{"id":"https://openalex.org/W2979149769","doi":"https://doi.org/10.1109/iolts.2019.8854409","title":"Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure","display_name":"Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2979149769","doi":"https://doi.org/10.1109/iolts.2019.8854409","mag":"2979149769"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2019.8854409","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854409","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003656470","display_name":"Shu-Han Hsu","orcid":"https://orcid.org/0009-0005-1258-3279"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shu-han Hsu","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039196966","display_name":"Ying-Yuan Huang","orcid":"https://orcid.org/0000-0002-7561-5996"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ying-Yuan Huang","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025591564","display_name":"Kexin Yang","orcid":"https://orcid.org/0000-0002-3630-1003"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kexin Yang","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032107826","display_name":"Linda Milor","orcid":"https://orcid.org/0000-0002-8244-4793"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Linda Milor","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5003656470"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.12522828,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"257","last_page":"262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7043339014053345},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.6453087329864502},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5963996052742004},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5872169733047485},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5503668785095215},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.505579948425293},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43576014041900635},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4136677384376526},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27203303575515747},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.16927361488342285},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13589614629745483}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7043339014053345},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.6453087329864502},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5963996052742004},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5872169733047485},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5503668785095215},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.505579948425293},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43576014041900635},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4136677384376526},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27203303575515747},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.16927361488342285},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13589614629745483},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2019.8854409","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854409","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1996238674","https://openalex.org/W2012032225","https://openalex.org/W2026891388","https://openalex.org/W2032069904","https://openalex.org/W2095882546","https://openalex.org/W2113628038","https://openalex.org/W2150056343","https://openalex.org/W2165108872","https://openalex.org/W2460271409","https://openalex.org/W2737602496","https://openalex.org/W2806512482","https://openalex.org/W2808551481","https://openalex.org/W2885858489","https://openalex.org/W2889757280","https://openalex.org/W2912515442","https://openalex.org/W2946246002","https://openalex.org/W6683869836"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Circuits":[0],"may":[1],"fail":[2],"in":[3,19,44,119],"the":[4,20,26,29,60,73,97,100,115,132],"field":[5],"due":[6],"to":[7,25,58,95,113],"a":[8,83],"wide":[9],"variety":[10],"of":[11,31,99,104,134],"failure":[12,32,48,52,62,69,78,101],"modes.":[13],"If":[14],"there":[15],"are":[16,23,42],"frequent":[17],"failures":[18],"field,":[21],"circuits":[22],"returned":[24],"manufacturer,":[27],"and":[28,46,66,85,92,106],"causes":[30,63],"must":[33],"be":[34],"identified.":[35],"The":[36],"challenge":[37],"is":[38,55],"that":[39],"wearout":[40,74,117],"mechanisms":[41,75,118],"confounded":[43],"circuit":[45],"system-level":[47],"data.":[49],"Using":[50],"such":[51],"data,":[53],"it":[54],"often":[56],"hard":[57],"separate":[59],"underlying":[61],"without":[64],"time-consuming":[65],"expensive":[67],"physical":[68],"analysis.":[70],"To":[71],"distinguish":[72],"for":[76],"each":[77],"sample,":[79],"we":[80],"have":[81],"developed":[82],"quick":[84],"low-cost":[86],"methodology":[87,112],"using":[88,127],"maximum":[89],"likelihood":[90],"estimation":[91],"probability":[93],"analysis":[94],"determine":[96],"origin":[98],"distributions,":[102],"region":[103],"error,":[105],"sorting":[107],"accuracy.":[108],"We":[109,129],"apply":[110],"our":[111],"analyze":[114],"competing":[116],"14nm":[120],"FinFET":[121],"ring":[122],"oscillators,":[123],"as":[124],"an":[125],"example,":[126],"simulation.":[128],"also":[130],"consider":[131],"problem":[133],"Trojan":[135],"detection.":[136]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}