{"id":"https://openalex.org/W1570949922","doi":"https://doi.org/10.1109/irps.2015.7112832","title":"Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams","display_name":"Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1570949922","doi":"https://doi.org/10.1109/irps.2015.7112832","mag":"1570949922"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112832","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112832","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085468607","display_name":"Geunyong Bak","orcid":"https://orcid.org/0000-0002-7415-9642"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"GeunYong Bak","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082747615","display_name":"Soon Young Lee","orcid":"https://orcid.org/0000-0002-3160-577X"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soonyoung Lee","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077501267","display_name":"Hosung Lee","orcid":"https://orcid.org/0000-0002-0535-7354"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hosung Lee","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102976877","display_name":"Kyung\u2010Bae Park","orcid":"https://orcid.org/0000-0001-7893-8689"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"KyungBae Park","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028169407","display_name":"Sanghyeon Baeg","orcid":"https://orcid.org/0000-0002-6990-1312"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sanghyeon Baeg","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University Sa 3-dong, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I4575257"]},{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Hanyang University, Sa 3-dong, Sangnok-gu Ansan-si, Gyeonggi-do 426-791, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025156540","display_name":"Shi-Jie Wen","orcid":"https://orcid.org/0009-0002-7478-2351"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"ShiJie Wen","raw_affiliation_strings":["Cisco Systems Inc., San Jose, CA, USA","Cisco Systems Inc., 170 W. Tasman, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Cisco Systems Inc., 170 W. Tasman, San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079841586","display_name":"Richard Wong","orcid":"https://orcid.org/0000-0002-8040-7083"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Richard Wong","raw_affiliation_strings":["Cisco Systems Inc., San Jose, CA, USA","Cisco Systems Inc., 170 W. Tasman, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Cisco Systems Inc., 170 W. Tasman, San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091068402","display_name":"Charlie Slayman","orcid":null},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Charlie Slayman","raw_affiliation_strings":["Cisco Systems Inc., San Jose, CA, USA","Cisco Systems Inc., 170 W. Tasman, San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc., San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]},{"raw_affiliation_string":"Cisco Systems Inc., 170 W. Tasman, San Jose, CA, USA","institution_ids":["https://openalex.org/I135428043"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5085468607"],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":null,"apc_paid":null,"fwci":0.5919,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.70998319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"SE.3.1","last_page":"SE.3.5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.6604070663452148},{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.6164150834083557},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5404530167579651},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5171601176261902},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5042868852615356},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4722031056880951},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.434080570936203},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3257542848587036},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.3227192163467407},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3120546340942383},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19186371564865112},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.18470647931098938},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.173794686794281},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11645445227622986},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.10149627923965454}],"concepts":[{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.6604070663452148},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.6164150834083557},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5404530167579651},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5171601176261902},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5042868852615356},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4722031056880951},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.434080570936203},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3257542848587036},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.3227192163467407},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3120546340942383},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19186371564865112},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.18470647931098938},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.173794686794281},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11645445227622986},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.10149627923965454},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2015.7112832","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112832","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2059214545","https://openalex.org/W2096927458","https://openalex.org/W2146625936","https://openalex.org/W2151816948","https://openalex.org/W2162457113","https://openalex.org/W2543484774"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W1523508240","https://openalex.org/W2086616086","https://openalex.org/W2622269177","https://openalex.org/W2165400042","https://openalex.org/W2978528242","https://openalex.org/W2160088500","https://openalex.org/W2081303028","https://openalex.org/W3208260600","https://openalex.org/W2012451149"],"abstract_inverted_index":{"Logic":[0],"upsets":[1,20],"in":[2],"3x":[3],"nm":[4],"DDR3":[5],"SDRAM":[6],"have":[7],"been":[8],"observed":[9],"with":[10],"both":[11],"45":[12],"MeV":[13],"proton":[14],"and":[15],"neutron":[16],"irradiation.":[17],"The":[18],"logic":[19,40],"caused":[21],"massive":[22],"bit":[23],"flips,":[24],"which":[25],"manifested":[26],"as":[27,44],"either":[28],"column":[29],"or":[30],"row":[31],"clusters.":[32],"If":[33],"all":[34],"the":[35,50,54,69],"bits":[36],"flipped":[37],"by":[38],"a":[39],"upset":[41],"are":[42],"counted":[43],"multiple":[45],"pseudo":[46,55],"SBU":[47,56,70],"events,":[48],"then":[49],"cross-section":[51],"value":[52],"of":[53,63,68],"events":[57],"was,":[58],"at":[59],"least,":[60],"four":[61],"orders":[62],"magnitude":[64],"higher":[65],"than":[66],"that":[67],"events.":[71]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}