{"id":"https://openalex.org/W2760260517","doi":"https://doi.org/10.1109/iolts.2017.8046199","title":"A generic embedded sequence generator for constrained-random validation with weighted distributions","display_name":"A generic embedded sequence generator for constrained-random validation with weighted distributions","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2760260517","doi":"https://doi.org/10.1109/iolts.2017.8046199","mag":"2760260517"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046199","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046199","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104063816","display_name":"Xiaobing Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Xiaobing Shi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada","institution_ids":["https://openalex.org/I98251732"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048457847","display_name":"Nicola Nicolici","orcid":"https://orcid.org/0000-0001-6345-5908"},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Nicola Nicolici","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McMaster University, Hamilton, ON, Canada","institution_ids":["https://openalex.org/I98251732"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I98251732"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10340985,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"57","last_page":"62"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7175713181495667},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.6779422760009766},{"id":"https://openalex.org/keywords/reuse","display_name":"Reuse","score":0.6658257246017456},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5359910726547241},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5203139781951904},{"id":"https://openalex.org/keywords/random-number-generation","display_name":"Random number generation","score":0.4340885281562805},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4287011921405792},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.4133723974227905},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36168527603149414},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.3570701777935028},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13001495599746704}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7175713181495667},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.6779422760009766},{"id":"https://openalex.org/C206588197","wikidata":"https://www.wikidata.org/wiki/Q846574","display_name":"Reuse","level":2,"score":0.6658257246017456},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5359910726547241},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5203139781951904},{"id":"https://openalex.org/C201866948","wikidata":"https://www.wikidata.org/wiki/Q228206","display_name":"Random number generation","level":2,"score":0.4340885281562805},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4287011921405792},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.4133723974227905},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36168527603149414},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.3570701777935028},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13001495599746704},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2017.8046199","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046199","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W658499214","https://openalex.org/W1511234963","https://openalex.org/W1515082873","https://openalex.org/W1539419743","https://openalex.org/W1849928240","https://openalex.org/W1997526146","https://openalex.org/W1999593669","https://openalex.org/W2024436253","https://openalex.org/W2042692297","https://openalex.org/W2076451711","https://openalex.org/W2090692734","https://openalex.org/W2098178883","https://openalex.org/W2098771792","https://openalex.org/W2098854373","https://openalex.org/W2144786221","https://openalex.org/W2147524308","https://openalex.org/W2156687846","https://openalex.org/W2161957517","https://openalex.org/W2207050309","https://openalex.org/W2344568791","https://openalex.org/W2401249903","https://openalex.org/W2403319193","https://openalex.org/W4232656078","https://openalex.org/W4239352486","https://openalex.org/W4252251132","https://openalex.org/W6675078232"],"related_works":["https://openalex.org/W2384475851","https://openalex.org/W2000444236","https://openalex.org/W2353602216","https://openalex.org/W2367078749","https://openalex.org/W2381798600","https://openalex.org/W1910583078","https://openalex.org/W3145906801","https://openalex.org/W2095266342","https://openalex.org/W2067529211","https://openalex.org/W1517932371"],"abstract_inverted_index":{"Post-silicon":[0],"validation":[1],"is":[2,34],"concerned":[3],"for":[4],"discovering":[5],"design":[6],"errors":[7],"that":[8,56],"escape":[9],"to":[10,20,27,35,39,62],"the":[11,22,37],"silicon":[12],"prototypes.":[13],"Recent":[14],"research":[15],"efforts":[16],"have":[17],"shown":[18],"how":[19],"reuse":[21],"constraints":[23,63],"from":[24],"pre-silicon":[25],"verification":[26],"support":[28],"post-silicon":[29],"constrained-random":[30],"validation.":[31],"The":[32],"objective":[33],"subject":[36],"prototype":[38],"a":[40,53],"large":[41],"volume":[42],"of":[43],"random,":[44],"yet":[45],"functionally-compliant":[46],"stimuli.":[47],"In":[48],"this":[49],"paper,":[50],"we":[51],"present":[52],"new":[54],"method":[55],"facilitates":[57],"on-chip":[58],"stimuli":[59],"generation":[60],"compliant":[61],"with":[64],"weighted":[65],"distributions.":[66]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}