{"id":"https://openalex.org/W4405785100","doi":"https://doi.org/10.1109/iros58592.2024.10801895","title":"Pseudo-Domain Adversarial Networks with Electrical Impedance Tomography for Electrode Offset Error","display_name":"Pseudo-Domain Adversarial Networks with Electrical Impedance Tomography for Electrode Offset Error","publication_year":2024,"publication_date":"2024-10-14","ids":{"openalex":"https://openalex.org/W4405785100","doi":"https://doi.org/10.1109/iros58592.2024.10801895"},"language":"en","primary_location":{"id":"doi:10.1109/iros58592.2024.10801895","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iros58592.2024.10801895","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012811856","display_name":"Gengchen Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gengchen Xu","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059507014","display_name":"Haofeng Chen","orcid":"https://orcid.org/0000-0003-4965-2301"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haofeng Chen","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101780772","display_name":"Xuanxuan Yang","orcid":"https://orcid.org/0000-0001-9174-1063"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuanxuan Yang","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018452053","display_name":"Gang Ma","orcid":"https://orcid.org/0000-0001-8853-4151"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Ma","raw_affiliation_strings":["University of Science and Technology of China,Hefei,China,230026"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Science and Technology of China,Hefei,China,230026","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5115592360","display_name":"Xiaojie Wang","orcid":"https://orcid.org/0000-0001-5120-8205"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaojie Wang","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institutes of Physical Science,Chinese Academy of Sciences,Hefei,China,230031","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2715,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58352199,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"7020","last_page":"7026"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9927999973297119,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9807000160217285,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9761000275611877,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.8294925093650818},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6829135417938232},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6506983637809753},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.6004754900932312},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.549060046672821},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4261753559112549},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3806571066379547},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.327387273311615},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3254355490207672},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17279773950576782},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16656732559204102},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09187948703765869}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.8294925093650818},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6829135417938232},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6506983637809753},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.6004754900932312},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.549060046672821},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4261753559112549},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3806571066379547},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.327387273311615},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3254355490207672},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17279773950576782},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16656732559204102},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09187948703765869},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iros58592.2024.10801895","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iros58592.2024.10801895","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W632072084","https://openalex.org/W1976095506","https://openalex.org/W1995453310","https://openalex.org/W2012475698","https://openalex.org/W2047677175","https://openalex.org/W2097201626","https://openalex.org/W2103767335","https://openalex.org/W2186425670","https://openalex.org/W2294559741","https://openalex.org/W2563453945","https://openalex.org/W2593889821","https://openalex.org/W2736494635","https://openalex.org/W2788768841","https://openalex.org/W2915725179","https://openalex.org/W2963460174","https://openalex.org/W2964109570","https://openalex.org/W2985778816","https://openalex.org/W3000972117","https://openalex.org/W3006808307","https://openalex.org/W3036758894","https://openalex.org/W3199826973","https://openalex.org/W4214673920","https://openalex.org/W4320003030","https://openalex.org/W4385453371","https://openalex.org/W4387123658"],"related_works":["https://openalex.org/W2215273690","https://openalex.org/W2553917976","https://openalex.org/W2060278704","https://openalex.org/W2526896022","https://openalex.org/W2169180314","https://openalex.org/W2792816408","https://openalex.org/W4224096260","https://openalex.org/W2099199400","https://openalex.org/W2180830352","https://openalex.org/W2472517853"],"abstract_inverted_index":{"This":[0],"paper":[1],"propose":[2],"a":[3,51,87],"novel":[4],"transfer":[5,73],"learning":[6,74,101],"approach,":[7],"Pseudo-Domain":[8],"Adversarial":[9],"Network":[10],"(PDAN),":[11],"to":[12,75,106],"tackle":[13],"the":[14,35,47,70,80,91,96,113,150],"issue":[15],"of":[16,37,72,98,115,152],"electrode":[17,48,121,142],"displacement":[18],"in":[19,79,90,112,128,157],"Electrical":[20],"Impedance":[21],"Tomography":[22],"(EIT).":[23],"Electrode":[24],"displacement,":[25],"caused":[26,118],"by":[27,39,83,102,119],"human":[28],"movement":[29],"or":[30,54],"improper":[31],"operation,":[32],"significantly":[33],"affects":[34],"accuracy":[36],"EIT":[38],"introducing":[40],"data":[41],"errors.":[42],"Existing":[43],"solutions":[44],"either":[45],"modify":[46],"assembly":[49],"at":[50],"high":[52],"cost":[53],"employ":[55],"recognition":[56],"algorithms":[57],"that":[58],"require":[59],"retraining":[60],"from":[61,86],"scratch.":[62],"To":[63],"overcome":[64],"these":[65],"limitations,":[66],"our":[67],"work":[68],"leverages":[69],"power":[71],"enhance":[76],"model":[77],"performance":[78,127],"target":[81],"domain":[82],"utilizing":[84],"knowledge":[85],"related":[88],"task":[89],"source":[92],"domain.":[93],"PDAN":[94],"extends":[95],"capabilities":[97],"deep":[99],"adversarial":[100],"incorporating":[103],"noisy":[104],"images":[105],"simulate":[107],"post-electrode":[108],"rotation":[109],"scenarios,":[110],"aiding":[111],"reduction":[114],"negative":[116],"impacts":[117],"minor":[120],"displacements.":[122],"Our":[123],"method":[124],"demonstrates":[125],"superior":[126],"classifying":[129],"leg":[130],"posture":[131],"data,":[132],"achieving":[133],"around":[134],"90%":[135],"accuracy,":[136],"and":[137],"proving":[138],"robust":[139],"against":[140],"sensor":[141],"offset.":[143],"Experimental":[144],"results":[145],"across":[146],"various":[147],"datasets":[148],"validate":[149],"effectiveness":[151],"PDAN,":[153],"indicating":[154],"its":[155],"potential":[156],"addressing":[158],"complex":[159],"real-world":[160],"situations":[161],"with":[162],"improved":[163],"generalization":[164],"capabilities.":[165]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}