{"id":"https://openalex.org/W2760044017","doi":"https://doi.org/10.1109/iolts.2017.8046228","title":"Reliable gas sensing with memristive array","display_name":"Reliable gas sensing with memristive array","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2760044017","doi":"https://doi.org/10.1109/iolts.2017.8046228","mag":"2760044017"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029448207","display_name":"Adedotun Adeyemo","orcid":"https://orcid.org/0000-0003-2003-3937"},"institutions":[{"id":"https://openalex.org/I124261462","display_name":"Oxford Brookes University","ror":"https://ror.org/04v2twj65","country_code":"GB","type":"education","lineage":["https://openalex.org/I124261462"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Adedotun Adeyemo","raw_affiliation_strings":["Dept of Computing and Comm. Technologies, Oxford Brookes University, UK"],"affiliations":[{"raw_affiliation_string":"Dept of Computing and Comm. Technologies, Oxford Brookes University, UK","institution_ids":["https://openalex.org/I124261462"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076588539","display_name":"Abusaleh Jabir","orcid":null},"institutions":[{"id":"https://openalex.org/I124261462","display_name":"Oxford Brookes University","ror":"https://ror.org/04v2twj65","country_code":"GB","type":"education","lineage":["https://openalex.org/I124261462"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Abusaleh Jabir","raw_affiliation_strings":["Dept of Computing and Comm. Technologies, Oxford Brookes University, UK"],"affiliations":[{"raw_affiliation_string":"Dept of Computing and Comm. Technologies, Oxford Brookes University, UK","institution_ids":["https://openalex.org/I124261462"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081683515","display_name":"Jimson Mathew","orcid":"https://orcid.org/0000-0001-8247-9040"},"institutions":[{"id":"https://openalex.org/I132153292","display_name":"Indian Institute of Technology Patna","ror":"https://ror.org/01ft5vz71","country_code":"IN","type":"education","lineage":["https://openalex.org/I132153292"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jimson Mathew","raw_affiliation_strings":["Computer Science & Engr., Indian Institute of Technology Patna"],"affiliations":[{"raw_affiliation_string":"Computer Science & Engr., Indian Institute of Technology Patna","institution_ids":["https://openalex.org/I132153292"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062989429","display_name":"Eugenio Martinelli","orcid":"https://orcid.org/0000-0002-6673-2066"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Eugenio Martinelli","raw_affiliation_strings":["Electronic Engineering, University of Rome \u201cTor Vergata\u201d Rome","Electronic Engineering, University of Rome \"Tor Vergata\" Rome"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering, University of Rome \u201cTor Vergata\u201d Rome","institution_ids":["https://openalex.org/I116067653"]},{"raw_affiliation_string":"Electronic Engineering, University of Rome \"Tor Vergata\" Rome","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056170822","display_name":"Corrado Di Natale","orcid":"https://orcid.org/0000-0002-0543-4348"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Corrado Di Natale","raw_affiliation_strings":["Electronic Engineering, University of Rome \u201cTor Vergata\u201d Rome","Electronic Engineering, University of Rome \"Tor Vergata\" Rome"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering, University of Rome \u201cTor Vergata\u201d Rome","institution_ids":["https://openalex.org/I116067653"]},{"raw_affiliation_string":"Electronic Engineering, University of Rome \"Tor Vergata\" Rome","institution_ids":["https://openalex.org/I116067653"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["Electronic Engineering, University of Rome \u201cTor Vergata\u201d Rome","Electronic Engineering, University of Rome \"Tor Vergata\" Rome"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering, University of Rome \u201cTor Vergata\u201d Rome","institution_ids":["https://openalex.org/I116067653"]},{"raw_affiliation_string":"Electronic Engineering, University of Rome \"Tor Vergata\" Rome","institution_ids":["https://openalex.org/I116067653"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5029448207"],"corresponding_institution_ids":["https://openalex.org/I124261462"],"apc_list":null,"apc_paid":null,"fwci":0.43,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.65665123,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"244","last_page":"246"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.8276805877685547},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8109540939331055},{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.6763057708740234},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5566462278366089},{"id":"https://openalex.org/keywords/row","display_name":"Row","score":0.47164386510849},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42850661277770996},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3258969783782959},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19584104418754578},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1273539960384369}],"concepts":[{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.8276805877685547},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8109540939331055},{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.6763057708740234},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5566462278366089},{"id":"https://openalex.org/C135598885","wikidata":"https://www.wikidata.org/wiki/Q1366302","display_name":"Row","level":2,"score":0.47164386510849},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42850661277770996},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3258969783782959},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19584104418754578},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1273539960384369},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2017.8046228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:art.torvergata.it:2108/193218","is_oa":false,"landing_page_url":"http://hdl.handle.net/2108/193218","pdf_url":null,"source":{"id":"https://openalex.org/S4306400993","display_name":"Cineca Institutional Research Information System (Tor Vergata University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I116067653","host_organization_name":"University of Rome Tor Vergata","host_organization_lineage":["https://openalex.org/I116067653"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7799999713897705}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1490670090","https://openalex.org/W1970483710","https://openalex.org/W1974235341","https://openalex.org/W2010819998","https://openalex.org/W2012523207","https://openalex.org/W2014306038","https://openalex.org/W2033882862","https://openalex.org/W2064756415","https://openalex.org/W2067788163","https://openalex.org/W2099096550","https://openalex.org/W2112181056","https://openalex.org/W2132215768","https://openalex.org/W2335636709","https://openalex.org/W2489139207"],"related_works":["https://openalex.org/W2015497999","https://openalex.org/W3164474614","https://openalex.org/W2171130799","https://openalex.org/W2015477599","https://openalex.org/W2548135880","https://openalex.org/W2144085790","https://openalex.org/W3177379469","https://openalex.org/W1568378063","https://openalex.org/W2516929886","https://openalex.org/W4253441086"],"abstract_inverted_index":{"Gas":[0],"sensing":[1,39],"is":[2],"one":[3],"of":[4,9,17,45,53,69],"the":[5,23,43,89],"proposed":[6],"application":[7],"field":[8],"memristive":[10],"devices.":[11],"We":[12,41],"used":[13],"a":[14,59,79],"crossbar":[15,60,103],"array":[16,68],"memristors":[18,54,70],"as":[19,55,75,77],"gas":[20,84],"sensor":[21,57],"using":[22,50],"HP":[24],"labs":[25],"fabricated":[26],"TiO":[27],"<sub":[28],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[29],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[30],"based":[31],"memristor":[32],"model":[33],"in":[34,58,102],"an":[35,67],"attempt":[36],"to":[37],"improve":[38],"accuracy.":[40],"introduced":[42],"possibility":[44],"reliable":[46],"multiple":[47,51],"gases":[48],"detection":[49],"rows":[52],"separate":[56],"array.":[61],"Our":[62],"experimental":[63],"results":[64],"show":[65],"that":[66],"can":[71],"minimise":[72],"measurement":[73],"errors":[74],"well":[76],"provide":[78],"good":[80],"redundancy":[81],"measure":[82],"during":[83],"sensing.":[85],"Measurements":[86],"taken":[87],"from":[88],"sensors":[90],"are":[91],"also":[92],"not":[93],"affected":[94],"by":[95],"alternate":[96],"current":[97],"paths":[98],"problem":[99],"often":[100],"experienced":[101],"architecture.":[104]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-02-03T00:53:05.648605","created_date":"2025-10-10T00:00:00"}