{"id":"https://openalex.org/W2760044514","doi":"https://doi.org/10.1109/iolts.2017.8046211","title":"Simulation-based analysis of FF behavior in presence of power supply noise","display_name":"Simulation-based analysis of FF behavior in presence of power supply noise","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2760044514","doi":"https://doi.org/10.1109/iolts.2017.8046211","mag":"2760044514"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102257011","display_name":"Yukiya Miura","orcid":null},"institutions":[{"id":"https://openalex.org/I69740276","display_name":"Tokyo Metropolitan University","ror":"https://ror.org/00ws30h19","country_code":"JP","type":"education","lineage":["https://openalex.org/I69740276"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukiya Miura","raw_affiliation_strings":["Faculty of System Design, Tokyo Metropolitan University, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of System Design, Tokyo Metropolitan University, Tokyo, Japan","institution_ids":["https://openalex.org/I69740276"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066114668","display_name":"Takuya Yamamoto","orcid":"https://orcid.org/0000-0001-9716-8237"},"institutions":[{"id":"https://openalex.org/I69740276","display_name":"Tokyo Metropolitan University","ror":"https://ror.org/00ws30h19","country_code":"JP","type":"education","lineage":["https://openalex.org/I69740276"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya Yamamoto","raw_affiliation_strings":["Graduate School of System Design, Tokyo Metropolitan University, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Design, Tokyo Metropolitan University, Tokyo, Japan","institution_ids":["https://openalex.org/I69740276"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I69740276"],"apc_list":null,"apc_paid":null,"fwci":0.7584,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64012337,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"151","last_page":"156"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7488905191421509},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7051184177398682},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6486195921897888},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6332392692565918},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6217169761657715},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5955058336257935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5512373447418213},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3359956443309784},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2891307473182678}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7488905191421509},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7051184177398682},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6486195921897888},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6332392692565918},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6217169761657715},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5955058336257935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5512373447418213},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3359956443309784},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2891307473182678},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2017.8046211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1568407911","https://openalex.org/W1967780602","https://openalex.org/W1969254942","https://openalex.org/W1984368978","https://openalex.org/W2003931302","https://openalex.org/W2016824522","https://openalex.org/W2036045762","https://openalex.org/W2087958779","https://openalex.org/W2129401784","https://openalex.org/W2131628455","https://openalex.org/W2163675244","https://openalex.org/W4255246482"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W3211992815","https://openalex.org/W4241196849"],"abstract_inverted_index":{"In":[0,67],"accordance":[1],"with":[2],"shrinking":[3,47],"of":[4,11,23,74,85,91],"device":[5,46],"sizes":[6],"and":[7,35,48,62,81],"the":[8,21,72,83,89,92],"low-power":[9],"design":[10,50],"VLSI":[12],"circuits,":[13,61],"power":[14,75,103],"supply":[15,76,104],"noises":[16,77],"such":[17],"as":[18],"IR-drop":[19],"affects":[20],"operation":[22],"SRAM":[24,30,58],"memory":[25],"cells.":[26],"Error":[27],"occurrences":[28],"in":[29,57],"have":[31,38],"already":[32],"been":[33,39],"reported,":[34],"several":[36],"countermeasures":[37,63,97],"proposed.":[40],"It":[41],"is":[42],"likely":[43],"that":[44],"further":[45],"lower-power":[49],"will":[51,64],"cause":[52,84],"errors":[53],"similar":[54],"to":[55],"those":[56],"for":[59,98],"FF":[60,79,99],"be":[65],"needed.":[66],"this":[68],"paper,":[69],"we":[70,95],"analyze":[71],"effect":[73],"on":[78],"circuits":[80],"investigate":[82],"error":[86],"occurrences.":[87],"On":[88],"basis":[90],"analysis":[93],"results,":[94],"propose":[96],"malfunctions":[100],"caused":[101],"by":[102],"noise.":[105]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}