiliations":[{"raw_affiliation_string":"Engineering Product Development, Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033345953","display_name":"S. J. O\u2019Shea","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123095","display_name":"Institute of Materials Research and Engineering","ror":"https://ror.org/02sepg748","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210123095","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"S.J. O'Shea","raw_affiliation_strings":["Institute of Materials Research and Engineering, Singapore"],"affiliations":[{"raw_affiliation_string":"Institute of Materials Research and Engineering, Singapore","institution_ids":["https://openalex.org/I4210123095"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069746992","display_name":"Sen Mei","orcid":"https://orcid.org/0000-0001-8363-2684"},"institutions":[{"id":"https://openalex.org/I4210123095","display_name":"Institute of Materials Research and Engineering","ror":"https://ror.org/02sepg748","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210123095","https://openalex.org/I91275662"]},{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"S. Mei","raw_affiliation_strings":["Engineering Product Development, Singapore University of Technology and Design, Singapore","Institute of Materials Research and Engineering, Singapore"],"affiliations":[{"raw_affiliation_string":"Engineering Product Development, Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]},{"raw_affiliation_string":"Institute of Materials Research and Engineering, Singapore","institution_ids":["https://openalex.org/I4210123095"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025103901","display_name":"Michel Bosman","orcid":"https://orcid.org/0000-0002-8717-7655"},"institutions":[{"id":"https://openalex.org/I4210123095","display_name":"Institute of Materials Research and Engineering","ror":"https://ror.org/02sepg748","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210123095","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"M. Bosman","raw_affiliation_strings":["Institute of Materials Research and Engineering, Singapore"],"affiliations":[{"raw_affiliation_string":"Institute of Materials Research and Engineering, Singapore","institution_ids":["https://openalex.org/I4210123095"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007031788","display_name":"K. Shubhakar","orcid":null},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"K. Shubhakar","raw_affiliation_strings":["Engineering Product Development, Singapore University of Technology and Design, Singapore"],"affiliations":[{"raw_affiliation_string":"Engineering Product Development, Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034793030","display_name":"K. L. Pey","orcid":"https://orcid.org/0000-0002-0066-091X"},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"K.L. Pey","raw_affiliation_strings":["Engineering Product Development, Singapore University of Technology and Design, Singapore"],"affiliations":[{"raw_affiliation_string":"Engineering Product Development, Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5030074312"],"corresponding_institution_ids":["https://openalex.org/I152815399","https://openalex.org/I4210123095"],"apc_list":null,"apc_paid":null,"fwci":0.89,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.70525848,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"4A.1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10083","display_name":"Graphene research and applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10478","display_name":"Diamond and Carbon-based Materials Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7955591678619385},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.6343672275543213},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6075760722160339},{"id":"https://openalex.org/keywords/dielectric-strength","display_name":"Dielectric strength","score":0.587527871131897},{"id":"https://openalex.org/keywords/electrical-breakdown","display_name":"Electrical breakdown","score":0.585771918296814},{"id":"https://openalex.org/keywords/percolation","display_name":"Percolation (cognitive psychology)","score":0.5803518295288086},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4552716910839081},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.4314078092575073},{"id":"https://openalex.org/keywords/nanoscopic-scale","display_name":"Nanoscopic scale","score":0.42967498302459717},{"id":"https://openalex.org/keywords/percolation-theory","display_name":"Percolation theory","score":0.42621874809265137},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.37777087092399597},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2733161449432373},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2705344557762146},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.26907065510749817},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11792948842048645},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.11381888389587402},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.08906647562980652}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7955591678619385},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.6343672275543213},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6075760722160339},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.587527871131897},{"id":"https://openalex.org/C191695590","wikidata":"https://www.wikidata.org/wiki/Q422584","display_name":"Electrical breakdown","level":3,"score":0.585771918296814},{"id":"https://openalex.org/C2780457167","wikidata":"https://www.wikidata.org/wiki/Q17156484","display_name":"Percolation (cognitive psychology)","level":2,"score":0.5803518295288086},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4552716910839081},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4314078092575073},{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.42967498302459717},{"id":"https://openalex.org/C11557063","wikidata":"https://www.wikidata.org/wiki/Q900918","display_name":"Percolation theory","level":3,"score":0.42621874809265137},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.37777087092399597},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2733161449432373},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2705344557762146},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26907065510749817},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11792948842048645},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11381888389587402},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.08906647562980652},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353574","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353574","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Clean water and sanitation","id":"https://metadata.un.org/sdg/6","score":0.44999998807907104}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324110","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1981053966","https://openalex.org/W1999594918","https://openalex.org/W2018765018","https://openalex.org/W2019185749","https://openalex.org/W2056608437","https://openalex.org/W2058122340","https://openalex.org/W2060178666","https://openalex.org/W2074526102","https://openalex.org/W2090325277","https://openalex.org/W2099997268","https://openalex.org/W2119610788","https://openalex.org/W2129515233","https://openalex.org/W2132515584","https://openalex.org/W2142840270","https://openalex.org/W2164022823","https://openalex.org/W2167431156","https://openalex.org/W2173739621","https://openalex.org/W2222252800","https://openalex.org/W2396227687","https://openalex.org/W2470170989","https://openalex.org/W2612287343","https://openalex.org/W2766475452","https://openalex.org/W2773423577","https://openalex.org/W2794891467","https://openalex.org/W2963597307","https://openalex.org/W3102620251","https://openalex.org/W3104929553","https://openalex.org/W4211172053"],"related_works":["https://openalex.org/W45257362","https://openalex.org/W3042760486","https://openalex.org/W2023077343","https://openalex.org/W2074855102","https://openalex.org/W2170329557","https://openalex.org/W2031110665","https://openalex.org/W2516603690","https://openalex.org/W4205984336","https://openalex.org/W2154011597","https://openalex.org/W2111211921"],"abstract_inverted_index":{"In":[0],"this":[1],"study,":[2],"we":[3],"investigate":[4],"the":[5,56,81,103,106,114,123,140],"physical":[6],"mechanism":[7],"of":[8,34,66,71,85,105],"soft":[9,43,90],"and":[10,69],"hard":[11,57],"dielectric":[12],"breakdown":[13,44,58,91,115,141],"using":[14],"conductive":[15],"atomic":[16],"force":[17],"microscope":[18],"(CAFM)":[19],"as":[20],"a":[21,72,111],"nanoscale":[22],"spectroscopy":[23],"tool":[24],"on":[25,39],"blanket":[26],"hexagonal":[27],"boron":[28],"nitride":[29],"(h-BN)":[30],"films":[31],"with":[32,80],"thickness":[33,124],"~":[35],"4":[36],"nm":[37],"grown":[38],"Cu":[40,82],"substrate.":[41,83],"The":[42,129],"regime":[45,59],"involves":[46,64],"vacancies/defects":[47],"(boron":[48],"and/or":[49],"nitrogen)":[50],"rich":[51],"percolation":[52,107],"path":[53],"formation":[54,62,70],"while":[55],"shows":[60],"nano-pore":[61],"that":[63,118],"removal":[65],"h-BN":[67,127],"layers":[68],"metallic":[73],"contact":[74],"due":[75,93],"to":[76,94,134,138],"CAFM":[77],"tip":[78],"adhesion":[79],"Reduction":[84],"Weibull":[86],"slope":[87],"for":[88],"successive":[89],"events":[92],"multiple":[95],"ramp":[96],"voltage":[97,116,142],"tests":[98],"at":[99],"each":[100],"location":[101],"confirms":[102],"validity":[104],"model.":[108],"We":[109],"observe":[110],"concavity":[112],"in":[113,126],"distribution":[117],"can":[119],"be":[120,135],"explained":[121],"by":[122],"variations":[125],"layers.":[128],"clustering":[130],"model":[131],"is":[132],"shown":[133],"good":[136],"candidate":[137],"describe":[139],"distributions.":[143]},"counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}