{"id":"https://openalex.org/W3048170192","doi":"https://doi.org/10.1109/iolts50870.2020.9159747","title":"Automatic Fault Simulators for Diagnosis of Analog Systems","display_name":"Automatic Fault Simulators for Diagnosis of Analog Systems","publication_year":2020,"publication_date":"2020-07-01","ids":{"openalex":"https://openalex.org/W3048170192","doi":"https://doi.org/10.1109/iolts50870.2020.9159747","mag":"3048170192"},"language":"en","primary_location":{"id":"doi:10.1109/iolts50870.2020.9159747","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts50870.2020.9159747","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027845735","display_name":"Tommaso Melis","orcid":"https://orcid.org/0000-0002-4380-6958"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Tommaso Melis","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP, Institute of Engineering Univ. Grenoble Alpes, TIMA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP, Institute of Engineering Univ. Grenoble Alpes, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041963235","display_name":"Emmanuel Simeu","orcid":"https://orcid.org/0000-0001-7649-3225"},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Emmanuel Simeu","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP, Institute of Engineering Univ. Grenoble Alpes, TIMA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP, Institute of Engineering Univ. Grenoble Alpes, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074769604","display_name":"Etienne Auvray","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Etienne Auvray","raw_affiliation_strings":["STMicroelectronics, Grenoble Cedex, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5027845735"],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"],"apc_list":null,"apc_paid":null,"fwci":1.50638392,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.80565217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"356","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.771425187587738},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7045235633850098},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.696955680847168},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.6099619269371033},{"id":"https://openalex.org/keywords/signal-flow-graph","display_name":"Signal-flow graph","score":0.5868563055992126},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.538724422454834},{"id":"https://openalex.org/keywords/analog-signal","display_name":"Analog signal","score":0.5016696453094482},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.50144362449646},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4479779005050659},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.43776386976242065},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.42994141578674316},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4277758002281189},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3981797397136688},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2739467918872833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23736163973808289},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.21742773056030273},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14078345894813538},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13210365176200867},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.08517172932624817}],"concepts":[{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.771425187587738},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7045235633850098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.696955680847168},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.6099619269371033},{"id":"https://openalex.org/C166501922","wikidata":"https://www.wikidata.org/wiki/Q1786523","display_name":"Signal-flow graph","level":2,"score":0.5868563055992126},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.538724422454834},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.5016696453094482},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.50144362449646},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4479779005050659},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.43776386976242065},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.42994141578674316},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4277758002281189},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3981797397136688},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2739467918872833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23736163973808289},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.21742773056030273},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14078345894813538},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13210365176200867},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.08517172932624817},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts50870.2020.9159747","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts50870.2020.9159747","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2021756047","https://openalex.org/W2055385578","https://openalex.org/W2068778760","https://openalex.org/W2083930772","https://openalex.org/W2138476745","https://openalex.org/W2532291985","https://openalex.org/W2553580748","https://openalex.org/W2571260886","https://openalex.org/W2743749706","https://openalex.org/W2898429578","https://openalex.org/W2902416951","https://openalex.org/W2913887865","https://openalex.org/W2967540737","https://openalex.org/W2993683877","https://openalex.org/W4299432315","https://openalex.org/W6724904948","https://openalex.org/W6756246936","https://openalex.org/W6771489115"],"related_works":["https://openalex.org/W1630910375","https://openalex.org/W2185815555","https://openalex.org/W2053330176","https://openalex.org/W1981652693","https://openalex.org/W2076925294","https://openalex.org/W1162056860","https://openalex.org/W1862020018","https://openalex.org/W2109999133","https://openalex.org/W1578030032","https://openalex.org/W2498536136"],"abstract_inverted_index":{"The":[0,22,75],"failure":[1,51],"analysis":[2,52,92],"in":[3,15,82],"analog":[4,26,59,71,98],"and":[5,73,99],"mixed":[6],"signal":[7],"products":[8],"is":[9],"mainly":[10],"based":[11],"on":[12],"measurements":[13],"performed":[14],"the":[16,43,46,49,83,90,95],"laboratory":[17],"without":[18],"any":[19],"simulation":[20,47],"support.":[21],"fault":[23,60,84],"simulators":[24],"for":[25,37,58,68,97],"circuits":[27],"are":[28,34],"starting":[29],"to":[30],"be":[31],"available":[32],"but":[33],"not":[35],"designed":[36],"these":[38],"needs.":[39],"This":[40],"work":[41],"describes":[42],"integration":[44],"of":[45,70],"into":[48],"normal":[50],"flow":[53,67],"using":[54],"test":[55],"software":[56],"developed":[57],"simulation.":[61],"We":[62],"propose":[63],"an":[64],"innovative":[65],"iterative":[66],"diagnosis":[69,96],"IPs":[72],"products.":[74],"results":[76],"show":[77],"how":[78],"inserting":[79],"such":[80],"tools":[81],"isolation":[85],"step,":[86],"we":[87],"speed":[88],"up":[89],"whole":[91],"process,":[93],"allowing":[94],"mixed-signal":[100],"circuits.":[101]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}