{"id":"https://openalex.org/W2898021537","doi":"https://doi.org/10.1109/iolts.2018.8474085","title":"On the test of a COTS-based system for space applications","display_name":"On the test of a COTS-based system for space applications","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2898021537","doi":"https://doi.org/10.1109/iolts.2018.8474085","mag":"2898021537"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2018.8474085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039554694","display_name":"Sara Carbonara","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"S. Carbonara","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066051108","display_name":"Andrea Firrincieli","orcid":"https://orcid.org/0000-0002-0715-8164"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Firrincieli","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018216772","display_name":"Jan-Gerd Me\u00df","orcid":"https://orcid.org/0000-0002-2117-3483"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jan-Gerd Mess","raw_affiliation_strings":["DLR, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"DLR, Bremen, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5039554694"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.2575,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57848909,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"47","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.621791660785675},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5815625786781311},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5386156439781189},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5313304662704468},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5275765657424927},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.522273063659668},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4901333749294281},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.46255531907081604},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.4504110813140869},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2421627640724182},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14823675155639648}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.621791660785675},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5815625786781311},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5386156439781189},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5313304662704468},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5275765657424927},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.522273063659668},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4901333749294281},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.46255531907081604},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.4504110813140869},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2421627640724182},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14823675155639648},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C2776746162","wikidata":"https://www.wikidata.org/wiki/Q4508","display_name":"Navy","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2018.8474085","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474085","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:elib.dlr.de:122075","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4377196266","display_name":"elib (German Aerospace Center)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I2898391981","host_organization_name":"Deutsches Zentrum f\u00fcr Luft- und Raumfahrt e. V. (DLR)","host_organization_lineage":["https://openalex.org/I2898391981"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Konferenzbeitrag"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1965015817","https://openalex.org/W2162696040","https://openalex.org/W2334801967","https://openalex.org/W4233573690","https://openalex.org/W6661380412"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"The":[0],"MaMMoTH-Up":[1],"project":[2,25],"aims":[3],"at":[4],"designing":[5],"and":[6,77,100,117],"manufacturing":[7],"a":[8,62,112,115,118],"COTS-based":[9],"system":[10,55,75],"to":[11,60,88],"be":[12],"used":[13],"on":[14,40,83],"the":[15,20,24,29,51,54,90,95,105],"Ariane5":[16],"launcher.":[17],"One":[18],"of":[19,32,34,53,65,74],"key":[21],"challenges":[22],"in":[23,27,72,94],"lies":[26],"guaranteeing":[28],"same":[30],"level":[31,64],"reliability":[33],"previous":[35],"systems,":[36],"which":[37],"were":[38,57],"based":[39,82],"space":[41],"qualified":[42],"components.":[43],"To":[44],"achieve":[45],"this":[46],"goal,":[47],"new":[48,99],"solutions":[49],"for":[50,103],"test":[52,89,120],"hardware":[56,78],"developed,":[58],"able":[59],"guarantee":[61],"high":[63],"fault":[66],"coverage":[67],"while":[68],"matching":[69],"several":[70],"constraints":[71],"terms":[73],"accessibility":[76],"complexity.":[79],"An":[80],"approach":[81,121],"Software-based":[84],"Self-test":[85],"is":[86],"described":[87],"OR1200":[91],"processor":[92],"adopted":[93],"system,":[96],"combined":[97],"with":[98],"effective":[101],"techniques":[102],"identifying":[104],"on-line":[106],"functionally":[107],"untestable":[108],"faults.":[109],"Results":[110],"including":[111],"comparison":[113],"between":[114],"functional":[116],"structural":[119],"are":[122],"also":[123],"reported.":[124]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}