{"id":"https://openalex.org/W2800745467","doi":"https://doi.org/10.1109/irps.2018.8353565","title":"Machine-learned assessment and prediction of robust solid state storage system reliability physics","display_name":"Machine-learned assessment and prediction of robust solid state storage system reliability physics","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2800745467","doi":"https://doi.org/10.1109/irps.2018.8353565","mag":"2800745467"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353565","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353565","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040319143","display_name":"Jay Sarkar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121352","display_name":"Western Digital (United States)","ror":"https://ror.org/02hqwnx33","country_code":"US","type":"company","lineage":["https://openalex.org/I4210121352"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jay Sarkar","raw_affiliation_strings":["Western Digital Corporation, San Jose, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Western Digital Corporation, San Jose, California, U.S.A","institution_ids":["https://openalex.org/I4210121352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112506286","display_name":"Cory Peterson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121352","display_name":"Western Digital (United States)","ror":"https://ror.org/02hqwnx33","country_code":"US","type":"company","lineage":["https://openalex.org/I4210121352"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cory Peterson","raw_affiliation_strings":["Western Digital Corporation, San Jose, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Western Digital Corporation, San Jose, California, U.S.A","institution_ids":["https://openalex.org/I4210121352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060386030","display_name":"Amir Sanayei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210121352","display_name":"Western Digital (United States)","ror":"https://ror.org/02hqwnx33","country_code":"US","type":"company","lineage":["https://openalex.org/I4210121352"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amir Sanayei","raw_affiliation_strings":["Western Digital Corporation, San Jose, California, U.S.A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Western Digital Corporation, San Jose, California, U.S.A","institution_ids":["https://openalex.org/I4210121352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210121352"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"3C.6","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.968500018119812,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8089830279350281},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7146220207214355},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6822947263717651},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.629179835319519},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5450549125671387},{"id":"https://openalex.org/keywords/computer-data-storage","display_name":"Computer data storage","score":0.4363332986831665},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.24885639548301697},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17939114570617676},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1055382788181305}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8089830279350281},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7146220207214355},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6822947263717651},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.629179835319519},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5450549125671387},{"id":"https://openalex.org/C194739806","wikidata":"https://www.wikidata.org/wiki/Q66221","display_name":"Computer data storage","level":2,"score":0.4363332986831665},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.24885639548301697},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17939114570617676},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1055382788181305},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353565","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353565","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.6600000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1546597234","https://openalex.org/W2171496030","https://openalex.org/W2409810657","https://openalex.org/W2487770199","https://openalex.org/W2597917365","https://openalex.org/W2740379362","https://openalex.org/W2745319966","https://openalex.org/W2911964244","https://openalex.org/W2962844766","https://openalex.org/W3145506661","https://openalex.org/W4244921287"],"related_works":["https://openalex.org/W1986055163","https://openalex.org/W2052067344","https://openalex.org/W986025416","https://openalex.org/W2049400789","https://openalex.org/W1526507090","https://openalex.org/W2071169149","https://openalex.org/W2363985479","https://openalex.org/W1994597659","https://openalex.org/W336926246","https://openalex.org/W2131993247"],"abstract_inverted_index":{"Reliability":[0],"physics":[1],"of":[2,7,47,93,115,119],"the":[3,45,60,90],"complex":[4],"memory":[5,35,55],"sub-system":[6],"modern,":[8],"robust":[9],"solid":[10],"state":[11],"storage":[12,121],"devices":[13,95],"(SSDs)":[14],"under":[15,58],"throughput":[16,106],"acceleration":[17],"stress":[18,107],"is":[19],"analyzed":[20],"leveraging":[21],"Machine":[22,65],"Learning":[23,66],"-":[24],"towards":[25,99],"understanding":[26],"their":[27],"inherently":[28],"designed":[29,49],"fault-tolerance":[30],"schemes":[31,51],"that":[32],"mitigate":[33],"expected":[34],"degradation":[36,56],"mechanisms":[37,57],"through":[38],"reliable":[39,74],"life":[40],"as":[41],"a":[42,80],"system.":[43],"With":[44],"strength":[46],"multiple":[48,54],"error-management":[50],"effectively":[52],"countering":[53],"stress,":[59],"developed":[61],"empirical":[62],"data":[63],"based":[64],"framework":[67],"allows":[68],"inferential":[69],"and":[70,82,117],"predictive":[71],"assessments":[72,88],"on":[73,89,109,113],"SSD":[75],"design":[76,110],"at":[77],"system-level":[78,91],"in":[79],"quantitative":[81,87],"pro-active":[83],"manner.":[84],"Such":[85],"Machine-Learned":[86],"health":[92],"individual":[94,116],"can":[96],"be":[97],"utilized":[98],"managing":[100],"qualification":[101],"reliability":[102,114],"assessments,":[103],"assessing":[104],"dynamic":[105],"impact":[108],"and/or":[111],"decision-making":[112],"populations":[118],"solid-state":[120],"systems.":[122]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}