{"id":"https://openalex.org/W4413320796","doi":"https://doi.org/10.1109/iolts65288.2025.11116976","title":"On the Validity of SEE Simulation for Rad-Hard Analog ASICs","display_name":"On the Validity of SEE Simulation for Rad-Hard Analog ASICs","publication_year":2025,"publication_date":"2025-07-07","ids":{"openalex":"https://openalex.org/W4413320796","doi":"https://doi.org/10.1109/iolts65288.2025.11116976"},"language":"en","primary_location":{"id":"doi:10.1109/iolts65288.2025.11116976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts65288.2025.11116976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020547467","display_name":"Valent\u00edn Guti\u00e9rrez","orcid":"https://orcid.org/0000-0003-1902-4750"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Valentin Gutierrez","raw_affiliation_strings":["Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058280626","display_name":"Carlos Dom\u00ednguez","orcid":"https://orcid.org/0000-0002-0626-1186"},"institutions":[{"id":"https://openalex.org/I4210108458","display_name":"Office of Multidisciplinary Activities","ror":"https://ror.org/01sharn77","country_code":"US","type":"government","lineage":["https://openalex.org/I1311060795","https://openalex.org/I4210108458","https://openalex.org/I4210112577"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carlos Dominguez","raw_affiliation_strings":["Ommatidia Lidar,Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ommatidia Lidar,Spain","institution_ids":["https://openalex.org/I4210108458"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006780064","display_name":"Gildas L\u00e9ger","orcid":"https://orcid.org/0000-0002-2310-7906"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Gildas Leger","raw_affiliation_strings":["Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072282417","display_name":"Antonio Gin\u00e9s","orcid":"https://orcid.org/0000-0001-5272-5802"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Antonio Gines","raw_affiliation_strings":["Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091600572","display_name":"E. Peral\u00edas","orcid":"https://orcid.org/0000-0003-0629-0785"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Eduardo Peralias","raw_affiliation_strings":["Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla),Spain","institution_ids":["https://openalex.org/I4210104545"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17134392,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9569000005722046,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.5948565006256104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5940693020820618},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33085471391677856},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2568642199039459}],"concepts":[{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.5948565006256104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5940693020820618},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33085471391677856},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2568642199039459}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts65288.2025.11116976","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts65288.2025.11116976","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6605931322","display_name":null,"funder_award_id":"101008126","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1580893272","https://openalex.org/W1979837528","https://openalex.org/W2030501553","https://openalex.org/W2105524465","https://openalex.org/W2112103432","https://openalex.org/W2115516668","https://openalex.org/W2150156165","https://openalex.org/W2171981961","https://openalex.org/W4237207149","https://openalex.org/W4360595779","https://openalex.org/W4384009473"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2165367082","https://openalex.org/W1972641423","https://openalex.org/W611446063","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345"],"abstract_inverted_index":{"Predicting":[0],"the":[1,21,40,48,52,55,59,72,88,94,114,126],"Single-Event":[2,35],"Effects":[3],"in":[4],"integrated":[5],"circuits":[6],"before":[7],"their":[8,13],"fabrication":[9],"and":[10,27],"ultimately":[11],"estimating":[12],"cross-section":[14],"would":[15],"be":[16,65],"of":[17,51,71,90,113],"much":[18],"interest":[19],"to":[20,38,54,58,67,93],"space":[22],"industry.":[23],"For":[24],"high-performance":[25,105],"analog":[26],"mixed-signal":[28],"circuits,":[29],"radiation-hardening":[30],"design":[31],"flows":[32],"routinely":[33],"include":[34],"electrical":[36,91],"simulation":[37],"identify":[39,47],"most":[41],"sensitive":[42,49,60],"nodes.":[43],"If":[44],"we":[45,62,77],"can":[46],"area":[50],"circuit":[53],"PN-diodes":[56],"connected":[57],"nodes,":[61],"should":[63],"thus":[64],"able":[66],"get":[68],"an":[69],"estimate":[70],"cross-section.":[73,128],"In":[74],"this":[75,80],"work,":[76],"show":[78],"that":[79,117,124],"is":[81],"far":[82],"from":[83],"being":[84],"reality":[85],"by":[86,97],"comparing":[87],"results":[89,115],"simulations":[92],"cross-sections":[95],"obtained":[96],"radiating":[98],"a":[99,104],"rad-hard":[100],"reference":[101],"generator":[102],"for":[103],"ADC":[106],"with":[107],"Heavy":[108],"Ions.":[109],"A":[110],"deep":[111],"analysis":[112],"suggests":[116],"there":[118],"are":[119],"unmodelled":[120],"effects":[121],"at":[122],"stake":[123],"dominate":[125],"experimental":[127]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}