{"id":"https://openalex.org/W2897915160","doi":"https://doi.org/10.1109/iolts.2018.8474275","title":"Soft error optimization of combinational circuit based on gate sizing and multi-objective particle swarm optimization algorithm","display_name":"Soft error optimization of combinational circuit based on gate sizing and multi-objective particle swarm optimization algorithm","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2897915160","doi":"https://doi.org/10.1109/iolts.2018.8474275","mag":"2897915160"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2018.8474275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100635239","display_name":"Xuebing Cao","orcid":"https://orcid.org/0000-0002-3034-2912"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xuebing Cao","raw_affiliation_strings":["Microelectronics Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100651217","display_name":"Liyi Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyi Xiao","raw_affiliation_strings":["Microelectronics Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050920606","display_name":"Linzhe Li","orcid":"https://orcid.org/0000-0002-4941-3127"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Linzhe Li","raw_affiliation_strings":["Microelectronics Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066052627","display_name":"Jie Li","orcid":"https://orcid.org/0000-0001-9359-3586"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Li","raw_affiliation_strings":["Microelectronics Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101981358","display_name":"Jiaqiang Li","orcid":"https://orcid.org/0000-0001-5163-1484"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaqiang Li","raw_affiliation_strings":["Microelectronics Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100328618","display_name":"Jinxiang Wang","orcid":"https://orcid.org/0000-0002-5423-5409"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinxiang Wang","raw_affiliation_strings":["Microelectronics Center, Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Microelectronics Center, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100635239"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.10605484,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"55","issue":null,"first_page":"165","last_page":"170"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.8793171048164368},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8221719861030579},{"id":"https://openalex.org/keywords/particle-swarm-optimization","display_name":"Particle swarm optimization","score":0.7303304076194763},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.597179651260376},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5358060598373413},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.530315101146698},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5007114410400391},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4919426143169403},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4688008427619934},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4606035351753235},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.4419841766357422},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.42130231857299805},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4132542312145233},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3937070965766907},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3883819580078125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25953930616378784},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18910616636276245},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09954774379730225}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.8793171048164368},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8221719861030579},{"id":"https://openalex.org/C85617194","wikidata":"https://www.wikidata.org/wiki/Q2072794","display_name":"Particle swarm optimization","level":2,"score":0.7303304076194763},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.597179651260376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5358060598373413},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.530315101146698},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5007114410400391},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4919426143169403},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4688008427619934},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4606035351753235},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.4419841766357422},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.42130231857299805},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4132542312145233},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3937070965766907},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3883819580078125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25953930616378784},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18910616636276245},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09954774379730225},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2018.8474275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W114927261","https://openalex.org/W1532938278","https://openalex.org/W1566296806","https://openalex.org/W1592886836","https://openalex.org/W2023659251","https://openalex.org/W2061643944","https://openalex.org/W2070655964","https://openalex.org/W2102849483","https://openalex.org/W2103341698","https://openalex.org/W2138519644","https://openalex.org/W2138815251","https://openalex.org/W2143804482","https://openalex.org/W2144160202","https://openalex.org/W2146802428","https://openalex.org/W2155080643","https://openalex.org/W2168546702","https://openalex.org/W2290529364","https://openalex.org/W2294420364","https://openalex.org/W2317803618","https://openalex.org/W2335199650","https://openalex.org/W6675647532","https://openalex.org/W6684569654"],"related_works":["https://openalex.org/W2622269177","https://openalex.org/W1523508240","https://openalex.org/W2531550288","https://openalex.org/W2102538861","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W2122334461","https://openalex.org/W3040935927","https://openalex.org/W2165400042"],"abstract_inverted_index":{"Soft":[0],"errors":[1],"caused":[2],"by":[3,140],"particle":[4,62,169],"strike":[5,20],"in":[6,13,34,127,156],"combinational":[7,48,59,125],"circuits":[8,60,126,205],"are":[9,138,193],"a":[10,53,70,76,91,218],"major":[11],"concern":[12],"the":[14,27,40,105,111,121,128,141,150,157,161,191,196,208,215],"design":[15,46],"of":[16,47,69,72,124,130,164,190],"reliable":[17],"circuits.":[18,49],"Particle":[19],"induced":[21],"single":[22,29],"event":[23,30,113,152],"transient":[24],"(SET),":[25],"especially":[26],"evolutional":[28],"multiple":[31],"transients":[32],"(SEMTs)":[33],"nanoscale":[35],"CMOS":[36],"technologies,":[37],"has":[38],"been":[39],"non-negligible":[41],"reliability":[42],"issue":[43],"for":[44],"hardening":[45],"This":[50,64],"paper":[51],"presents":[52],"low":[54],"overhead":[55],"method":[56,65,93,211],"to":[57,173],"protect":[58],"against":[61],"strike.":[63],"is":[66],"made":[67],"up":[68],"combination":[71],"two":[73],"sub-method:":[74],"(1)":[75],"soft":[77],"error":[78],"sensitivity":[79,122,158],"estimation":[80,123,162],"method,":[81],"called":[82,98],"Layout-Based":[83],"Multiple":[84],"Event":[85],"Probability":[86],"Propagation":[87],"(LBMEPP)":[88],"and":[89,132,144,176,186],"(2)":[90],"protection":[92],"based":[94],"on":[95,202],"gate":[96],"sizing,":[97],"Intelligent":[99],"optimization-Based":[100],"Gate":[101],"Sizing":[102],"(IOBGS).":[103],"Unlike":[104],"previous":[106],"techniques":[107],"that":[108,207],"either":[109],"overlook":[110],"SEMTs":[112,135,151],"or":[114],"exploit":[115],"fault":[116],"injection.":[117],"LBMEPP":[118],"can":[119,153,212],"provide":[120],"presence":[129],"SET":[131],"SEMTs.":[133],"The":[134,199],"adjacent":[136],"cells":[137],"identified":[139],"cell's":[142],"layout":[143],"Geant4":[145],"Monte":[146],"Carlo":[147],"simulation.":[148],"Therefore,":[149],"be":[154],"considered":[155],"estimation.":[159],"Using":[160],"result":[163],"LBMEPP,":[165],"IOBGS":[166],"adopts":[167],"multi-objective":[168],"swarm":[170],"optimization":[171,197,210],"algorithm":[172],"dynamically":[174],"allocate":[175],"adjust":[177],"each":[178],"logical":[179],"cells.":[180],"In":[181],"IOBGS,":[182],"SER,":[183],"circuit":[184,192],"area":[185],"longest":[187],"path":[188],"delay":[189],"selected":[194],"as":[195],"goals.":[198],"experiments":[200],"conducted":[201],"several":[203],"typical":[204],"show":[206],"proposed":[209],"evidently":[213],"decrease":[214],"SER":[216],"with":[217],"limited":[219],"overhead.":[220]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}