{"id":"https://openalex.org/W2978012260","doi":"https://doi.org/10.1109/iolts.2019.8854436","title":"Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process","display_name":"Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2978012260","doi":"https://doi.org/10.1109/iolts.2019.8854436","mag":"2978012260"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2019.8854436","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854436","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007689904","display_name":"Mitsunori Ebara","orcid":"https://orcid.org/0000-0003-1505-0935"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Mitsunori Ebara","raw_affiliation_strings":["Kyoto Institute of Technology, Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology, Kyoto, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100708217","display_name":"Kodai Yamada","orcid":"https://orcid.org/0000-0002-9763-715X"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kodai Yamada","raw_affiliation_strings":["Kyoto Institute of Technology, Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology, Kyoto, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050140256","display_name":"Jun Furuta","orcid":"https://orcid.org/0000-0003-0146-3077"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jun Furuta","raw_affiliation_strings":["Kyoto Institute of Technology, Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology, Kyoto, Japan","institution_ids":["https://openalex.org/I27429435"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049656449","display_name":"Kazutoshi Kobayashi","orcid":"https://orcid.org/0000-0002-7139-7274"},"institutions":[{"id":"https://openalex.org/I27429435","display_name":"Kyoto Institute of Technology","ror":"https://ror.org/00965ax52","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazutoshi Kobayashi","raw_affiliation_strings":["Kyoto Institute of Technology, Kyoto, Japan"],"affiliations":[{"raw_affiliation_string":"Kyoto Institute of Technology, Kyoto, Japan","institution_ids":["https://openalex.org/I27429435"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5007689904"],"corresponding_institution_ids":["https://openalex.org/I27429435"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.55537467,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.7552123069763184},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6387996077537537},{"id":"https://openalex.org/keywords/heavy-ion","display_name":"Heavy ion","score":0.6077656745910645},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.5681226253509521},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5103930830955505},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5066636204719543},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.48737937211990356},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.46045875549316406},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.4540990889072418},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.44902336597442627},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4104744791984558},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3894617557525635},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2995082139968872},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.22259056568145752},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.18000459671020508},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.10438871383666992},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.08647581934928894},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.08223387598991394},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07918098568916321}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.7552123069763184},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6387996077537537},{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.6077656745910645},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.5681226253509521},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5103930830955505},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5066636204719543},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.48737937211990356},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.46045875549316406},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.4540990889072418},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.44902336597442627},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4104744791984558},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3894617557525635},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2995082139968872},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.22259056568145752},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.18000459671020508},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.10438871383666992},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.08647581934928894},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.08223387598991394},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07918098568916321},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2019.8854436","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854436","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5799999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W1968121555","https://openalex.org/W2032255490","https://openalex.org/W2050362621","https://openalex.org/W2050431855","https://openalex.org/W2062100817","https://openalex.org/W2085733052","https://openalex.org/W2100868372","https://openalex.org/W2125385579","https://openalex.org/W2126901998","https://openalex.org/W2139691656","https://openalex.org/W2167002145","https://openalex.org/W2169622577","https://openalex.org/W2768672384","https://openalex.org/W2926146547","https://openalex.org/W3143421848"],"related_works":["https://openalex.org/W2108400598","https://openalex.org/W2025041939","https://openalex.org/W2262031297","https://openalex.org/W4221123967","https://openalex.org/W2090290079","https://openalex.org/W2047736125","https://openalex.org/W2733322820","https://openalex.org/W3005292987","https://openalex.org/W3140581668","https://openalex.org/W2482318635"],"abstract_inverted_index":{"We":[0,47,114],"examined":[1],"radiation":[2],"hardness":[3],"of":[4,62,65,68,85,90,112,120],"a":[5,11,44,106],"stacked":[6,12],"transmission-gate":[7],"flip":[8,14,24,78],"flop":[9],"and":[10,20,53,81],"tristate-inverter":[13],"flop,":[15],"which":[16],"are":[17,29,41,100],"called":[18],"STACKEDTGFF":[19,60],"STACKEDTIFF":[21,56],"respectively.":[22],"Stacked":[23],"flops":[25],"fabricated":[26],"in":[27,35],"FDSOI":[28],"stronger":[30,101],"against":[31,102],"soft":[32,103],"errors":[33,104],"than":[34,59,92,105],"bulk":[36],"because":[37,61],"all":[38],"transistor":[39],"channels":[40],"isolated":[42],"by":[43,51,79,109,123],"BOX":[45],"layer.":[46],"evaluated":[48],"soft-error":[49],"tolerance":[50],"neutron":[52],"heavy-ion":[54],"irradiation.":[55],"is":[57],"faster":[58],"the":[63,66,71,82],"difference":[64],"number":[67],"gates":[69],"along":[70],"data":[72],"path.":[73],"Those":[74],"FFs":[75,122],"did":[76],"not":[77],"neutrons":[80],"normal":[83],"incidence":[84],"heavy":[86,124],"ions":[87],"with":[88],"LET":[89],"less":[91],"40":[93],"MeV-cm":[94],"<sup":[95],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[96],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[97],"mg.":[98],"They":[99],"standard":[107],"TGFF":[108],"two":[110],"order":[111],"magnitude.":[113],"also":[115],"investigated":[116],"incident":[117],"angle":[118],"dependence":[119],"those":[121],"ions.":[125]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}