{"id":"https://openalex.org/W2758353805","doi":"https://doi.org/10.1109/iolts.2017.8046206","title":"An on-line test strategy and analysis for a 1T1R crossbar memory","display_name":"An on-line test strategy and analysis for a 1T1R crossbar memory","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2758353805","doi":"https://doi.org/10.1109/iolts.2017.8046206","mag":"2758353805"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046206","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046206","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2117/110923","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103275760","display_name":"Manuel Escudero","orcid":"https://orcid.org/0000-0003-1323-4546"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Manuel Escudero-Lopez","raw_affiliation_strings":["Electronics Engineering Department, Universitat Politecnica de Catalunya, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, Universitat Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028715959","display_name":"Francesc Moll","orcid":"https://orcid.org/0000-0002-1290-3253"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Francesc Moll","raw_affiliation_strings":["Electronics Engineering Department, Universitat Politecnica de Catalunya, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, Universitat Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063332575","display_name":"Antonio Rubio","orcid":"https://orcid.org/0000-0003-1625-1472"},"institutions":[{"id":"https://openalex.org/I9617848","display_name":"Universitat Polit\u00e8cnica de Catalunya","ror":"https://ror.org/03mb6wj31","country_code":"ES","type":"education","lineage":["https://openalex.org/I9617848"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Antonio Rubio","raw_affiliation_strings":["Electronics Engineering Department, Universitat Politecnica de Catalunya, Barcelona, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, Universitat Politecnica de Catalunya, Barcelona, Spain","institution_ids":["https://openalex.org/I9617848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030851089","display_name":"Ioannis Vourkas","orcid":"https://orcid.org/0000-0002-7036-8092"},"institutions":[{"id":"https://openalex.org/I162148367","display_name":"Pontificia Universidad Cat\u00f3lica de Chile","ror":"https://ror.org/04teye511","country_code":"CL","type":"education","lineage":["https://openalex.org/I162148367"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Ioannis Vourkas","raw_affiliation_strings":["Dept. of Electrical Engineering Pontificia Universidad Catolica de Chile, Santiago, Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering Pontificia Universidad Catolica de Chile, Santiago, Chile","institution_ids":["https://openalex.org/I162148367"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.758,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.63853451,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"120","last_page":"125"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.8978787660598755},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.643517017364502},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6329665780067444},{"id":"https://openalex.org/keywords/memristor","display_name":"Memristor","score":0.6266422271728516},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4693380892276764},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4580792784690857},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.449991375207901},{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.43534421920776367},{"id":"https://openalex.org/keywords/principal","display_name":"Principal (computer security)","score":0.4281521439552307},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.33034375309944153},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22420871257781982},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21407318115234375},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1188090443611145}],"concepts":[{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.8978787660598755},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.643517017364502},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6329665780067444},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.6266422271728516},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4693380892276764},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4580792784690857},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.449991375207901},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.43534421920776367},{"id":"https://openalex.org/C144559511","wikidata":"https://www.wikidata.org/wiki/Q2986279","display_name":"Principal (computer security)","level":2,"score":0.4281521439552307},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.33034375309944153},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22420871257781982},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21407318115234375},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1188090443611145},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2017.8046206","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046206","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:upcommons.upc.edu:2117/110923","is_oa":true,"landing_page_url":"http://hdl.handle.net/2117/110923","pdf_url":null,"source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference report"}],"best_oa_location":{"id":"pmh:oai:upcommons.upc.edu:2117/110923","is_oa":true,"landing_page_url":"http://hdl.handle.net/2117/110923","pdf_url":null,"source":{"id":"https://openalex.org/S4377196262","display_name":"UPCommons institutional repository (Universitat Polit\u00e8cnica de Catalunya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I9617848","host_organization_name":"Universitat Polit\u00e8cnica de Catalunya","host_organization_lineage":["https://openalex.org/I9617848"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference report"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1982533447","https://openalex.org/W1998177673","https://openalex.org/W2004823737","https://openalex.org/W2013656496","https://openalex.org/W2112181056","https://openalex.org/W2153199442","https://openalex.org/W2162651880","https://openalex.org/W2165911664","https://openalex.org/W2288952784","https://openalex.org/W2992959889","https://openalex.org/W4236126228","https://openalex.org/W6770915347"],"related_works":["https://openalex.org/W2015497999","https://openalex.org/W3164474614","https://openalex.org/W2171130799","https://openalex.org/W2005875039","https://openalex.org/W2015477599","https://openalex.org/W2144085790","https://openalex.org/W2548135880","https://openalex.org/W3177379469","https://openalex.org/W2516929886","https://openalex.org/W4253441086"],"abstract_inverted_index":{"Memristors":[0],"are":[1,52],"emerging":[2,47],"devices":[3],"known":[4],"by":[5],"their":[6,28,39],"nonvolability,":[7],"compatibility":[8],"with":[9],"CMOS":[10],"processes":[11],"and":[12,42,50],"high":[13],"density":[14,17],"in":[15,18,33,45],"circuits":[16,19,68],"mostly":[20],"owing":[21],"to":[22,79,85],"the":[23,34,43,65,91],"crossbar":[24,93],"nanoarchitecture.":[25],"One":[26],"of":[27,67,70],"most":[29],"notable":[30],"applications":[31],"is":[32,69],"memory":[35,92],"system":[36],"field.":[37],"Despite":[38],"promising":[40],"characteristics":[41],"advancements":[44],"this":[46,74],"technology,":[48],"variability":[49],"reliability":[51],"still":[53],"principal":[54],"issues":[55],"for":[56],"memristors.":[57],"For":[58],"these":[59],"reasons,":[60],"exploring":[61],"techniques":[62],"that":[63],"check":[64],"integrity":[66],"primary":[71],"importance.":[72],"Therefore,":[73],"paper":[75],"proposes":[76],"a":[77,87],"method":[78],"perform":[80],"an":[81],"on-line":[82],"test":[83],"capable":[84],"detect":[86],"single":[88],"failure":[89],"inside":[90],"array.":[94]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2017-10-06T00:00:00"}