{"id":"https://openalex.org/W2896189158","doi":"https://doi.org/10.1109/iolts.2018.8474169","title":"Periodic Aging Monitoring in SRAM Sense Amplifiers","display_name":"Periodic Aging Monitoring in SRAM Sense Amplifiers","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2896189158","doi":"https://doi.org/10.1109/iolts.2018.8474169","mag":"2896189158"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2018.8474169","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474169","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004659863","display_name":"Helen-Maria Dounavi","orcid":"https://orcid.org/0000-0002-6293-9860"},"institutions":[{"id":"https://openalex.org/I194019607","display_name":"University of Ioannina","ror":"https://ror.org/01qg3j183","country_code":"GR","type":"education","lineage":["https://openalex.org/I194019607"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Helen-Maria Dounavi","raw_affiliation_strings":["Dept. of Computer Science and Engineering, VCAS Lab, University of Ioannina, Ioannina, Greece (Hellas)"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science and Engineering, VCAS Lab, University of Ioannina, Ioannina, Greece (Hellas)","institution_ids":["https://openalex.org/I194019607"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025952927","display_name":"Yiorgos Sfikas","orcid":null},"institutions":[{"id":"https://openalex.org/I194019607","display_name":"University of Ioannina","ror":"https://ror.org/01qg3j183","country_code":"GR","type":"education","lineage":["https://openalex.org/I194019607"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Yiorgos Sfikas","raw_affiliation_strings":["Dept. of Computer Science and Engineering, VCAS Lab, University of Ioannina, Ioannina, Greece (Hellas)"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science and Engineering, VCAS Lab, University of Ioannina, Ioannina, Greece (Hellas)","institution_ids":["https://openalex.org/I194019607"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036684985","display_name":"Yiorgos Tsiatouhas","orcid":"https://orcid.org/0000-0001-8408-6929"},"institutions":[{"id":"https://openalex.org/I194019607","display_name":"University of Ioannina","ror":"https://ror.org/01qg3j183","country_code":"GR","type":"education","lineage":["https://openalex.org/I194019607"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Yiorgos Tsiatouhas","raw_affiliation_strings":["Dept. of Computer Science and Engineering, VCAS Lab, University of Ioannina, Ioannina, Greece (Hellas)"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science and Engineering, VCAS Lab, University of Ioannina, Ioannina, Greece (Hellas)","institution_ids":["https://openalex.org/I194019607"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5004659863"],"corresponding_institution_ids":["https://openalex.org/I194019607"],"apc_list":null,"apc_paid":null,"fwci":0.9013,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.7646648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"12","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.9376070499420166},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8992222547531128},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6995629668235779},{"id":"https://openalex.org/keywords/sense","display_name":"Sense (electronics)","score":0.6886610388755798},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6246247291564941},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6117739081382751},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5823453664779663},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5129434466362},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4882340729236603},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.48449084162712097},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4770618975162506},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46140044927597046},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.45460906624794006},{"id":"https://openalex.org/keywords/current-sense-amplifier","display_name":"Current sense amplifier","score":0.42879974842071533},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41509494185447693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3435041010379791},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2864949107170105},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.21341797709465027},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.12485378980636597},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1185629665851593},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08161953091621399}],"concepts":[{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.9376070499420166},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8992222547531128},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6995629668235779},{"id":"https://openalex.org/C143141573","wikidata":"https://www.wikidata.org/wiki/Q7450971","display_name":"Sense (electronics)","level":2,"score":0.6886610388755798},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6246247291564941},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6117739081382751},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5823453664779663},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5129434466362},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4882340729236603},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.48449084162712097},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4770618975162506},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46140044927597046},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.45460906624794006},{"id":"https://openalex.org/C182442803","wikidata":"https://www.wikidata.org/wiki/Q5195113","display_name":"Current sense amplifier","level":5,"score":0.42879974842071533},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41509494185447693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3435041010379791},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2864949107170105},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.21341797709465027},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.12485378980636597},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1185629665851593},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08161953091621399},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2018.8474169","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474169","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321917","display_name":"General Secretariat for Research and Technology","ror":"https://ror.org/04yeh8h63"},{"id":"https://openalex.org/F4320327859","display_name":"Hellenic Foundation for Research and Innovation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2010396115","https://openalex.org/W2089891733","https://openalex.org/W2095953597","https://openalex.org/W2102209270","https://openalex.org/W2137509664","https://openalex.org/W2345094463","https://openalex.org/W2516030650","https://openalex.org/W2537767489","https://openalex.org/W2542745766","https://openalex.org/W2549803267","https://openalex.org/W2579352521","https://openalex.org/W2621388538","https://openalex.org/W2759583620","https://openalex.org/W2760037701","https://openalex.org/W2808199063","https://openalex.org/W6675205960","https://openalex.org/W6739345576","https://openalex.org/W6752513081"],"related_works":["https://openalex.org/W1835913819","https://openalex.org/W2051363901","https://openalex.org/W2127348582","https://openalex.org/W2373152541","https://openalex.org/W1909296377","https://openalex.org/W2174410816","https://openalex.org/W3209598999","https://openalex.org/W2159817233","https://openalex.org/W2089002058","https://openalex.org/W2351439697"],"abstract_inverted_index":{"In":[0,19],"nanometer":[1],"technologies":[2],"the":[3,25,44,55,77,104],"reliability":[4],"of":[5,48,107],"Static":[6],"Random":[7],"Access":[8],"Memories":[9],"(SRAMs)":[10],"is":[11,39,84],"seriously":[12],"affected":[13],"by":[14,61],"transistor":[15,37],"Bias-Temperature":[16],"Instability":[17],"(BTI).":[18],"this":[20],"work,":[21],"a":[22,49,87],"circuit":[23],"for":[24],"periodic":[26],"aging":[27],"monitoring":[28,53,82],"in":[29,73,98],"SRAM":[30,59,100],"sense":[31,50,65],"amplifiers":[32,66],"(due":[33],"to":[34,57,75],"BTI":[35],"related":[36],"degradation)":[38],"presented.":[40],"This":[41],"degradation":[42],"increases":[43],"input":[45],"offset":[46],"voltage":[47],"amplifier.":[51],"Periodic":[52],"provides":[54],"ability":[56],"avoid":[58],"failures":[60],"detecting":[62],"over":[63],"aged":[64],"(near":[67],"failure)":[68],"and":[69],"then":[70],"properly":[71],"react":[72],"order":[74],"maintain":[76],"memory":[78],"reliable":[79],"operation.":[80,108],"The":[81],"scheme":[83],"based":[85],"on":[86],"low":[88],"cost":[89],"differential":[90],"ring":[91],"oscillator,":[92],"which":[93],"can":[94],"be":[95],"easily":[96],"embedded":[97],"an":[99],"array":[101],"without":[102],"affecting":[103],"normal":[105],"mode":[106]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}