{"id":"https://openalex.org/W2758315396","doi":"https://doi.org/10.1109/iolts.2017.8046222","title":"Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications","display_name":"Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2758315396","doi":"https://doi.org/10.1109/iolts.2017.8046222","mag":"2758315396"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046222","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046222","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002610014","display_name":"Harsh N. Patel","orcid":"https://orcid.org/0000-0003-2836-479X"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Harsh N. Patel","raw_affiliation_strings":["Electrical and Computer Engineering, University of Virginia, Charlottesville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Virginia, Charlottesville, USA","institution_ids":["https://openalex.org/I51556381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080557997","display_name":"Benton H. Calhoun","orcid":"https://orcid.org/0000-0002-3770-5050"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benton H. Calhoun","raw_affiliation_strings":["Electrical and Computer Engineering, University of Virginia, Charlottesville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Virginia, Charlottesville, USA","institution_ids":["https://openalex.org/I51556381"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040237261","display_name":"R. Mann","orcid":"https://orcid.org/0000-0001-8373-2052"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Randy W. Mann","raw_affiliation_strings":["Electrical and Computer Engineering, University of Virginia, Charlottesville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Virginia, Charlottesville, USA","institution_ids":["https://openalex.org/I51556381"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2924,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60601892,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"209","last_page":"210"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5694257616996765},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5233965516090393},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4724976122379303},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41182103753089905},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3439326286315918},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3351523280143738},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3276804983615875},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32535600662231445},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2906119227409363},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17626038193702698},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16769200563430786}],"concepts":[{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5694257616996765},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5233965516090393},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4724976122379303},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41182103753089905},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3439326286315918},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3351523280143738},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3276804983615875},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32535600662231445},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2906119227409363},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17626038193702698},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16769200563430786},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2017.8046222","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046222","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2042808509","https://openalex.org/W2096927458"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W141820298","https://openalex.org/W2049584446","https://openalex.org/W2079781215","https://openalex.org/W4378770497","https://openalex.org/W4308245303","https://openalex.org/W2014033564","https://openalex.org/W2910573937","https://openalex.org/W4385571583","https://openalex.org/W4389519396"],"abstract_inverted_index":{"Aggressive":[0],"technology":[1,41,144],"and":[2,15,32,42,105,146],"supply":[3,43,102,147],"voltage":[4,148],"scaling":[5,44,145,149],"has":[6,51],"led":[7],"to":[8],"increasing":[9],"concern":[10],"for":[11,57,117],"reliability.":[12],"Optimizing":[13],"power":[14],"energy":[16],"with":[17,39,101],"sub-threshold":[18,73],"(sub-V":[19],"<sub":[20,107,127,134,152],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[21,108,128,135,153],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</sub>":[22,109,129],")":[23],"operation":[24],"exponentially":[25],"increases":[26],"the":[27,66,93,118,141],"occurrences":[28],"of":[29,68,97,143],"both":[30],"static":[31],"dynamic":[33],"failures.":[34],"With":[35],"smaller":[36],"node":[37,100],"capacitances":[38],"each":[40],"node,":[45],"radiation-induced":[46,69],"Single":[47],"Event":[48],"Upset":[49],"(SEU)":[50],"become":[52],"a":[53,77,98,113],"critical":[54,94],"design":[55,115],"metric":[56],"Ultra-Low-Power":[58],"(ULP)":[59],"applications.":[60,120],"In":[61],"this":[62],"paper,":[63],"we":[64,139],"explore":[65],"impact":[67],"soft":[70],"errors":[71],"on":[72,150],"SRAM":[74],"implemented":[75],"in":[76,92,103,112,125,131],"Body":[78],"Sensory":[79],"Node":[80],"(BSN)":[81],"as":[82],"an":[83,89],"ULP":[84],"application.":[85],"We":[86],"also":[87],"demonstrate":[88],"exponential":[90],"reduction":[91],"charge":[95],"(Qcrit)":[96],"storage":[99],"near-":[104],"sub-V":[106,126],"design,":[110],"resulting":[111],"significant":[114],"consideration":[116],"low-power":[119],"The":[121],"huge":[122],"process":[123],"variation":[124],"results":[130],"3X":[132],"Q":[133,151],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">crit</sub>":[136,154],"variation.":[137],"Finally,":[138],"compare":[140],"trend":[142],".":[155]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}