{"id":"https://openalex.org/W2064063781","doi":"https://doi.org/10.1109/iros.2013.6696477","title":"Nanorobotic in situ characterization of nanowire memristors and “memsensing”","display_name":"Nanorobotic in situ characterization of nanowire memristors and “memsensing”","publication_year":2013,"publication_date":"2013-11-01","ids":{"openalex":"https://openalex.org/W2064063781","doi":"https://doi.org/10.1109/iros.2013.6696477","mag":"2064063781"},"language":"en","primary_location":{"id":"doi:10.1109/iros.2013.6696477","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iros.2013.6696477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE/RSJ International Conference on Intelligent Robots and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/1273774","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050996662","display_name":"Zheng Fan","orcid":"https://orcid.org/0000-0001-8137-516X"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zheng Fan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA#TAB#","institution_ids":["https://openalex.org/I87216513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048449695","display_name":"Xudong Fan","orcid":"https://orcid.org/0000-0001-9385-1928"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xudong Fan","raw_affiliation_strings":["Center of Advance Microscopy, Michigan State University, East Lansing, MI, USA","Center of Adv. Microscopy, Michigan State Univ., East Lansing, MI, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Advance Microscopy, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]},{"raw_affiliation_string":"Center of Adv. Microscopy, Michigan State Univ., East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046487508","display_name":"Alex Li","orcid":null},"institutions":[{"id":"https://openalex.org/I55061410","display_name":"U.S. Air Force Institute of Technology","ror":"https://ror.org/03f9f1d95","country_code":"US","type":"education","lineage":["https://openalex.org/I1294991024","https://openalex.org/I1330347796","https://openalex.org/I1330347796","https://openalex.org/I2802362820","https://openalex.org/I4210089612","https://openalex.org/I4210102105","https://openalex.org/I4210102105","https://openalex.org/I55061410"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex Li","raw_affiliation_strings":["Air Force Institute of Technology, OH, USA","Air Force Institute of Technology, Wright Patterson AFB, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Air Force Institute of Technology, OH, USA","institution_ids":["https://openalex.org/I55061410"]},{"raw_affiliation_string":"Air Force Institute of Technology, Wright Patterson AFB, OH, USA","institution_ids":["https://openalex.org/I55061410"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100718940","display_name":"Lixin Dong","orcid":"https://orcid.org/0000-0002-8816-4944"},"institutions":[{"id":"https://openalex.org/I87216513","display_name":"Michigan State University","ror":"https://ror.org/05hs6h993","country_code":"US","type":"education","lineage":["https://openalex.org/I87216513"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lixin Dong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI, USA","institution_ids":["https://openalex.org/I87216513"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA#TAB#","institution_ids":["https://openalex.org/I87216513"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4697,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.69623833,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1028","last_page":"1033"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.8337095975875854},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.8277351260185242},{"id":"https://openalex.org/keywords/nanowire","display_name":"Nanowire","score":0.7069832682609558},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.6099757552146912},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4535849392414093},{"id":"https://openalex.org/keywords/nanoelectronics","display_name":"Nanoelectronics","score":0.43869078159332275},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.43030911684036255},{"id":"https://openalex.org/keywords/dopant","display_name":"Dopant","score":0.4104013442993164},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.3168379068374634},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1775939166545868}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.8337095975875854},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8277351260185242},{"id":"https://openalex.org/C74214498","wikidata":"https://www.wikidata.org/wiki/Q631739","display_name":"Nanowire","level":2,"score":0.7069832682609558},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.6099757552146912},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4535849392414093},{"id":"https://openalex.org/C141400236","wikidata":"https://www.wikidata.org/wiki/Q1479544","display_name":"Nanoelectronics","level":2,"score":0.43869078159332275},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.43030911684036255},{"id":"https://openalex.org/C191952053","wikidata":"https://www.wikidata.org/wiki/Q15119237","display_name":"Dopant","level":3,"score":0.4104013442993164},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.3168379068374634},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1775939166545868},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iros.2013.6696477","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iros.2013.6696477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE/RSJ International Conference on Intelligent Robots and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:1273774","is_oa":true,"landing_page_url":"https://zenodo.org/record/1273774","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:1273774","is_oa":true,"landing_page_url":"https://zenodo.org/record/1273774","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1682906149","https://openalex.org/W1943178046","https://openalex.org/W1969961998","https://openalex.org/W1983764068","https://openalex.org/W1995517757","https://openalex.org/W2013055927","https://openalex.org/W2015874077","https://openalex.org/W2025977133","https://openalex.org/W2043707274","https://openalex.org/W2045197688","https://openalex.org/W2073732618","https://openalex.org/W2091322859","https://openalex.org/W2112181056","https://openalex.org/W2118980095","https://openalex.org/W2168256886","https://openalex.org/W2799167959","https://openalex.org/W3099215981","https://openalex.org/W4231032259"],"related_works":["https://openalex.org/W4229452466","https://openalex.org/W2966276069","https://openalex.org/W2463286374","https://openalex.org/W2304829496","https://openalex.org/W2052332160","https://openalex.org/W2358307108","https://openalex.org/W2385877031","https://openalex.org/W3031124155","https://openalex.org/W2204001882","https://openalex.org/W190448578"],"abstract_inverted_index":{"We":[0],"report":[1],"the":[2,38,119,130,137,140,144,160,174,181],"nanorobotic":[3,46],"in":[4,34,191,198],"situ":[5,35],"forming":[6],"and":[7,19,50,61,116,169],"characterization":[8],"of":[9,33,41,58,98,102,118,139],"memristors":[10,42,79,157,184],"based":[11],"on":[12],"individual":[13],"copper":[14],"oxide":[15,163],"nanowires":[16],"(CuO":[17],"NWs)":[18],"their":[20,189],"potential":[21],"applications":[22,190],"as":[23,90,149,202],"nanosensors":[24],"with":[25,108,124],"memory":[26],"(memristic":[27],"sensors":[28],"or":[29],"\u201cmemsensors\u201d).":[30],"A":[31],"series":[32],"techniques":[36],"for":[37],"experimental":[39,65],"investigations":[40,66],"are":[43,67,80],"developed":[44],"including":[45],"manipulation,":[47],"electro-beam-based":[48],"forming,":[49],"electron":[51,72],"energy":[52],"loss":[53],"spectroscopy":[54],"(EELS)":[55],"enabled":[56],"correlation":[57],"transport":[59],"properties":[60,93],"carrier":[62],"distribution.":[63],"All":[64],"performed":[68],"inside":[69],"a":[70,150,167,195],"transmission":[71],"microscope":[73],"(TEM).":[74],"The":[75,100,114,154],"initial":[76],"CuO":[77,155,182],"NW":[78],"formed":[81],"by":[82,136],"localized":[83],"electron-beam":[84],"irradiation":[85],"to":[86],"generate":[87],"oxygen":[88,110,120],"vacancies":[89,121],"dopants.":[91],"Current-voltage":[92],"show":[94],"distinctive":[95],"hysteresis":[96],"characteristics":[97],"memristors.":[99],"mechanism":[101],"such":[103],"memristic":[104,131],"behaviors":[105],"is":[106,122],"explained":[107],"an":[109],"vacancy":[111],"migration":[112,117],"model.":[113],"presence":[115],"identified":[123],"EELS.":[125],"Investigations":[126],"also":[127],"reveal":[128],"that":[129,143],"behavior":[132],"can":[133,147],"be":[134],"influenced":[135],"deformation":[138],"nanowire,":[141],"showing":[142],"nanowire":[145],"memristor":[146],"serve":[148],"deformation/force":[151],"memorable":[152],"sensor.":[153],"NW-based":[156,183],"will":[158,185],"enrich":[159],"binary":[161],"transition":[162],"family":[164],"but":[165,193],"hold":[166],"simpler":[168],"more":[170],"compact":[171],"design":[172],"than":[173],"conventional":[175],"thin-film":[176],"version.":[177],"With":[178],"these":[179],"advantages,":[180],"not":[186],"only":[187],"facilitate":[188],"nanoelectronics":[192],"play":[194],"unique":[196],"role":[197],"micro-/nano-electromechanical":[199],"systems":[200],"(MEMS/NEMS)":[201],"well.":[203]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}