{"id":"https://openalex.org/W1519309621","doi":"https://doi.org/10.1109/irps.2015.7112744","title":"Understanding pulsed-cycling variability and endurance in HfO&lt;inf&gt;x&lt;/inf&gt; RRAM","display_name":"Understanding pulsed-cycling variability and endurance in HfO&lt;inf&gt;x&lt;/inf&gt; RRAM","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1519309621","doi":"https://doi.org/10.1109/irps.2015.7112744","mag":"1519309621"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112744","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112744","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067285224","display_name":"Simone Balatti","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"S. Balatti","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028455655","display_name":"Stefano Ambrogio","orcid":"https://orcid.org/0000-0002-5475-4209"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Ambrogio","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101479332","display_name":"Zhongqiang Wang","orcid":"https://orcid.org/0000-0002-1133-6058"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Z.-Q. Wang","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077197820","display_name":"Scott Sills","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["IT","US"],"is_corresponding":false,"raw_author_name":"S. Sills","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","[Micron Technology Inc., Boise, ID, USA]"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"[Micron Technology Inc., Boise, ID, USA]","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046856952","display_name":"Alessandro Calderoni","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["IT","US"],"is_corresponding":false,"raw_author_name":"A. Calderoni","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","[Micron Technology Inc., Boise, ID, USA]"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"[Micron Technology Inc., Boise, ID, USA]","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080456339","display_name":"Nirmal Ramaswamy","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]},{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["IT","US"],"is_corresponding":false,"raw_author_name":"N. Ramaswamy","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","[Micron Technology Inc., Boise, ID, USA]"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"[Micron Technology Inc., Boise, ID, USA]","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054173368","display_name":"Daniele Ielmini","orcid":"https://orcid.org/0000-0002-1853-1614"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Ielmini","raw_affiliation_strings":["DEIB, Politecnico di Milano and IU.NET, Milano, Italy","DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy"],"affiliations":[{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"DEIB, Politecnico di Milano and IU.NET, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5067285224"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":1.381,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.82773507,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"5B.3.1","last_page":"5B.3.6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9466893672943115},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.8522930145263672},{"id":"https://openalex.org/keywords/cycling","display_name":"Cycling","score":0.6152689456939697},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.5612603425979614},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5581585764884949},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48490816354751587},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.48143547773361206},{"id":"https://openalex.org/keywords/pulse-amplitude-modulation","display_name":"Pulse-amplitude modulation","score":0.46525460481643677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45050907135009766},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.43253499269485474},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.42571014165878296},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.41671693325042725},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3419380187988281},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3263311982154846},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2550172209739685},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21130713820457458},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.13353753089904785}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9466893672943115},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.8522930145263672},{"id":"https://openalex.org/C541528975","wikidata":"https://www.wikidata.org/wiki/Q53121","display_name":"Cycling","level":2,"score":0.6152689456939697},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.5612603425979614},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5581585764884949},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48490816354751587},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.48143547773361206},{"id":"https://openalex.org/C20518276","wikidata":"https://www.wikidata.org/wiki/Q186130","display_name":"Pulse-amplitude modulation","level":4,"score":0.46525460481643677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45050907135009766},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43253499269485474},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.42571014165878296},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.41671693325042725},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3419380187988281},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3263311982154846},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2550172209739685},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21130713820457458},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.13353753089904785},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps.2015.7112744","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112744","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/984377","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/984377","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1928164400","https://openalex.org/W1974136515","https://openalex.org/W1976363611","https://openalex.org/W1996443105","https://openalex.org/W1999458342","https://openalex.org/W2002289663","https://openalex.org/W2004823737","https://openalex.org/W2008709920","https://openalex.org/W2020003503","https://openalex.org/W2028341480","https://openalex.org/W2053631264","https://openalex.org/W2073265005","https://openalex.org/W2137862082","https://openalex.org/W2141566011","https://openalex.org/W2149380925","https://openalex.org/W2165310699"],"related_works":["https://openalex.org/W4312903428","https://openalex.org/W2621306919","https://openalex.org/W1966944787","https://openalex.org/W2032785938","https://openalex.org/W3185106882","https://openalex.org/W1980275992","https://openalex.org/W1980301972","https://openalex.org/W2761437135","https://openalex.org/W2086074825","https://openalex.org/W2025338515"],"abstract_inverted_index":{"Resistive":[0],"switching":[1,61],"memory":[2],"(RRAM)":[3],"devices":[4],"based":[5],"on":[6,63,84],"metal":[7],"oxides":[8],"are":[9,92],"receiving":[10],"strong":[11],"interest":[12],"for":[13,99],"future":[14],"high-density":[15],"stand-alone":[16],"memories":[17],"and":[18,31,37,48,67,82],"storage":[19],"class":[20],"memories.":[21],"To":[22],"explore":[23],"possible":[24],"applications":[25],"of":[26,45,60,80],"RRAM,":[27],"the":[28,58,106],"set/reset":[29,73],"variability":[30,47,62],"cycling":[32,85],"endurance":[33,49,86,100],"must":[34],"be":[35],"addressed":[36],"understood.":[38],"This":[39],"work":[40],"shows":[41],"a":[42,95],"comprehensive":[43],"study":[44],"pulsed-operated":[46],"in":[50,75],"HfO":[51],"<sub":[52],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[53],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">x</sub>":[54],"-RRAM.":[55],"We":[56],"analysed":[57],"dependence":[59],"operation":[64],"current,":[65],"voltage":[66],"pulse-width,":[68],"providing":[69],"guidelines":[70],"to":[71],"optimize":[72],"distributions":[74],"oxide":[76],"RRAM.":[77],"The":[78,90],"impact":[79],"pulse-amplitude":[81],"pulse-width":[83],"is":[87],"then":[88],"discussed.":[89],"results":[91],"explained":[93],"by":[94,102],"new":[96],"physics-based":[97],"model":[98],"controlled":[101],"defect":[103],"injection":[104],"from":[105],"bottom":[107],"electrode":[108],"during":[109],"reset.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}