{"id":"https://openalex.org/W2897340859","doi":"https://doi.org/10.1109/iolts.2018.8474083","title":"Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard","display_name":"Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard","publication_year":2018,"publication_date":"2018-07-01","ids":{"openalex":"https://openalex.org/W2897340859","doi":"https://doi.org/10.1109/iolts.2018.8474083","mag":"2897340859"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2018.8474083","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474083","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005965937","display_name":"Jacopo Sini","orcid":"https://orcid.org/0000-0002-2163-9925"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"J. Sini","raw_affiliation_strings":["Politecnico di Torino"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087219426","display_name":"M. Violante","orcid":"https://orcid.org/0000-0002-5821-3418"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Violante","raw_affiliation_strings":["Politecnico di Torino"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006256979","display_name":"Peter Sarson","orcid":"https://orcid.org/0000-0002-7150-2281"},"institutions":[{"id":"https://openalex.org/I2799856747","display_name":"Dialog Semiconductor (Germany)","ror":"https://ror.org/03j0xs842","country_code":"DE","type":"company","lineage":["https://openalex.org/I2799856747"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Sarson","raw_affiliation_strings":["Dialog Semiconductor"],"affiliations":[{"raw_affiliation_string":"Dialog Semiconductor","institution_ids":["https://openalex.org/I2799856747"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5005965937"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16468551,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"287","last_page":"290"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.7535386085510254},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.717948853969574},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6329391002655029},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.6104711294174194},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5876748561859131},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5644304752349854},{"id":"https://openalex.org/keywords/strengths-and-weaknesses","display_name":"Strengths and weaknesses","score":0.5478864908218384},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.43138113617897034},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3503981828689575},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21315765380859375},{"id":"https://openalex.org/keywords/human\u2013computer-interaction","display_name":"Human\u2013computer interaction","score":0.13765129446983337}],"concepts":[{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.7535386085510254},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.717948853969574},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6329391002655029},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.6104711294174194},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5876748561859131},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5644304752349854},{"id":"https://openalex.org/C63882131","wikidata":"https://www.wikidata.org/wiki/Q17122954","display_name":"Strengths and weaknesses","level":2,"score":0.5478864908218384},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.43138113617897034},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3503981828689575},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21315765380859375},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.13765129446983337},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2018.8474083","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2018.8474083","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2896594904","https://openalex.org/W6755298075"],"related_works":["https://openalex.org/W4295769391","https://openalex.org/W2972220648","https://openalex.org/W2332667808","https://openalex.org/W1997921863","https://openalex.org/W4382644535","https://openalex.org/W4205326760","https://openalex.org/W3112960490","https://openalex.org/W2522768275","https://openalex.org/W2352938035","https://openalex.org/W2351672553"],"abstract_inverted_index":{"The":[0],"Failure":[1],"Mode,":[2],"Effect":[3],"and":[4,39,92],"Diagnostic":[5],"Analysis":[6],"(FMEDA)":[7],"is":[8,54],"a":[9,34,56,80,86],"technique":[10],"widely":[11],"adopted":[12],"by":[13,68,77,85],"automotive":[14],"industry":[15],"to":[16,37,73],"assess":[17],"the":[18,30,46,59,69,74,90,95,101],"level":[19],"of":[20,22,32,45,82,89,100],"reliability":[21],"hardware":[23],"designs.":[24],"Although":[25],"very":[26],"useful,":[27],"it":[28,53],"has":[29],"problem":[31],"taking":[33],"long":[35],"time":[36],"complete":[38],"requires":[40],"experts":[41],"with":[42,71],"extensive":[43],"knowledge":[44],"circuit":[47],"under":[48],"consideration.":[49],"In":[50],"this":[51],"paper,":[52],"presented":[55],"comparison":[57],"between":[58],"analysis":[60],"results":[61],"obtained":[62,76],"from":[63,79],"an":[64],"automatic":[65,98],"tool":[66],"developed":[67],"authors":[70],"respect":[72],"ones":[75],"hand":[78],"team":[81],"experts,":[83],"followed":[84],"critical":[87],"review":[88],"strengths":[91],"weaknesses,":[93],"about":[94],"rules":[96],"for":[97],"classification":[99],"faults":[102],"effects.":[103]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}