{"id":"https://openalex.org/W4297337422","doi":"https://doi.org/10.1109/iolts56730.2022.9897224","title":"All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage","display_name":"All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage","publication_year":2022,"publication_date":"2022-09-12","ids":{"openalex":"https://openalex.org/W4297337422","doi":"https://doi.org/10.1109/iolts56730.2022.9897224"},"language":"en","primary_location":{"id":"doi:10.1109/iolts56730.2022.9897224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057217329","display_name":"Michael Sekyere","orcid":"https://orcid.org/0000-0002-1884-9753"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Sekyere","raw_affiliation_strings":["Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085774561","display_name":"Marampally Saikiran","orcid":"https://orcid.org/0000-0002-1178-4600"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marampally Saikiran","raw_affiliation_strings":["Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4992,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.93387097,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.680853545665741},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6095954179763794},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5612150430679321},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5475299954414368},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5471712946891785},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4993093013763428},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.46906471252441406},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44742634892463684},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4430873394012451},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42996081709861755},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.4282301366329193},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4176008105278015},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.41122376918792725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24393466114997864},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2409798502922058},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2211635410785675},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2085224688053131},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09423381090164185}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.680853545665741},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6095954179763794},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5612150430679321},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5475299954414368},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5471712946891785},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4993093013763428},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.46906471252441406},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44742634892463684},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4430873394012451},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42996081709861755},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.4282301366329193},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4176008105278015},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.41122376918792725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24393466114997864},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2409798502922058},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2211635410785675},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2085224688053131},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09423381090164185},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts56730.2022.9897224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1483479220","https://openalex.org/W1947418710","https://openalex.org/W2039267132","https://openalex.org/W2044500680","https://openalex.org/W2081076119","https://openalex.org/W2106816366","https://openalex.org/W2123818150","https://openalex.org/W2132337863","https://openalex.org/W2149211345","https://openalex.org/W2156213538","https://openalex.org/W2162281676","https://openalex.org/W2171234987","https://openalex.org/W2767758697","https://openalex.org/W2781391663","https://openalex.org/W2798019665","https://openalex.org/W2905573233","https://openalex.org/W3039413211","https://openalex.org/W3124483665","https://openalex.org/W4234562877","https://openalex.org/W4246714199","https://openalex.org/W4282972846","https://openalex.org/W4312893281","https://openalex.org/W6847786696"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2427864131","https://openalex.org/W2018526396"],"abstract_inverted_index":{"Backed":[0],"by":[1],"standards":[2],"like":[3],"ISO26262,":[4],"achieving":[5,22],"near":[6],"100%":[7],"defect":[8,24,61,123],"coverage":[9,25,62],"is":[10,83],"becoming":[11],"a":[12,35,51,120,136],"common":[13],"reliability":[14],"requirement":[15],"in":[16,26,142,161],"the":[17,87,113,126,143,148],"ever-growing":[18],"automotive":[19],"industry.":[20],"However,":[21],"high":[23],"an":[27],"analog":[28,41],"circuit":[29],"has":[30],"been":[31],"proven":[32],"to":[33,106,139],"be":[34,94],"difficult/expensive":[36],"task":[37],"even":[38],"with":[39],"sophisticated":[40],"and":[42,70,82,100,109,147],"digital":[43,79,114],"testing":[44,75,80],"circuitry.":[45,72],"In":[46,130],"this":[47,131],"work,":[48,132],"we":[49,133],"present":[50],"simple":[52,137],"design":[53],"for":[54,63,101,122],"testability":[55],"(DfT)":[56],"technique":[57],"that":[58],"achieves":[59],"98%":[60],"operational":[64],"amplifiers":[65],"including":[66],"Widlar":[67,144],"current":[68,145,150],"reference":[69,146],"biasing":[71],"Our":[73],"robust":[74],"method":[76,92,118,138],"utilizes":[77],"purely":[78],"circuits":[81],"extremely":[84],"time-efficient":[85],"reducing":[86],"test":[88,99],"cost.":[89],"The":[90],"proposed":[91],"can":[93],"used":[95],"both":[96],"at":[97],"production":[98],"on-line":[102],"health":[103],"monitoring":[104],"post-deployment":[105],"detect":[107,140],"zero-time":[108],"latent":[110],"defects.":[111],"Also,":[112],"nature":[115],"of":[116],"our":[117,155],"presents":[119],"way":[121],"localization":[124],"through":[125],"recorded":[127],"bit":[128],"streams.":[129],"also":[134],"introduce":[135],"defects":[141],"bias":[149],"circuit.":[151],"We":[152],"validate":[153],"all":[154],"results":[156],"using":[157],"extensive":[158],"transistor-level":[159],"simulations":[160],"UMC65nm":[162],"technology.":[163]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}