{"id":"https://openalex.org/W4297337483","doi":"https://doi.org/10.1109/iolts56730.2022.9897183","title":"Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability","display_name":"Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability","publication_year":2022,"publication_date":"2022-09-12","ids":{"openalex":"https://openalex.org/W4297337483","doi":"https://doi.org/10.1109/iolts56730.2022.9897183"},"language":"en","primary_location":{"id":"doi:10.1109/iolts56730.2022.9897183","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897183","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.utwente.nl/en/publications/f59dbb39-8a34-4bb2-a6f0-a7e61049b996","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101613535","display_name":"Anu Bala","orcid":"https://orcid.org/0000-0002-5510-0549"},"institutions":[{"id":"https://openalex.org/I124261462","display_name":"Oxford Brookes University","ror":"https://ror.org/04v2twj65","country_code":"GB","type":"education","lineage":["https://openalex.org/I124261462"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Anu Bala","raw_affiliation_strings":["Oxford Brookes University,School of ECM,UK","School of ECM, Oxford Brookes University, UK"],"affiliations":[{"raw_affiliation_string":"Oxford Brookes University,School of ECM,UK","institution_ids":["https://openalex.org/I124261462"]},{"raw_affiliation_string":"School of ECM, Oxford Brookes University, UK","institution_ids":["https://openalex.org/I124261462"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074282193","display_name":"Saurabh Khandelwal","orcid":"https://orcid.org/0000-0001-7992-3390"},"institutions":[{"id":"https://openalex.org/I124261462","display_name":"Oxford Brookes University","ror":"https://ror.org/04v2twj65","country_code":"GB","type":"education","lineage":["https://openalex.org/I124261462"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Saurabh Khandelwal","raw_affiliation_strings":["Oxford Brookes University,School of ECM,UK","School of ECM, Oxford Brookes University, UK"],"affiliations":[{"raw_affiliation_string":"Oxford Brookes University,School of ECM,UK","institution_ids":["https://openalex.org/I124261462"]},{"raw_affiliation_string":"School of ECM, Oxford Brookes University, UK","institution_ids":["https://openalex.org/I124261462"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076588539","display_name":"Abusaleh Jabir","orcid":null},"institutions":[{"id":"https://openalex.org/I124261462","display_name":"Oxford Brookes University","ror":"https://ror.org/04v2twj65","country_code":"GB","type":"education","lineage":["https://openalex.org/I124261462"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Abusaleh Jabir","raw_affiliation_strings":["Oxford Brookes University,School of ECM,UK","School of ECM, Oxford Brookes University, UK"],"affiliations":[{"raw_affiliation_string":"Oxford Brookes University,School of ECM,UK","institution_ids":["https://openalex.org/I124261462"]},{"raw_affiliation_string":"School of ECM, Oxford Brookes University, UK","institution_ids":["https://openalex.org/I124261462"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]},{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT","NL"],"is_corresponding":false,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["University of Rome Tor Vergata and Italy, University of Twente,The Netherlands","University of Rome Tor Vergata and Italy, University of Twente, The Netherlands"],"affiliations":[{"raw_affiliation_string":"University of Rome Tor Vergata and Italy, University of Twente,The Netherlands","institution_ids":["https://openalex.org/I116067653"]},{"raw_affiliation_string":"University of Rome Tor Vergata and Italy, University of Twente, The Netherlands","institution_ids":["https://openalex.org/I116067653","https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101613535"],"corresponding_institution_ids":["https://openalex.org/I124261462"],"apc_list":null,"apc_paid":null,"fwci":0.0924,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.41157542,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.8647210597991943},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.6659052968025208},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.6425124406814575},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6079525351524353},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.602681040763855},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5598948001861572},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5548233389854431},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.49828529357910156},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.4164345860481262},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3589203357696533},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3317704200744629},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3221045732498169},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.27019786834716797},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24535474181175232},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.13316312432289124},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11184823513031006},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08318531513214111},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.0702035129070282}],"concepts":[{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.8647210597991943},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.6659052968025208},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.6425124406814575},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6079525351524353},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.602681040763855},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5598948001861572},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5548233389854431},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.49828529357910156},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.4164345860481262},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3589203357696533},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3317704200744629},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3221045732498169},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27019786834716797},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24535474181175232},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13316312432289124},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11184823513031006},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08318531513214111},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0702035129070282},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/iolts56730.2022.9897183","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts56730.2022.9897183","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:ris.utwente.nl:openaire/f59dbb39-8a34-4bb2-a6f0-a7e61049b996","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/f59dbb39-8a34-4bb2-a6f0-a7e61049b996","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Bala, A, Khandelwal, S, Jabir, A & Ottavi, M 2022, Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability. in A Savino, P Rech, S Di Carlo & D Gizopoulos (eds), 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, 12/09/22. https://doi.org/10.1109/IOLTS56730.2022.9897183","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:ray.yorksj.ac.uk:13535","is_oa":false,"landing_page_url":"https://orcid.org/0009-0000-6242-5248","pdf_url":null,"source":{"id":"https://openalex.org/S4306400356","display_name":"Research at York St John (York St John University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I124246371","host_organization_name":"York St John University","host_organization_lineage":["https://openalex.org/I124246371"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},{"id":"pmh:oai:art.torvergata.it:2108/313232","is_oa":false,"landing_page_url":"https://hdl.handle.net/2108/313232","pdf_url":null,"source":{"id":"https://openalex.org/S4306400993","display_name":"Cineca Institutional Research Information System (Tor Vergata University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I116067653","host_organization_name":"University of Rome Tor Vergata","host_organization_lineage":["https://openalex.org/I116067653"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:ris.utwente.nl:openaire/f59dbb39-8a34-4bb2-a6f0-a7e61049b996","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/f59dbb39-8a34-4bb2-a6f0-a7e61049b996","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Bala, A, Khandelwal, S, Jabir, A & Ottavi, M 2022, Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability. in A Savino, P Rech, S Di Carlo & D Gizopoulos (eds), 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, 12/09/22. https://doi.org/10.1109/IOLTS56730.2022.9897183","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1593355900","https://openalex.org/W1971319818","https://openalex.org/W2015477599","https://openalex.org/W2153009951","https://openalex.org/W2515417790","https://openalex.org/W2612375349","https://openalex.org/W2625840880","https://openalex.org/W2768104155","https://openalex.org/W2769561581","https://openalex.org/W2909800597","https://openalex.org/W3000312518","https://openalex.org/W4300336589"],"related_works":["https://openalex.org/W3164474614","https://openalex.org/W2171130799","https://openalex.org/W2005875039","https://openalex.org/W2015477599","https://openalex.org/W2144085790","https://openalex.org/W2548135880","https://openalex.org/W3177379469","https://openalex.org/W2516929886","https://openalex.org/W4253441086","https://openalex.org/W2942778963"],"abstract_inverted_index":{"This":[0,37],"paper":[1],"evaluates":[2],"the":[3,15,30,33,55,60,76,79,87],"yield":[4,31,77,88],"of":[5,10,17,35,43,62,78],"a":[6,40,95],"memristor-based":[7],"crossbar":[8,81],"array":[9],"artificial":[11],"neural":[12],"networks":[13],"in":[14,32],"presence":[16,34],"stuck-at-faults":[18],"(SAFs).":[19],"A":[20,67],"technique":[21],"based":[22],"on":[23],"Markov":[24],"chains":[25],"is":[26,48,54,71],"used":[27,49],"to":[28],"estimate":[29],"stuck-at-faults.":[36],"method":[38,46],"provides":[39],"high":[41],"degree":[42],"accuracy.":[44],"Another":[45],"that":[47,86],"for":[50],"analysis":[51],"and":[52,94],"comparison":[53],"Poisson":[56],"distribution,":[57],"which":[58],"uses":[59],"sum":[61],"all":[63],"repairable":[64,97],"fault":[65,68],"patterns.":[66],"repair":[69],"mechanism":[70],"also":[72],"considered":[73],"when":[74],"evaluating":[75],"memristor":[80],"array.":[82],"The":[83],"results":[84],"demonstrate":[85],"could":[89],"be":[90],"improved":[91],"with":[92],"redundancies":[93],"higher":[96],"stuck-at-fault":[98],"ratio.":[99]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-02T15:55:50.835912","created_date":"2025-10-10T00:00:00"}