{"id":"https://openalex.org/W4297337546","doi":"https://doi.org/10.1109/iolts56730.2022.9897813","title":"Transient-Fault-Aware Design and Training to Enhance DNNs Reliability with Zero-Overhead","display_name":"Transient-Fault-Aware Design and Training to Enhance DNNs Reliability with Zero-Overhead","publication_year":2022,"publication_date":"2022-09-12","ids":{"openalex":"https://openalex.org/W4297337546","doi":"https://doi.org/10.1109/iolts56730.2022.9897813"},"language":"en","primary_location":{"id":"doi:10.1109/iolts56730.2022.9897813","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897813","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081060854","display_name":"Niccol\u00f2 Cavagnero","orcid":"https://orcid.org/0000-0002-6180-7786"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Niccolo Cavagnero","raw_affiliation_strings":["Polytechnic of Torino,Department of Control and Computer Engineering,Italy","Department of Control and Computer Engineering, Polytechnic of Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic of Torino,Department of Control and Computer Engineering,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering, Polytechnic of Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087537156","display_name":"Fernando dos Santos","orcid":"https://orcid.org/0000-0002-9147-5137"},"institutions":[{"id":"https://openalex.org/I1326498283","display_name":"Institut national de recherche en sciences et technologies du num\u00e9rique","ror":"https://ror.org/02kvxyf05","country_code":"FR","type":"government","lineage":["https://openalex.org/I1326498283"]},{"id":"https://openalex.org/I4210133778","display_name":"Centre Inria de l'Universit\u00e9 de Rennes","ror":"https://ror.org/04040yw90","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1326498283","https://openalex.org/I4210133778"]},{"id":"https://openalex.org/I56067802","display_name":"Universit\u00e9 de Rennes","ror":"https://ror.org/015m7wh34","country_code":"FR","type":"education","lineage":["https://openalex.org/I56067802"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fernando Dos Santos","raw_affiliation_strings":["Univ Rennes,INRIA,France","INRIA, Univ Rennes, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ Rennes,INRIA,France","institution_ids":["https://openalex.org/I56067802","https://openalex.org/I1326498283","https://openalex.org/I4210133778"]},{"raw_affiliation_string":"INRIA, Univ Rennes, France","institution_ids":["https://openalex.org/I1326498283","https://openalex.org/I56067802"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102861496","display_name":"Marco Ciccone","orcid":"https://orcid.org/0000-0002-3306-1323"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Ciccone","raw_affiliation_strings":["Polytechnic of Torino,Department of Control and Computer Engineering,Italy","Department of Control and Computer Engineering, Polytechnic of Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic of Torino,Department of Control and Computer Engineering,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering, Polytechnic of Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050576327","display_name":"Giuseppe Averta","orcid":"https://orcid.org/0000-0003-1212-3465"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giuseppe Averta","raw_affiliation_strings":["Polytechnic of Torino,Department of Control and Computer Engineering,Italy","Department of Control and Computer Engineering, Polytechnic of Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic of Torino,Department of Control and Computer Engineering,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering, Polytechnic of Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004857169","display_name":"Tatiana Tommasi","orcid":"https://orcid.org/0000-0001-8229-7159"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Tatiana Tommasi","raw_affiliation_strings":["Polytechnic of Torino,Department of Control and Computer Engineering,Italy","Department of Control and Computer Engineering, Polytechnic of Torino, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic of Torino,Department of Control and Computer Engineering,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering, Polytechnic of Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054264208","display_name":"Paolo Rech","orcid":"https://orcid.org/0000-0002-0821-1879"},"institutions":[{"id":"https://openalex.org/I193223587","display_name":"University of Trento","ror":"https://ror.org/05trd4x28","country_code":"IT","type":"education","lineage":["https://openalex.org/I193223587"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Rech","raw_affiliation_strings":["University of Trento,Italy","University of Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Trento,Italy","institution_ids":["https://openalex.org/I193223587"]},{"raw_affiliation_string":"University of Trento, Italy","institution_ids":["https://openalex.org/I193223587"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4683,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.93441411,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7731223702430725},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.6272234320640564},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.595702052116394},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5538248419761658},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4560312330722809},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.43087685108184814},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42855706810951233},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.422296404838562},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13856443762779236},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09751477837562561},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.08407938480377197}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7731223702430725},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.6272234320640564},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.595702052116394},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5538248419761658},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4560312330722809},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.43087685108184814},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42855706810951233},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.422296404838562},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13856443762779236},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09751477837562561},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.08407938480377197},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts56730.2022.9897813","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897813","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.4699999988079071,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W114517082","https://openalex.org/W1982029046","https://openalex.org/W2150355110","https://openalex.org/W2194775991","https://openalex.org/W2268994915","https://openalex.org/W2302255633","https://openalex.org/W2767260595","https://openalex.org/W2792643794","https://openalex.org/W2795570316","https://openalex.org/W2899663614","https://openalex.org/W2901848761","https://openalex.org/W2903175372","https://openalex.org/W2908510526","https://openalex.org/W2951691654","https://openalex.org/W2963163009","https://openalex.org/W2963454111","https://openalex.org/W2989569745","https://openalex.org/W3002446690","https://openalex.org/W3007264885","https://openalex.org/W3014982797","https://openalex.org/W3036979375","https://openalex.org/W3092531706","https://openalex.org/W3094502228","https://openalex.org/W3121542217","https://openalex.org/W3131436395","https://openalex.org/W3135074210","https://openalex.org/W3187317723","https://openalex.org/W3187552919","https://openalex.org/W3188924112","https://openalex.org/W3205698808","https://openalex.org/W4206193900","https://openalex.org/W4211189626","https://openalex.org/W4285661751","https://openalex.org/W4293584584","https://openalex.org/W4297779039","https://openalex.org/W6698183232","https://openalex.org/W6739879593","https://openalex.org/W6749029207","https://openalex.org/W6750227808","https://openalex.org/W6755310813","https://openalex.org/W6755977528","https://openalex.org/W6757817989","https://openalex.org/W6775841233","https://openalex.org/W6779868277","https://openalex.org/W6784333009","https://openalex.org/W6811014117"],"related_works":["https://openalex.org/W2770234245","https://openalex.org/W96612179","https://openalex.org/W4229499248","https://openalex.org/W2566006169","https://openalex.org/W1567818861","https://openalex.org/W2987774938","https://openalex.org/W4256492088","https://openalex.org/W632915154","https://openalex.org/W2055733372","https://openalex.org/W3022067003"],"abstract_inverted_index":{"Deep":[0],"Neural":[1],"Networks":[2],"(DNNs)":[3],"enable":[4],"a":[5,48,97],"wide":[6],"series":[7],"of":[8,51,127,143],"technological":[9],"advancements,":[10],"ranging":[11],"from":[12],"clinical":[13],"imaging,":[14],"to":[15,46,70,101,120,124,137],"predictive":[16],"industrial":[17],"maintenance":[18],"and":[19,61,78,113],"autonomous":[20],"driving.":[21],"However,":[22],"recent":[23],"findings":[24],"indicate":[25],"that":[26,85,94,115],"transient":[27,92,121],"hardware":[28],"faults":[29,122],"may":[30],"corrupt":[31],"the":[32,38,57,72,139],"models":[33,53,87],"prediction":[34],"dramatically.":[35],"For":[36],"instance,":[37],"radiation-induced":[39],"misprediction":[40],"probability":[41],"can":[42,95,116],"be":[43],"so":[44],"high":[45],"impede":[47],"safe":[49],"deployment":[50],"DNNs":[52,118],"at":[54,76],"scale,":[55],"urging":[56],"need":[58],"for":[59],"efficient":[60],"effective":[62],"hardening":[63,145],"solutions.":[64],"In":[65],"this":[66],"work,":[67],"we":[68,83,104],"propose":[69],"tackle":[71],"reliability":[73,119],"issue":[74],"both":[75],"training":[77],"model":[79],"design":[80],"time.":[81],"First,":[82],"show":[84],"vanilla":[86],"are":[88],"highly":[89],"affected":[90],"by":[91],"faults,":[93],"induce":[96],"performances":[98,142],"drop":[99],"up":[100,123],"37%.":[102],"Hence,":[103],"provide":[105],"three":[106],"zero-overhead":[107],"solutions,":[108],"based":[109],"on":[110],"DNN":[111],"re-design":[112],"re-train,":[114],"improve":[117],"one":[125],"order":[126],"magnitude.":[128],"We":[129],"complement":[130],"our":[131],"work":[132],"with":[133],"extensive":[134],"ablation":[135],"studies":[136],"quantify":[138],"gain":[140],"in":[141],"each":[144],"component.":[146]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":14},{"year":2023,"cited_by_count":6}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}