{"id":"https://openalex.org/W4386207926","doi":"https://doi.org/10.1109/iolts59296.2023.10224879","title":"Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation","display_name":"Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation","publication_year":2023,"publication_date":"2023-07-03","ids":{"openalex":"https://openalex.org/W4386207926","doi":"https://doi.org/10.1109/iolts59296.2023.10224879"},"language":"en","primary_location":{"id":"doi:10.1109/iolts59296.2023.10224879","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iolts59296.2023.10224879","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111116120","display_name":"Shotaro Sugitani","orcid":null},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shotaro Sugitani","raw_affiliation_strings":["Kyoto Institute of Technology,Dept. of Electronics,Japan","Dept. of Electronics, Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Dept. of Electronics,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Dept. of Electronics, Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051559347","display_name":"Ryuichi Nakajima","orcid":"https://orcid.org/0000-0003-3121-4098"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryuichi Nakajima","raw_affiliation_strings":["Kyoto Institute of Technology,Dept. of Electronics,Japan","Dept. of Electronics, Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Dept. of Electronics,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Dept. of Electronics, Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101852598","display_name":"Takafumi Ito","orcid":"https://orcid.org/0000-0003-0677-6566"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takafumi Ito","raw_affiliation_strings":["Kyoto Institute of Technology,Dept. of Electronics,Japan","Dept. of Electronics, Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Dept. of Electronics,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Dept. of Electronics, Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050140256","display_name":"Jun Furuta","orcid":"https://orcid.org/0000-0003-0146-3077"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Furuta","raw_affiliation_strings":["Kyoto Institute of Technology,Dept. of Electronics,Japan","Dept. of Electronics, Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Dept. of Electronics,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Dept. of Electronics, Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049656449","display_name":"Kazutoshi Kobayashi","orcid":"https://orcid.org/0000-0002-7139-7274"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazutoshi Kobayashi","raw_affiliation_strings":["Kyoto Institute of Technology,Dept. of Electronics,Japan","Dept. of Electronics, Kyoto Institute of Technology, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology,Dept. of Electronics,Japan","institution_ids":["https://openalex.org/I27429435"]},{"raw_affiliation_string":"Dept. of Electronics, Kyoto Institute of Technology, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004664175","display_name":"Mathieu Louvat","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133187","display_name":"Dolphin Design (France)","ror":"https://ror.org/03bvw7q76","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210133187"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mathieu Louvat","raw_affiliation_strings":["Dolphin Design,France","Dolphin Design, France"],"affiliations":[{"raw_affiliation_string":"Dolphin Design,France","institution_ids":["https://openalex.org/I4210133187"]},{"raw_affiliation_string":"Dolphin Design, France","institution_ids":["https://openalex.org/I4210133187"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023444559","display_name":"Francois Jacquet","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133187","display_name":"Dolphin Design (France)","ror":"https://ror.org/03bvw7q76","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210133187"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francois Jacquet","raw_affiliation_strings":["Dolphin Design,France","Dolphin Design, France"],"affiliations":[{"raw_affiliation_string":"Dolphin Design,France","institution_ids":["https://openalex.org/I4210133187"]},{"raw_affiliation_string":"Dolphin Design, France","institution_ids":["https://openalex.org/I4210133187"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047646635","display_name":"Jean\u2010Christophe Eloy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133187","display_name":"Dolphin Design (France)","ror":"https://ror.org/03bvw7q76","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210133187"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean-Christophe Eloy","raw_affiliation_strings":["Dolphin Design,France","Dolphin Design, France"],"affiliations":[{"raw_affiliation_string":"Dolphin Design,France","institution_ids":["https://openalex.org/I4210133187"]},{"raw_affiliation_string":"Dolphin Design, France","institution_ids":["https://openalex.org/I4210133187"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091727550","display_name":"Olivier Montfort","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133187","display_name":"Dolphin Design (France)","ror":"https://ror.org/03bvw7q76","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210133187"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Olivier Montfort","raw_affiliation_strings":["Dolphin Design,France","Dolphin Design, France"],"affiliations":[{"raw_affiliation_string":"Dolphin Design,France","institution_ids":["https://openalex.org/I4210133187"]},{"raw_affiliation_string":"Dolphin Design, France","institution_ids":["https://openalex.org/I4210133187"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089483786","display_name":"Lionel Jure","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133187","display_name":"Dolphin Design (France)","ror":"https://ror.org/03bvw7q76","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210133187"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lionel Jure","raw_affiliation_strings":["Dolphin Design,France","Dolphin Design, France"],"affiliations":[{"raw_affiliation_string":"Dolphin Design,France","institution_ids":["https://openalex.org/I4210133187"]},{"raw_affiliation_string":"Dolphin Design, France","institution_ids":["https://openalex.org/I4210133187"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109526277","display_name":"Vincent Huard","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133187","display_name":"Dolphin Design (France)","ror":"https://ror.org/03bvw7q76","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210133187"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Vincent Huard","raw_affiliation_strings":["Dolphin Design,France","Dolphin Design, France"],"affiliations":[{"raw_affiliation_string":"Dolphin Design,France","institution_ids":["https://openalex.org/I4210133187"]},{"raw_affiliation_string":"Dolphin Design, France","institution_ids":["https://openalex.org/I4210133187"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5111116120"],"corresponding_institution_ids":["https://openalex.org/I27429435"],"apc_list":null,"apc_paid":null,"fwci":0.134,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.43748278,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.7578150033950806},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7532380819320679},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6365817189216614},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.6202885508537292},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.5764937996864319},{"id":"https://openalex.org/keywords/heavy-ion","display_name":"Heavy ion","score":0.5023162364959717},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.49898600578308105},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49451038241386414},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.4593205451965332},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45217564702033997},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44970178604125977},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4433935284614563},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.41065287590026855},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3275933265686035},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.31834420561790466},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24715301394462585},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.20460715889930725},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.18234148621559143},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17766717076301575},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15837866067886353},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1415562927722931},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.09367808699607849},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.0750856101512909}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.7578150033950806},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7532380819320679},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6365817189216614},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.6202885508537292},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.5764937996864319},{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.5023162364959717},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.49898600578308105},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49451038241386414},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.4593205451965332},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45217564702033997},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44970178604125977},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4433935284614563},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.41065287590026855},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3275933265686035},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.31834420561790466},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24715301394462585},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.20460715889930725},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.18234148621559143},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17766717076301575},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15837866067886353},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1415562927722931},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.09367808699607849},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0750856101512909},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts59296.2023.10224879","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iolts59296.2023.10224879","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W2011024076","https://openalex.org/W2050362621","https://openalex.org/W2050431855","https://openalex.org/W2139334802","https://openalex.org/W2158715350","https://openalex.org/W2167002145","https://openalex.org/W2289919976","https://openalex.org/W2319390036","https://openalex.org/W2575542694","https://openalex.org/W2621240592","https://openalex.org/W2771893093","https://openalex.org/W2802977219","https://openalex.org/W2923710620","https://openalex.org/W2945329967","https://openalex.org/W3143421848","https://openalex.org/W3157589653","https://openalex.org/W4293235215","https://openalex.org/W6683085269","https://openalex.org/W6700100546"],"related_works":["https://openalex.org/W2108400598","https://openalex.org/W2025041939","https://openalex.org/W2262031297","https://openalex.org/W4221123967","https://openalex.org/W2090290079","https://openalex.org/W2047736125","https://openalex.org/W2024069812","https://openalex.org/W2944950085","https://openalex.org/W2733322820","https://openalex.org/W2056378213"],"abstract_inverted_index":{"In":[0],"22":[1],"nm":[2],"FDSOI,":[3],"the":[4,11,31,45,55,60],"flip-well":[5,32,56],"structure":[6,47],"is":[7,48,63],"used":[8],"instead":[9],"of":[10,37,77],"standard-well":[12],"structure.":[13,33,57],"We":[14],"evaluated":[15],"soft-error":[16],"tolerance":[17],"by":[18],"heavy-ion":[19],"irradiation":[20],"tests":[21],"on":[22],"standard":[23],"and":[24,28],"stacked":[25,46],"flip-flops":[26],"(STDFF":[27],"STACKEDFF)":[29],"in":[30,54],"The":[34,75],"error":[35,53,84],"probability":[36],"STACKEDFF":[38,66],"was":[39,80],"significantly":[40],"smaller":[41],"than":[42],"STDFF.":[43],"Therefore,":[44,82],"also":[49],"effective":[50],"against":[51],"soft":[52,70,83],"However,":[58],"as":[59],"supply":[61],"voltage":[62],"lowered,":[64],"even":[65],"becomes":[67],"vulnerable":[68],"to":[69,88],"errors":[71,79,91],"under":[72],"certain":[73],"conditions.":[74],"origin":[76],"these":[78],"pMOSFETs.":[81,93],"countermeasures":[85],"are":[86],"needed":[87],"account":[89],"for":[90],"from":[92]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}