{"id":"https://openalex.org/W2896152049","doi":"https://doi.org/10.1109/iolts.2018.8474180","title":"Reduced-code static linearity test of SAR ADCs using a built-in incremental \u2211\u0394 converter","display_name":"Reduced-code static linearity test of SAR ADCs using a built-in incremental \u2211\u0394 converter","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2896152049","doi":"https://doi.org/10.1109/iolts.2018.8474180","mag":"2896152049"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2018.8474180","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474180","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086862836","display_name":"Renato S. Feitoza","orcid":"https://orcid.org/0000-0002-6693-5971"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Renato S. Feitoza","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085204712","display_name":"Manuel J. Barrag\u00e1n","orcid":"https://orcid.org/0000-0003-0187-604X"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Manuel J. Barragan","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061963866","display_name":"Salvador Mir","orcid":"https://orcid.org/0000-0001-9911-8946"},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Salvador Mir","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107369558","display_name":"Daniel Dzahini","orcid":null},"institutions":[{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Daniel Dzahini","raw_affiliation_strings":["Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5086862836"],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.5448,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.64667148,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"29","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8675434589385986},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.7602236270904541},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7138309478759766},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6300791501998901},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5096430778503418},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4761407673358917},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4496977925300598},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.3415793180465698},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15366622805595398},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15212053060531616},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.11968567967414856},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08976054191589355}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8675434589385986},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.7602236270904541},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7138309478759766},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6300791501998901},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5096430778503418},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4761407673358917},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4496977925300598},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.3415793180465698},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15366622805595398},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15212053060531616},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.11968567967414856},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08976054191589355}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2018.8474180","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474180","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W21985954","https://openalex.org/W1529971285","https://openalex.org/W1559167797","https://openalex.org/W1597620877","https://openalex.org/W1930963782","https://openalex.org/W1984856645","https://openalex.org/W1995648121","https://openalex.org/W2004016279","https://openalex.org/W2070247293","https://openalex.org/W2084128131","https://openalex.org/W2099885537","https://openalex.org/W2111032961","https://openalex.org/W2121273653","https://openalex.org/W2147630201","https://openalex.org/W2509695479","https://openalex.org/W2582373786","https://openalex.org/W3021620047","https://openalex.org/W6640209620","https://openalex.org/W6646536051","https://openalex.org/W6649542579","https://openalex.org/W6681710621"],"related_works":["https://openalex.org/W2354856110","https://openalex.org/W2759986866","https://openalex.org/W2551040039","https://openalex.org/W2260965739","https://openalex.org/W2316679782","https://openalex.org/W4394393350","https://openalex.org/W3170226631","https://openalex.org/W3027656099","https://openalex.org/W3152894281","https://openalex.org/W2489339234"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,44,64,82,93],"strategy":[4],"for":[5,43],"static":[6,46,53],"linearity":[7,47,54],"self-testing":[8],"of":[9,20,30,40,63,74,109],"successive-approximation":[10],"analog":[11],"to":[12,35,92],"digital":[13],"converters":[14],"(SAR":[15],"ADCs)":[16],"with":[17,81,102],"the":[18,31,38,61,70,75,106,110],"goal":[19],"reducing":[21],"test":[22,26,65,88,112],"time.":[23],"The":[24,86,98],"proposed":[25,87,111],"technique":[27,99],"takes":[28],"advantage":[29],"SAR":[32,76],"ADC":[33,77],"architecture":[34],"drastically":[36],"reduce":[37],"number":[39],"necessary":[41],"measurements":[42,55],"complete":[45],"characterization.":[48],"Moreover,":[49],"we":[50],"show":[51],"that":[52],"can":[56],"be":[57],"performed":[58],"on-chip":[59],"without":[60],"need":[62],"stimulus":[66],"generator,":[67],"by":[68],"generating":[69],"major":[71],"carrier":[72],"transitions":[73],"and":[78,105],"acquiring":[79],"them":[80],"low":[83],"resolution":[84],"ADC.":[85,97],"circuitry":[89,113],"is":[90,100],"reduced":[91],"simple":[94],"incremental":[95],"\u03a3\u0394":[96],"validated":[101],"behavioral":[103],"simulations":[104],"design":[107],"trade-offs":[108],"are":[114],"explored.":[115]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}