{"id":"https://openalex.org/W2978752288","doi":"https://doi.org/10.1109/iolts.2019.8854371","title":"Global and Local Process Variation Simulations in Design for Reliability approach","display_name":"Global and Local Process Variation Simulations in Design for Reliability approach","publication_year":2019,"publication_date":"2019-07-01","ids":{"openalex":"https://openalex.org/W2978752288","doi":"https://doi.org/10.1109/iolts.2019.8854371","mag":"2978752288"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2019.8854371","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854371","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047516685","display_name":"Audrey Michard","orcid":"https://orcid.org/0000-0001-5249-8830"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Audrey MICHARD","raw_affiliation_strings":["STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063370961","display_name":"F. Cacho","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Florian CACHO","raw_affiliation_strings":["STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015545158","display_name":"Damien Celeste","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Damien CELESTE","raw_affiliation_strings":["STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087103079","display_name":"X. Federspiel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Xavier FEDERSPIEL","raw_affiliation_strings":["STMicroelectronics, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5047516685"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55584661,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"72","last_page":"75"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6843194365501404},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6838787794113159},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5901551246643066},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5592303276062012},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5471285581588745},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5323389768600464},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5304276943206787},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5230187773704529},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.45611923933029175},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.42583489418029785},{"id":"https://openalex.org/keywords/design-of-experiments","display_name":"Design of experiments","score":0.4258113503456116},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4143046736717224},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37105539441108704},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3167175352573395},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.16667234897613525},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.11604195833206177}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6843194365501404},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6838787794113159},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5901551246643066},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5592303276062012},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5471285581588745},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5323389768600464},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5304276943206787},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5230187773704529},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.45611923933029175},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42583489418029785},{"id":"https://openalex.org/C34559072","wikidata":"https://www.wikidata.org/wiki/Q2334061","display_name":"Design of experiments","level":2,"score":0.4258113503456116},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4143046736717224},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37105539441108704},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3167175352573395},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.16667234897613525},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.11604195833206177},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2019.8854371","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2019.8854371","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1979986803","https://openalex.org/W2344193394"],"related_works":["https://openalex.org/W4253195573","https://openalex.org/W2020934033","https://openalex.org/W63276784","https://openalex.org/W2059530328","https://openalex.org/W3011978806","https://openalex.org/W2156446048","https://openalex.org/W2163890360","https://openalex.org/W2148225649","https://openalex.org/W2743305891","https://openalex.org/W1979986803"],"abstract_inverted_index":{"Design":[0],"for":[1,8,72,163],"reliability":[2,15,57],"(DfR)":[3],"is":[4,101,113],"of":[5,25,110,127],"prime":[6],"interest":[7],"integrated":[9],"circuits":[10],"designer":[11],"to":[12,43,51,87,93,133,170],"qualify":[13],"IPs":[14],"and":[16,31,48,142],"enable":[17,49],"risk":[18],"assessment.":[19],"Currently":[20],"developed":[21,132],"models":[22],"are":[23,35,82,151,168],"composed":[24],"all":[26],"wear-out":[27],"mechanisms":[28],"(HCI,":[29],"BTI,":[30],"TDDB)":[32],"but":[33],"they":[34],"based":[36,103],"on":[37,104],"typical":[38],"degradation":[39],"shifts.":[40],"In":[41],"order":[42],"improve":[44],"the":[45,56,89,94,108,136,143,172],"modeling":[46],"accuracy":[47],"designers":[50],"simulate":[52],"a":[53,69,164],"worst":[54],"case,":[55],"design":[58],"flow":[59],"should":[60],"take":[61],"into":[62],"account":[63],"process":[64,73],"variations.":[65],"This":[66],"paper":[67],"presents":[68],"new":[70,125],"framework":[71],"variations":[74,138],"simulation":[75,161],"combined":[76],"with":[77],"aging":[78,116,147],"modeling.":[79],"Firstly,":[80],"margins":[81,99],"introduced":[83],"in":[84,119],"DfR":[85,174],"equations":[86],"describe":[88,134],"additional":[90],"degradations":[91],"due":[92],"lot-to-lot":[95],"fabrication":[96],"dispersion.":[97],"The":[98],"optimization":[100],"performed":[102],"experimental":[105],"measurements.":[106],"Secondly,":[107],"impact":[109],"wafer-level":[111],"variation":[112],"investigated":[114],"through":[115],"simulations":[117],"nested":[118],"Monte":[120],"Carlo":[121],"(MC)":[122],"flow.":[123],"A":[124],"feature":[126],"MC":[128],"analysis":[129],"has":[130],"been":[131],"separately":[135],"statistical":[137],"at":[139],"initial":[140],"time":[141],"ones":[144],"induced":[145],"by":[146],"mechanisms.":[148],"Both":[149],"implementations":[150],"demonstrated":[152],"using":[153],"CMOS":[154],"65nm":[155],"technology":[156],"as":[157],"test":[158],"case.":[159],"Finally,":[160],"results":[162],"basic":[165],"digital":[166],"circuit":[167],"discussed":[169],"illustrate":[171],"complete":[173],"approach.":[175]},"counts_by_year":[{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}