{"id":"https://openalex.org/W1570543066","doi":"https://doi.org/10.1109/irps.2015.7112828","title":"Impact of package on neutron induced single event upset in 20 nm SRAM","display_name":"Impact of package on neutron induced single event upset in 20 nm SRAM","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1570543066","doi":"https://doi.org/10.1109/irps.2015.7112828","mag":"1570543066"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112828","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112828","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102998461","display_name":"Taiki Uemura","orcid":"https://orcid.org/0000-0002-6028-547X"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taiki Uemura","raw_affiliation_strings":["Fujitsu Semiconductor Ltd., Tokyo, Japan","Osaka University, Osaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"Osaka University, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082708331","display_name":"Takashi Kato","orcid":"https://orcid.org/0000-0002-3179-5315"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Kato","raw_affiliation_strings":["Fujitsu Semiconductor Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033007374","display_name":"Hideya Matsuyama","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideya Matsuyama","raw_affiliation_strings":["Fujitsu Semiconductor Ltd., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fujitsu Semiconductor Ltd., Tokyo, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Osaka University, Osaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Osaka University, Osaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.02950621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"SE.9.1","last_page":"SE.9.4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13465","display_name":"Graphite, nuclear technology, radiation studies","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.8958027362823486},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.8902534246444702},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7774465680122375},{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.6613282561302185},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5377902984619141},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.5042766332626343},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.48619669675827026},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4791552424430847},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.4786050021648407},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.4753534495830536},{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.46474072337150574},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.4154161512851715},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3301147222518921},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2671397626399994},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.19188278913497925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1413809359073639},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1366082727909088},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.07229018211364746}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.8958027362823486},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.8902534246444702},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7774465680122375},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.6613282561302185},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5377902984619141},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5042766332626343},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.48619669675827026},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4791552424430847},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.4786050021648407},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.4753534495830536},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.46474072337150574},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.4154161512851715},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3301147222518921},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2671397626399994},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.19188278913497925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1413809359073639},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1366082727909088},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.07229018211364746},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2015.7112828","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112828","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1978596487","https://openalex.org/W2011374286","https://openalex.org/W2041615232","https://openalex.org/W2051746207","https://openalex.org/W2175328863","https://openalex.org/W2331717731","https://openalex.org/W3187317723"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W1523508240","https://openalex.org/W2622269177","https://openalex.org/W2086616086","https://openalex.org/W2978528242","https://openalex.org/W2065552285","https://openalex.org/W2165400042","https://openalex.org/W1500230652","https://openalex.org/W2051386096","https://openalex.org/W3208260600"],"abstract_inverted_index":{"This":[0],"work":[1],"investigates":[2],"the":[3,23,31,35,39,59,70,82],"impact":[4],"of":[5,22,38,94],"package":[6,60,83],"structure":[7,84],"on":[8],"single":[9],"event":[10],"upset":[11],"(SEU)":[12],"rate":[13,44,72,76],"through":[14],"neutron":[15],"irradiation":[16],"test":[17,27],"and":[18,65,97],"Monte":[19],"Carlo":[20],"simulation":[21,50],"particles":[24,56],"passage.":[25],"Irradiation":[26],"results":[28],"show":[29],"that":[30,53],"resin":[32],"existing":[33],"in":[34,58],"upper":[36],"stream":[37],"beam":[40],"could":[41],"increase":[42],"SEU":[43,71,75],"by":[45],"about":[46],"10":[47],"%.":[48],"The":[49],"result":[51],"demonstrates":[52],"light":[54],"secondary":[55],"generated":[57],"materials,":[61],"such":[62],"as":[63],"proton":[64],"alpha":[66],"particles,":[67],"contribute":[68],"to":[69,81],"elevation.":[73],"Therefore,":[74],"evaluation":[77],"should":[78],"pay":[79],"attention":[80],"especially":[85],"for":[86],"low":[87,91],"voltage":[88],"devices":[89],"having":[90],"critical":[92],"charge":[93],"0.4":[95],"fC":[96],"below.":[98]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}