{"id":"https://openalex.org/W2801490433","doi":"https://doi.org/10.1109/irps.2018.8353553","title":"Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications","display_name":"Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2801490433","doi":"https://doi.org/10.1109/irps.2018.8353553","mag":"2801490433"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2018.8353553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012609593","display_name":"Ernest Y. Wu","orcid":"https://orcid.org/0000-0003-4979-1029"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210134083","display_name":"Essex Westford School District","ror":"https://ror.org/03ze2q110","country_code":"US","type":"education","lineage":["https://openalex.org/I4210134083"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ernest Y. Wu","raw_affiliation_strings":["Essex Junction, VT, USA","IBM Research Div"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Essex Junction, VT, USA","institution_ids":["https://openalex.org/I4210134083"]},{"raw_affiliation_string":"IBM Research Div","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018134764","display_name":"Andrew Kim","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andrew Kim","raw_affiliation_strings":["Hopewell Junction, NY, USA","IBM Systems Div"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hopewell Junction, NY, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Systems Div","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101406297","display_name":"Baozhen Li","orcid":"https://orcid.org/0000-0002-9563-9821"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210134083","display_name":"Essex Westford School District","ror":"https://ror.org/03ze2q110","country_code":"US","type":"education","lineage":["https://openalex.org/I4210134083"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Baozhen Li","raw_affiliation_strings":["Essex Junction, VT, USA","IBM Research Div"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Essex Junction, VT, USA","institution_ids":["https://openalex.org/I4210134083"]},{"raw_affiliation_string":"IBM Research Div","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036267166","display_name":"J. H. Stathis","orcid":"https://orcid.org/0000-0001-8340-2475"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210106712","display_name":"Alliance for Safe Kids","ror":"https://ror.org/01922pt58","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210106712"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James H. Stathis","raw_affiliation_strings":["IBM Research Div","Yorktown Heights, NY"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Research Div","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210106712"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3896,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45029288,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1","issue":null,"first_page":"3A.3","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.9020789265632629},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.7277101874351501},{"id":"https://openalex.org/keywords/dielectric-strength","display_name":"Dielectric strength","score":0.5101807117462158},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.46625837683677673},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.41539621353149414},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.34620147943496704},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31562700867652893},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.285288542509079},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.12317007780075073}],"concepts":[{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.9020789265632629},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.7277101874351501},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.5101807117462158},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.46625837683677673},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.41539621353149414},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.34620147943496704},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31562700867652893},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.285288542509079},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12317007780075073}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2018.8353553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2018.8353553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1981080265","https://openalex.org/W2003900900","https://openalex.org/W2035158166","https://openalex.org/W2040737776","https://openalex.org/W2048253856","https://openalex.org/W2067751972","https://openalex.org/W2084822765","https://openalex.org/W2099474450","https://openalex.org/W2114840932","https://openalex.org/W2121272280","https://openalex.org/W2152223161","https://openalex.org/W2154032027","https://openalex.org/W2154047207","https://openalex.org/W4238515562","https://openalex.org/W4361772859"],"related_works":["https://openalex.org/W3083898685","https://openalex.org/W1973754976","https://openalex.org/W189075692","https://openalex.org/W4220847856","https://openalex.org/W4220801072","https://openalex.org/W2374817159","https://openalex.org/W4226215114","https://openalex.org/W4220731674","https://openalex.org/W2084718927","https://openalex.org/W2517330312"],"abstract_inverted_index":{"We":[0,23],"present":[1],"the":[2,19,26,50,57,81,97,103,107,137,140,152],"general":[3],"framework":[4],"of":[5,8,21,52,106,114,125,143,154],"elapsed-time":[6,69,115],"statistics":[7,63,116],"successive":[9,29,88],"breakdown":[10],"(BD)":[11],"events":[12,31,60,90],"in":[13,18,49,119,151],"application":[14],"to":[15,33,45,80],"multiple-spot":[16,53,144],"BD":[17,30,35,59,83,89,99,109,146],"presence":[20,153],"variability.":[22,133,155],"show":[24],"that":[25,68],"elapsed-times":[27,86],"between":[28,87],"due":[32],"multiple":[34],"spots":[36],"(or":[37],"filaments)":[38],"are":[39,71,117],"statistically":[40],"distributed":[41],"and":[42,127,131],"contribute":[43],"significantly":[44],"total":[46],"post-BD":[47],"margins":[48],"case":[51],"progressive":[54,145],"BD.":[55],"Unlike":[56],"first":[58,82,98,108],"following":[61],"Weibull":[62,104],"without":[64,132],"variability,":[65],"we":[66],"demonstrate":[67],"distributions":[70,77],"fundamentally":[72],"non-Weibull":[73],"with":[74,122,130],"much":[75],"broader":[76],"as":[78],"compared":[79],"statistics.":[84],"The":[85],"can":[91],"be":[92],"longer":[93],"or":[94],"shorter":[95],"than":[96],"time,":[100],"depending":[101],"on":[102],"slopes":[105],"distribution.":[110],"Our":[111],"simulation":[112],"results":[113],"shown":[118],"good":[120],"agreement":[121],"experimental":[123],"data":[124],"FEOL":[126],"BEOL":[128,149],"dielectrics":[129,150],"This":[134],"methodology":[135,147],"paves":[136],"way":[138],"for":[139,148],"correct":[141],"implementation":[142]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}