{"id":"https://openalex.org/W1592800232","doi":"https://doi.org/10.1109/irps.2015.7112706","title":"Origins and implications of increased channel hot carrier variability in nFinFETs","display_name":"Origins and implications of increased channel hot carrier variability in nFinFETs","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1592800232","doi":"https://doi.org/10.1109/irps.2015.7112706","mag":"1592800232"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2015.7112706","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112706","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://researchonline.ljmu.ac.uk/id/eprint/2146/1/BTI-CHC_draft-Ben-IRPS2015.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058263075","display_name":"B. Kaczer","orcid":"https://orcid.org/0000-0002-1484-4007"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"B. Kaczer","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068577719","display_name":"J. Franco","orcid":"https://orcid.org/0000-0002-7382-8605"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. Franco","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018137674","display_name":"M. Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M. Cho","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"T. Grasser","raw_affiliation_strings":["Technische Universitat Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitat Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112956807","display_name":"Ph. J. Roussel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ph. J. Roussel","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028115879","display_name":"Stanislav Tyaginov","orcid":"https://orcid.org/0000-0002-5348-2096"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"S. Tyaginov","raw_affiliation_strings":["Technische Universitat Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitat Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004414244","display_name":"M. Bina","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Bina","raw_affiliation_strings":["Technische Universitat Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitat Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015635539","display_name":"Yannick Wimmer","orcid":"https://orcid.org/0000-0002-9531-6459"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Y. Wimmer","raw_affiliation_strings":["Technische Universitat Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Technische Universitat Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019358707","display_name":"Luis Miguel Pr\u00f3cel","orcid":"https://orcid.org/0000-0001-6189-5184"},"institutions":[{"id":"https://openalex.org/I69094615","display_name":"Universidad San Francisco de Quito","ror":"https://ror.org/01r2c3v86","country_code":"EC","type":"education","lineage":["https://openalex.org/I69094615"]}],"countries":["EC"],"is_corresponding":false,"raw_author_name":"L. M. Procel","raw_affiliation_strings":["Universidad San Francisco de Quito, Quito, Ecuador"],"affiliations":[{"raw_affiliation_string":"Universidad San Francisco de Quito, Quito, Ecuador","institution_ids":["https://openalex.org/I69094615"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080224527","display_name":"Lionel Trojman","orcid":"https://orcid.org/0000-0003-2316-4959"},"institutions":[{"id":"https://openalex.org/I69094615","display_name":"Universidad San Francisco de Quito","ror":"https://ror.org/01r2c3v86","country_code":"EC","type":"education","lineage":["https://openalex.org/I69094615"]}],"countries":["EC"],"is_corresponding":false,"raw_author_name":"L. Trojman","raw_affiliation_strings":["Universidad San Francisco de Quito, Quito, Ecuador"],"affiliations":[{"raw_affiliation_string":"Universidad San Francisco de Quito, Quito, Ecuador","institution_ids":["https://openalex.org/I69094615"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086668405","display_name":"Felice Crupi","orcid":"https://orcid.org/0000-0002-5011-6621"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Crupi","raw_affiliation_strings":["Univcrsita della Calabria, Cosenza, Italy"],"affiliations":[{"raw_affiliation_string":"Univcrsita della Calabria, Cosenza, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081730730","display_name":"Gregory Pitner","orcid":"https://orcid.org/0000-0002-0518-3745"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Pitner","raw_affiliation_strings":["visiting imec from Stanford University, Stanford, CA, USA"],"affiliations":[{"raw_affiliation_string":"visiting imec from Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040851808","display_name":"V. Putcha","orcid":"https://orcid.org/0000-0003-1907-5486"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"V. Putcha","raw_affiliation_strings":["KULeuven, Leuven, Belgium","imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KULeuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087726615","display_name":"Pieter Weckx","orcid":"https://orcid.org/0000-0003-4579-0571"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P. Weckx","raw_affiliation_strings":["KULeuven, Leuven, Belgium","imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KULeuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020854030","display_name":"E. Bury","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"E. Bury","raw_affiliation_strings":["KULeuven, Leuven, Belgium","imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KULeuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058083493","display_name":"Zhigang Ji","orcid":"https://orcid.org/0000-0003-1138-804X"},"institutions":[{"id":"https://openalex.org/I63098007","display_name":"Liverpool John Moores University","ror":"https://ror.org/04zfme737","country_code":"GB","type":"education","lineage":["https://openalex.org/I63098007"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Z. Ji","raw_affiliation_strings":["visiting imec from Liverpool John Moores University, Liverpool, UK"],"affiliations":[{"raw_affiliation_string":"visiting imec from Liverpool John Moores University, Liverpool, UK","institution_ids":["https://openalex.org/I63098007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056543688","display_name":"A. De Keersgieter","orcid":"https://orcid.org/0000-0002-5527-8582"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. De Keersgieter","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076508833","display_name":"T. Chiarella","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"T. Chiarella","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065113949","display_name":"Naoto Horiguchi","orcid":"https://orcid.org/0000-0001-5490-0416"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"N. Horiguchi","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020367935","display_name":"G. Groeseneken","orcid":"https://orcid.org/0000-0003-3763-2098"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Groeseneken","raw_affiliation_strings":["KULeuven, Leuven, Belgium","imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"KULeuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050315289","display_name":"Aaron Thean","orcid":"https://orcid.org/0000-0003-2418-6404"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. Thean","raw_affiliation_strings":["imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":6,"institutions_distinct_count":21,"corresponding_author_ids":["https://openalex.org/A5058263075"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":2.84034107,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.92792939,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"3B.5.1","last_page":"3B.5.6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7737605571746826},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6534672975540161},{"id":"https://openalex.org/keywords/hot-carrier-injection","display_name":"Hot-carrier injection","score":0.5347996950149536},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5166616439819336},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5124605298042297},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.47237780690193176},{"id":"https://openalex.org/keywords/instability","display_name":"Instability","score":0.4314122498035431},{"id":"https://openalex.org/keywords/percentile","display_name":"Percentile","score":0.43057847023010254},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3455151319503784},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3241620659828186},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2624942660331726},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.26201966404914856},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22537332773208618},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19697067141532898},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.1789853274822235},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16438066959381104},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15681689977645874},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.15100014209747314},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.09716618061065674}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7737605571746826},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6534672975540161},{"id":"https://openalex.org/C73500089","wikidata":"https://www.wikidata.org/wiki/Q2445876","display_name":"Hot-carrier injection","level":4,"score":0.5347996950149536},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5166616439819336},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5124605298042297},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.47237780690193176},{"id":"https://openalex.org/C207821765","wikidata":"https://www.wikidata.org/wiki/Q405372","display_name":"Instability","level":2,"score":0.4314122498035431},{"id":"https://openalex.org/C122048520","wikidata":"https://www.wikidata.org/wiki/Q2913954","display_name":"Percentile","level":2,"score":0.43057847023010254},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3455151319503784},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3241620659828186},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2624942660331726},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.26201966404914856},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22537332773208618},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19697067141532898},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1789853274822235},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16438066959381104},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15681689977645874},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.15100014209747314},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.09716618061065674},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irps.2015.7112706","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2015.7112706","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Reliability Physics Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:researchonline.ljmu.ac.uk:2146","is_oa":true,"landing_page_url":null,"pdf_url":"https://researchonline.ljmu.ac.uk/id/eprint/2146/1/BTI-CHC_draft-Ben-IRPS2015.pdf","source":{"id":"https://openalex.org/S4306401246","display_name":"Liverpool John Moores University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63098007","host_organization_name":"Liverpool John Moores University","host_organization_lineage":["https://openalex.org/I63098007"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},{"id":"pmh:oai:HAL:hal-02952187v1","is_oa":false,"landing_page_url":"https://hal.science/hal-02952187","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2015 IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterey, United States. pp.3B.5.1-3B.5.6, ⟨10.1109/IRPS.2015.7112706⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:researchonline.ljmu.ac.uk:2146","is_oa":true,"landing_page_url":null,"pdf_url":"https://researchonline.ljmu.ac.uk/id/eprint/2146/1/BTI-CHC_draft-Ben-IRPS2015.pdf","source":{"id":"https://openalex.org/S4306401246","display_name":"Liverpool John Moores University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63098007","host_organization_name":"Liverpool John Moores University","host_organization_lineage":["https://openalex.org/I63098007"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1592800232.pdf"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W1491999247","https://openalex.org/W1592283839","https://openalex.org/W1964412412","https://openalex.org/W1979243431","https://openalex.org/W1988922865","https://openalex.org/W1992452354","https://openalex.org/W1995863305","https://openalex.org/W1995998773","https://openalex.org/W2033077449","https://openalex.org/W2051401738","https://openalex.org/W2059319356","https://openalex.org/W2060075728","https://openalex.org/W2073767856","https://openalex.org/W2085434287","https://openalex.org/W2122520074","https://openalex.org/W2139006661","https://openalex.org/W2140823559","https://openalex.org/W2141899849","https://openalex.org/W2153685625","https://openalex.org/W2153772101","https://openalex.org/W2161200337","https://openalex.org/W2169317892","https://openalex.org/W6629529268","https://openalex.org/W6665578906"],"related_works":["https://openalex.org/W1550559433","https://openalex.org/W2189235034","https://openalex.org/W2319948171","https://openalex.org/W2044237804","https://openalex.org/W4233457764","https://openalex.org/W2117734186","https://openalex.org/W2590689037","https://openalex.org/W2106165565","https://openalex.org/W2130811814","https://openalex.org/W2536338431"],"abstract_inverted_index":{"Channel":[0],"hot":[1],"carrier":[2],"(CHC)":[3],"stress":[4],"is":[5,37,48],"observed":[6],"to":[7,61,65],"result":[8],"in":[9,14,51],"higher":[10],"variability":[11,35],"of":[12,25],"degradation":[13],"deeply-scaled":[15,52],"nFinFETs":[16],"than":[17],"bias":[18],"temperature":[19],"instability":[20],"(BTI)":[21],"stress.":[22],"Potential":[23],"sources":[24],"this":[26],"increased":[27],"variation":[28],"are":[29],"discussed":[30],"and":[31,64],"the":[32],"intrinsic":[33],"time-dependent":[34,55],"component":[36],"extracted":[38],"using":[39],"a":[40],"novel":[41],"methodology":[42],"based":[43],"on":[44],"matched":[45],"pairs.":[46],"It":[47],"concluded":[49],"that":[50],"devices,":[53],"CHC-induced":[54],"distributions":[56],"will":[57,74],"be":[58],"bimodal,":[59],"pertaining":[60],"bulk":[62],"charging":[63],"interface":[66],"defect":[67],"generation,":[68],"respectively.":[69],"The":[70],"latter,":[71],"high-impact":[72],"mode":[73],"control":[75],"circuit":[76],"failure":[77],"fractions":[78],"at":[79],"high":[80],"percentiles.":[81]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5}],"updated_date":"2026-02-09T09:26:11.010843","created_date":"2025-10-10T00:00:00"}