{"id":"https://openalex.org/W2758446689","doi":"https://doi.org/10.1109/iolts.2017.8046233","title":"Probabilistic error detection and correction in switched capacitor circuits using checksum codes","display_name":"Probabilistic error detection and correction in switched capacitor circuits using checksum codes","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2758446689","doi":"https://doi.org/10.1109/iolts.2017.8046233","mag":"2758446689"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046233","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046233","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5096736078","display_name":"Md Imran Momtaz","orcid":"https://orcid.org/0000-0002-6720-2681"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Md Imran Momtaz","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, GA, Atlanta"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, GA, Atlanta","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083178603","display_name":"Suvadeep Banerjee","orcid":"https://orcid.org/0000-0001-5188-1651"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suvadeep Banerjee","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, GA, Atlanta"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, GA, Atlanta","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, GA, Atlanta"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, GA, Atlanta","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"25","issue":null,"first_page":"271","last_page":"276"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/checksum","display_name":"Checksum","score":0.7899990081787109},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7444911003112793},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6888189315795898},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.6166756749153137},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.567398726940155},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5401673913002014},{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.5280376672744751},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4338744282722473},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4077718257904053},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3616982698440552},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.3067188858985901},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12245994806289673},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10798177123069763},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10144567489624023},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09327852725982666}],"concepts":[{"id":"https://openalex.org/C162372511","wikidata":"https://www.wikidata.org/wiki/Q218341","display_name":"Checksum","level":2,"score":0.7899990081787109},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7444911003112793},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6888189315795898},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6166756749153137},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.567398726940155},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5401673913002014},{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.5280376672744751},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4338744282722473},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4077718257904053},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3616982698440552},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.3067188858985901},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12245994806289673},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10798177123069763},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10144567489624023},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09327852725982666},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2017.8046233","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046233","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1536945048","https://openalex.org/W1544760291","https://openalex.org/W1999995941","https://openalex.org/W2010468809","https://openalex.org/W2028165789","https://openalex.org/W2083613288","https://openalex.org/W2098564826","https://openalex.org/W2103521875","https://openalex.org/W2105871328","https://openalex.org/W2107740459","https://openalex.org/W2107863528","https://openalex.org/W2129748997","https://openalex.org/W2132431944","https://openalex.org/W2148277175","https://openalex.org/W2149833715","https://openalex.org/W2158612529"],"related_works":["https://openalex.org/W2377071794","https://openalex.org/W2107209346","https://openalex.org/W12639752","https://openalex.org/W2080298133","https://openalex.org/W2128245068","https://openalex.org/W2905469256","https://openalex.org/W787782896","https://openalex.org/W2022912972","https://openalex.org/W2113867106","https://openalex.org/W2000606687"],"abstract_inverted_index":{"In":[0,133],"the":[1,41,59,82,101,107,127,156,162,175,184,190],"past,":[2],"techniques":[3],"for":[4,69,74],"error":[5,26,32,86,110],"detection":[6,27],"in":[7,47,55,77,140,158,181,203,207],"linear":[8],"digital":[9,70,131,166,194],"and":[10,19,43,52,146,170],"analog":[11,97,102,122,201],"circuits":[12,71,98,116,142],"using":[13,148],"checksum":[14],"codes":[15],"have":[16,66],"been":[17,67],"developed":[18],"shown":[20],"to":[21,36,40,93,95,106,198],"be":[22,37,144],"highly":[23],"efficient.":[24],"While":[25],"is":[28,91],"a":[29,78,89,130,165],"solved":[30],"problem,":[31,61],"correction":[33,60,64,150],"has":[34],"proved":[35],"difficult":[38,92],"due":[39,105],"time":[42,159],"area":[44],"overheads":[45],"involved":[46],"diagnosing":[48],"failed":[49],"system":[50],"states":[51],"correcting":[53,179],"them":[54],"real-time.":[56],"To":[57],"solve":[58],"real-time":[62,182],"probabilistic":[63,79,149],"mechanisms":[65,112],"proposed":[68],"that":[72],"correct":[73],"state":[75],"errors":[76,139,180],"manner,":[80],"circumventing":[81],"process":[83],"of":[84,109,129,155,164,174,186],"accurate":[85],"diagnosis.":[87],"Such":[88],"technique":[90],"apply":[94],"continuous-time":[96,123],"without":[99],"altering":[100],"transfer":[103],"function,":[104],"nature":[108],"feedback":[111],"involved.":[113],"However,":[114],"switched-capacitor":[115,141,204],"offer":[117],"intrinsic":[118],"advantages;":[119],"they":[120],"replicate":[121],"behavior":[124],"while":[125],"retaining":[126],"benefits":[128,210],"clock.":[132],"this":[134],"work,":[135],"we":[136],"show":[137],"how":[138],"can":[143],"detected":[145],"corrected,":[147],"algorithms,":[151],"by":[152,161,193],"taking":[153],"advantage":[154],"separation":[157],"afforded":[160],"use":[163],"clock":[167,172,188],"between":[168],"error-free":[169],"error-affected":[171],"cycles":[173],"circuit.":[176],"By":[177],"probabilistically":[178],"before":[183],"onset":[185],"future":[187],"cycles,":[189],"advantages":[191],"offered":[192],"clocks":[195],"are":[196],"exploited":[197],"deliver":[199],"high-fidelity":[200],"performance":[202],"filters":[205],"resulting":[206],"significant":[208],"SNR":[209],"at":[211],"low":[212],"cost.":[213]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}