{"id":"https://openalex.org/W2896616306","doi":"https://doi.org/10.1109/iolts.2018.8474272","title":"Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis","display_name":"Reliability And Performance Challenges Of Ultra-Low Voltage Caches: A Trade-Off Analysis","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2896616306","doi":"https://doi.org/10.1109/iolts.2018.8474272","mag":"2896616306"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2018.8474272","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020422864","display_name":"Anteneh Gebregiorgis","orcid":"https://orcid.org/0000-0002-8408-5691"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Anteneh Gebregiorgis","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5020422864"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.1288,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48982433,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"265","last_page":"268"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.7379434704780579},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7370954751968384},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6266725063323975},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6132358908653259},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.53904789686203},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.5359339118003845},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.46455925703048706},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.45311295986175537},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4516059160232544},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4223797023296356},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4178803265094757},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.41576915979385376},{"id":"https://openalex.org/keywords/cpu-cache","display_name":"CPU cache","score":0.4146229326725006},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3967137038707733},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.2722249925136566},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1416793167591095},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1273839771747589}],"concepts":[{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.7379434704780579},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7370954751968384},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6266725063323975},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6132358908653259},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.53904789686203},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.5359339118003845},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.46455925703048706},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.45311295986175537},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4516059160232544},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4223797023296356},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4178803265094757},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.41576915979385376},{"id":"https://openalex.org/C189783530","wikidata":"https://www.wikidata.org/wiki/Q352090","display_name":"CPU cache","level":3,"score":0.4146229326725006},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3967137038707733},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.2722249925136566},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1416793167591095},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1273839771747589},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2018.8474272","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474272","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1580415659","https://openalex.org/W1974982221","https://openalex.org/W2023659251","https://openalex.org/W2068999711","https://openalex.org/W2089307123","https://openalex.org/W2096581954","https://openalex.org/W2100597484","https://openalex.org/W2105175332","https://openalex.org/W2114931471","https://openalex.org/W2117984621","https://openalex.org/W2137706187","https://openalex.org/W2142358791","https://openalex.org/W2144289559","https://openalex.org/W2146018705","https://openalex.org/W2147657366","https://openalex.org/W2170649610","https://openalex.org/W2171323246","https://openalex.org/W2750392872","https://openalex.org/W4238002809","https://openalex.org/W4256602391","https://openalex.org/W6643836790","https://openalex.org/W6667869429","https://openalex.org/W6673023173","https://openalex.org/W6675854888","https://openalex.org/W6677189687","https://openalex.org/W6677569135","https://openalex.org/W6677711253","https://openalex.org/W6680966758","https://openalex.org/W6681009444","https://openalex.org/W6681492075","https://openalex.org/W6685103850","https://openalex.org/W6685115131","https://openalex.org/W6743537050"],"related_works":["https://openalex.org/W2144927208","https://openalex.org/W2167303720","https://openalex.org/W2497617944","https://openalex.org/W1563139915","https://openalex.org/W2109715593","https://openalex.org/W2061075966","https://openalex.org/W3147501184","https://openalex.org/W4256652509","https://openalex.org/W2140219379","https://openalex.org/W1918294866"],"abstract_inverted_index":{"Supply":[0],"voltage":[1,40,123],"scaling":[2,18],"is":[3,20,49,96],"an":[4],"effective":[5],"technique":[6],"to":[7,83,88],"reduce":[8,58],"the":[9,17,34,38,42,59,77,100,127,141],"power":[10],"consumption":[11],"of":[12,26,102,143],"modern":[13],"VLSI":[14],"circuits.":[15],"However,":[16],"extent":[19,142],"often":[21],"limited":[22],"by":[23],"variation-induced":[24],"failures":[25,53,73],"on-chip":[27],"memories,":[28],"such":[29,63,109,130],"as":[30,64,110,131,138,140],"cache":[31,92,150],"units.":[32],"Hence,":[33],"memory":[35,117],"components":[36],"dictate":[37],"minimum":[39],"for":[41,146],"entire":[43],"system":[44],"below":[45],"which":[46,57],"reliable":[47,90,147],"operation":[48],"not":[50],"guaranteed.":[51],"These":[52],"can":[54],"be":[55,84],"permanent,":[56],"yield,":[60],"or":[61],"transient,":[62],"soft-errors,":[65],"impacting":[66],"runtime":[67],"operation.":[68,93,151],"Both":[69],"permanent":[70],"and":[71,80,125,135,148],"transient":[72],"will":[74],"significantly":[75],"affect":[76],"overall":[78],"energy-efficiency":[79],"hence,":[81],"need":[82],"addressed":[85],"in":[86,99],"order":[87],"achieve":[89],"low-voltage":[91],"This":[94,113],"issue":[95],"more":[97],"pronounced":[98],"design":[101],"devices":[103],"with":[104],"a":[105],"stringent":[106],"energy":[107],"budget,":[108],"IoT":[111],"applications.":[112],"paper":[114],"studies":[115],"different":[116],"failure":[118],"mechanisms":[119],"across":[120],"wide":[121],"supply":[122],"range,":[124],"evaluates":[126],"disposable":[128],"counter-measures":[129],"error":[132],"correcting":[133],"codes":[134],"architectural":[136],"techniques":[137],"well":[139],"their":[144],"applicability":[145],"energy-efficient":[149]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}