{"id":"https://openalex.org/W2978847806","doi":"https://doi.org/10.1109/iolts.2019.8854379","title":"Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells","display_name":"Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2978847806","doi":"https://doi.org/10.1109/iolts.2019.8854379","mag":"2978847806"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2019.8854379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039322577","display_name":"Marko Andjelkovi\u0107","orcid":"https://orcid.org/0000-0001-6419-2062"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Marko Andjelkovic","raw_affiliation_strings":["IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany"],"affiliations":[{"raw_affiliation_string":"IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100672528","display_name":"Yuan\u2010Qing Li","orcid":"https://orcid.org/0000-0002-0478-0177"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Yuanqing Li","raw_affiliation_strings":["IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany"],"affiliations":[{"raw_affiliation_string":"IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025739407","display_name":"Zoran Stamenkovi\u0107","orcid":"https://orcid.org/0000-0002-6078-413X"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Zoran Stamenkovic","raw_affiliation_strings":["IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany"],"affiliations":[{"raw_affiliation_string":"IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milos Krstic","raw_affiliation_strings":["IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany"],"affiliations":[{"raw_affiliation_string":"IHP \u2013 Institut f\u00fcr innovative Mikroelektronik, Frankfurt Oder, Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111617436","display_name":"Rolf Kraemer","orcid":null},"institutions":[{"id":"https://openalex.org/I51783024","display_name":"Brandenburg University of Technology Cottbus-Senftenberg","ror":"https://ror.org/02wxx3e24","country_code":"DE","type":"education","lineage":["https://openalex.org/I51783024"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rolf Kraemer","raw_affiliation_strings":["Brandenburg University of Technology, Cottbus, Germany"],"affiliations":[{"raw_affiliation_string":"Brandenburg University of Technology, Cottbus, Germany","institution_ids":["https://openalex.org/I51783024"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5039322577"],"corresponding_institution_ids":["https://openalex.org/I92894754"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.55589472,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"212","last_page":"215"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.7024240493774414},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6535632014274597},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6470524072647095},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5933352708816528},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5746987462043762},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5655975341796875},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.49335184693336487},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4498719573020935},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.43935900926589966},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.43169742822647095},{"id":"https://openalex.org/keywords/logic-model","display_name":"Logic model","score":0.4216729998588562},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4130743145942688},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35970672965049744},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3383905291557312},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21622610092163086},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15896859765052795},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11382851004600525}],"concepts":[{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.7024240493774414},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6535632014274597},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6470524072647095},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5933352708816528},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5746987462043762},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5655975341796875},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.49335184693336487},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4498719573020935},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.43935900926589966},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.43169742822647095},{"id":"https://openalex.org/C2775940519","wikidata":"https://www.wikidata.org/wiki/Q17067742","display_name":"Logic model","level":2,"score":0.4216729998588562},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4130743145942688},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35970672965049744},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3383905291557312},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21622610092163086},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15896859765052795},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11382851004600525},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2019.8854379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854379","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1888427026","https://openalex.org/W2030501553","https://openalex.org/W2070746369","https://openalex.org/W2096927458","https://openalex.org/W2108126303","https://openalex.org/W2115516668","https://openalex.org/W2127997025","https://openalex.org/W2140654092","https://openalex.org/W2143781639","https://openalex.org/W2149041233","https://openalex.org/W2170649610","https://openalex.org/W2285470358","https://openalex.org/W2346282901","https://openalex.org/W2349812101","https://openalex.org/W2406444183","https://openalex.org/W2515816447","https://openalex.org/W2526439187","https://openalex.org/W2535773498","https://openalex.org/W2774143721","https://openalex.org/W2899605901","https://openalex.org/W6682111347","https://openalex.org/W6726603004"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W2313216219","https://openalex.org/W1561306903","https://openalex.org/W2912670917"],"abstract_inverted_index":{"Single":[0],"event":[1],"transients":[2],"(SETs)":[3],"stand":[4],"out":[5],"as":[6,111],"one":[7],"of":[8,12,31,42,60,117,143,154,169],"the":[9,22,29,35,74,78,82,102,114,125,132,139,145,152,165],"major":[10],"causes":[11],"soft":[13],"errors":[14],"in":[15,28,46,120,138],"nanoscale":[16],"CMOS":[17],"integrated":[18,33],"circuits.":[19],"To":[20],"reduce":[21],"need":[23],"for":[24,38,58,81,113,135],"exhaustive":[25],"circuit":[26],"simulations":[27],"design":[30],"radiation-hard":[32],"circuits,":[34],"cost-effective":[36],"approaches":[37],"characterization":[39,59,155],"and":[40,91,101],"modeling":[41],"SET":[43,61,67,85,92,98,118,167],"generation":[44,62,86,99],"effects":[45,119],"standard":[47,127],"logic":[48,128],"cells":[49],"are":[50,95,106],"required.":[51],"In":[52],"this":[53],"work,":[54],"a":[55,170],"SPICE-based":[56],"methodology":[57],"effects,":[63],"employing":[64],"two":[65,83],"different":[66],"current":[68],"models,":[69],"is":[70],"presented.":[71],"Based":[72],"on":[73],"acquired":[75],"simulation":[76],"results,":[77],"empirical":[79],"models":[80,100],"main":[84],"metrics":[87],"(SET":[88],"critical":[89],"charge":[90],"pulse":[93],"width)":[94],"derived.":[96],"The":[97],"respective":[103],"model":[104,133],"parameters":[105,134],"intended":[107],"to":[108,162],"be":[109,158],"used":[110],"inputs":[112],"higher-level":[115],"analysis":[116,168],"digital":[121],"circuits":[122],"designed":[123],"with":[124],"characterized":[126],"cells.":[129],"By":[130],"storing":[131,144],"each":[136],"gate":[137],"look-up":[140],"table,":[141],"instead":[142],"raw":[146],"data":[147,156],"obtained":[148],"from":[149],"SPICE":[150],"simulations,":[151],"amount":[153],"can":[157],"significantly":[159],"reduced,":[160],"allowing":[161],"speed":[163],"up":[164],"subsequent":[166],"complex":[171],"circuit.":[172]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}