{"id":"https://openalex.org/W4297337529","doi":"https://doi.org/10.1109/iolts56730.2022.9897773","title":"Structural Test Generation for AI Accelerators using Neural Twins","display_name":"Structural Test Generation for AI Accelerators using Neural Twins","publication_year":2022,"publication_date":"2022-09-12","ids":{"openalex":"https://openalex.org/W4297337529","doi":"https://doi.org/10.1109/iolts56730.2022.9897773"},"language":"en","primary_location":{"id":"doi:10.1109/iolts56730.2022.9897773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090354528","display_name":"Arjun Chaudhuri","orcid":"https://orcid.org/0000-0001-9353-6397"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arjun Chaudhuri","raw_affiliation_strings":["Duke University,Department of Electrical and Computer Engineering,Durham,NC","Department of Electrical and Computer Engineering, Duke University, Durham, NC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Duke University,Department of Electrical and Computer Engineering,Durham,NC","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052051759","display_name":"Sanmitra Banerjee","orcid":"https://orcid.org/0000-0002-1136-9220"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanmitra Banerjee","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,CA","NVIDIA Corporation, Santa Clara, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,CA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, CA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Duke University,Department of Electrical and Computer Engineering,Durham,NC","Department of Electrical and Computer Engineering, Duke University, Durham, NC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Duke University,Department of Electrical and Computer Engineering,Durham,NC","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11003584,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.9557036757469177},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6799296140670776},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6313683390617371},{"id":"https://openalex.org/keywords/leverage","display_name":"Leverage (statistics)","score":0.5901355743408203},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46091535687446594},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4195362329483032},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.41166025400161743},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3809557259082794},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35865771770477295},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33254683017730713},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.21792727708816528}],"concepts":[{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.9557036757469177},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6799296140670776},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6313683390617371},{"id":"https://openalex.org/C153083717","wikidata":"https://www.wikidata.org/wiki/Q6535263","display_name":"Leverage (statistics)","level":2,"score":0.5901355743408203},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46091535687446594},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4195362329483032},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.41166025400161743},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3809557259082794},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35865771770477295},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33254683017730713},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21792727708816528}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts56730.2022.9897773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W3018195242","https://openalex.org/W3116249996","https://openalex.org/W3126059759","https://openalex.org/W3128775242","https://openalex.org/W3158327736","https://openalex.org/W3193311994","https://openalex.org/W3215311643","https://openalex.org/W4245586739","https://openalex.org/W4247592337","https://openalex.org/W4312757087","https://openalex.org/W4312945398","https://openalex.org/W6776921880","https://openalex.org/W6847740971","https://openalex.org/W6848248870"],"related_works":["https://openalex.org/W2170314243","https://openalex.org/W2119179026","https://openalex.org/W2794947590","https://openalex.org/W2114971758","https://openalex.org/W2109932036","https://openalex.org/W4386694274","https://openalex.org/W3146543203","https://openalex.org/W2795180100","https://openalex.org/W2099346120","https://openalex.org/W4390846322"],"abstract_inverted_index":{"We":[0,45],"present":[1],"a":[2,23,31,37,60,72],"neural":[3,20,24,47],"twin-based":[4],"structural":[5],"test":[6],"pattern":[7,57,69],"generation":[8,79],"method":[9],"for":[10,50,71,99],"stuck-at":[11],"faults":[12,93],"in":[13,62,94],"systolic":[14],"array-based":[15],"AI":[16,95],"inferencing":[17],"accelerators.":[18,96],"The":[19],"twin":[21],"is":[22,80],"representation":[25],"of":[26,30,74,110],"the":[27,42,63,83,108,111],"gate-level":[28],"netlist":[29],"processing":[32],"element":[33],"and":[34,91,102],"it":[35],"provides":[36],"one-to-one":[38],"topological":[39],"correspondence":[40],"with":[41,82],"PE":[43],"netlist.":[44,64],"leverage":[46],"twin-enabled":[48],"backpropagation":[49],"gradient":[51],"computation":[52],"to":[53],"determine":[54],"an":[55],"input":[56],"that":[58,86],"sensitizes":[59],"fault":[61],"Our":[65],"framework":[66,85],"also":[67],"supports":[68],"compaction":[70],"batch":[73],"faults.":[75],"Consequently,":[76],"GPU-accelerated":[77],"test-pattern":[78],"achieved":[81],"proposed":[84,112],"can":[87],"potentially":[88],"detect":[89],"hard-to-detect":[90],"random-pattern-resistant":[92],"Experimental":[97],"results":[98],"4-bit,":[100],"8-bit,":[101],"16-bit":[103],"fixed-point":[104],"accelerator":[105],"arrays":[106],"show":[107],"effectiveness":[109],"method.":[113]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}