{"id":"https://openalex.org/W1527042761","doi":"https://doi.org/10.1109/irps.2015.7112796","title":"Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering","display_name":"Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1527042761","doi":"https://doi.org/10.1109/irps.2015.7112796","mag":"1527042761"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110088823","display_name":"Tzu\u2010Cheng Kao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087574","display_name":"Richtek Technology (Taiwan)","ror":"https://ror.org/00593cw33","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210087574"]},{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Tzu-Cheng Kao","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan","Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210087574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083299231","display_name":"Chenhsin Lien","orcid":"https://orcid.org/0000-0002-2186-8752"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen-Hsin Lien","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112104762","display_name":"Chien\u2010Wei Chiu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087574","display_name":"Richtek Technology (Taiwan)","ror":"https://ror.org/00593cw33","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210087574"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Wei Chiu","raw_affiliation_strings":["Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210087574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040031014","display_name":"Jian\u2010Hsing Lee","orcid":"https://orcid.org/0000-0001-5903-6890"},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jian-Hsing Lee","raw_affiliation_strings":["Global Foundries Inc., Malta, New York State, USA"],"affiliations":[{"raw_affiliation_string":"Global Foundries Inc., Malta, New York State, USA","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024012920","display_name":"Yen-Hsiang Lo","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yen-Hsiang Lo","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110060274","display_name":"Chung\u2010Yu Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087574","display_name":"Richtek Technology (Taiwan)","ror":"https://ror.org/00593cw33","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210087574"]},{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chung-Yu Hung","raw_affiliation_strings":["Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan","Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210087574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109865507","display_name":"Tsung-Yi Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087574","display_name":"Richtek Technology (Taiwan)","ror":"https://ror.org/00593cw33","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210087574"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsung-Yi Huang","raw_affiliation_strings":["Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210087574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109858435","display_name":"Hung\u2010Der Su","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087574","display_name":"Richtek Technology (Taiwan)","ror":"https://ror.org/00593cw33","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210087574"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hung-Der Su","raw_affiliation_strings":["Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Richtek Technology Corporation, Chupei City, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210087574"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5110088823"],"corresponding_institution_ids":["https://openalex.org/I25846049","https://openalex.org/I4210087574"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.02220189,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"EL.5.1","last_page":"EL.5.5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.9041509032249451},{"id":"https://openalex.org/keywords/displacement-current","display_name":"Displacement current","score":0.5878862738609314},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5563192963600159},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.5001938343048096},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.48347026109695435},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47959673404693604},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4740065038204193},{"id":"https://openalex.org/keywords/signal-edge","display_name":"Signal edge","score":0.44936031103134155},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4231644570827484},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3922502100467682},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.391819030046463},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34808704257011414},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16771221160888672},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13559871912002563}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.9041509032249451},{"id":"https://openalex.org/C101142426","wikidata":"https://www.wikidata.org/wiki/Q853178","display_name":"Displacement current","level":3,"score":0.5878862738609314},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5563192963600159},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.5001938343048096},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48347026109695435},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47959673404693604},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4740065038204193},{"id":"https://openalex.org/C117525741","wikidata":"https://www.wikidata.org/wiki/Q775654","display_name":"Signal edge","level":4,"score":0.44936031103134155},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4231644570827484},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3922502100467682},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.391819030046463},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34808704257011414},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16771221160888672},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13559871912002563},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2015.7112796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8299999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1494662343","https://openalex.org/W1953314959","https://openalex.org/W2066994444","https://openalex.org/W2114812503","https://openalex.org/W2117703439","https://openalex.org/W2144827839","https://openalex.org/W6629746933","https://openalex.org/W6641004013","https://openalex.org/W6667144631"],"related_works":["https://openalex.org/W2124694210","https://openalex.org/W2544244340","https://openalex.org/W2153609444","https://openalex.org/W3160715487","https://openalex.org/W1482270496","https://openalex.org/W2092583844","https://openalex.org/W2131993688","https://openalex.org/W2373946135","https://openalex.org/W2142984111","https://openalex.org/W1527042761"],"abstract_inverted_index":{"A":[0],"new":[1],"enhanced":[2],"displacement-current":[3],"triggering":[4],"by":[5,36],"adding":[6],"floating":[7],"P+":[8],"diffusions":[9],"at":[10],"each":[11],"source":[12],"finger":[13],"edge":[14],"for":[15],"the":[16,22,34,37,53],"HV":[17],"LDNMOSFET":[18],"is":[19,29],"proposed.":[20],"Unlike":[21],"conventional":[23],"substrate-triggered":[24],"ESD":[25,56],"protection":[26],"technologies,":[27],"it":[28],"very":[30],"easy":[31],"to":[32,64],"implement":[33],"scheme":[35],"layout":[38],"without":[39],"any":[40],"special":[41],"circuit":[42],"and":[43],"additional":[44],"component.":[45],"With":[46],"a":[47],"total":[48],"width":[49],"of":[50],"1600":[51],"\u03bcm,":[52],"HBM/":[54],"MM":[55],"performance":[57],"improvements":[58],"from":[59],"1.5":[60],"kV/":[61,66],"150":[62],"V":[63,68],"5.5":[65],"450":[67],"are":[69],"achieved.":[70]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}