{"id":"https://openalex.org/W2750969008","doi":"https://doi.org/10.1109/iolts.2017.8046168","title":"SICTA: A superimposed in-circuit fault tolerant architecture for SRAM-based FPGAs","display_name":"SICTA: A superimposed in-circuit fault tolerant architecture for SRAM-based FPGAs","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2750969008","doi":"https://doi.org/10.1109/iolts.2017.8046168","mag":"2750969008"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2017.8046168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037198657","display_name":"Alexandra Kourfali","orcid":"https://orcid.org/0000-0003-3430-1007"},"institutions":[{"id":"https://openalex.org/I32597200","display_name":"Ghent University","ror":"https://ror.org/00cv9y106","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Alexandra Kourfali","raw_affiliation_strings":["Department of Electronics and Information Systems (ELIS), Ghent University iGent, Ghent, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Information Systems (ELIS), Ghent University iGent, Ghent, Belgium","institution_ids":["https://openalex.org/I32597200"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086835710","display_name":"Amit Kulkarni","orcid":"https://orcid.org/0000-0001-7548-3332"},"institutions":[{"id":"https://openalex.org/I32597200","display_name":"Ghent University","ror":"https://ror.org/00cv9y106","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Amit Kulkarni","raw_affiliation_strings":["Department of Electronics and Information Systems (ELIS), Ghent University iGent, Ghent, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Information Systems (ELIS), Ghent University iGent, Ghent, Belgium","institution_ids":["https://openalex.org/I32597200"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004502321","display_name":"Dirk Stroobandt","orcid":"https://orcid.org/0000-0002-4477-5313"},"institutions":[{"id":"https://openalex.org/I32597200","display_name":"Ghent University","ror":"https://ror.org/00cv9y106","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Dirk Stroobandt","raw_affiliation_strings":["Department of Electronics and Information Systems (ELIS), Ghent University iGent, Ghent, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electronics and Information Systems (ELIS), Ghent University iGent, Ghent, Belgium","institution_ids":["https://openalex.org/I32597200"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037198657"],"corresponding_institution_ids":["https://openalex.org/I32597200"],"apc_list":null,"apc_paid":null,"fwci":0.6579,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.73869606,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"5","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8131423592567444},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7306323051452637},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7199921607971191},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6747511625289917},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6675459146499634},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5656574964523315},{"id":"https://openalex.org/keywords/reconfigurable-computing","display_name":"Reconfigurable computing","score":0.48626387119293213},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4393470287322998},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4268583655357361},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.345508873462677},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3271510601043701},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.25565624237060547},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.19593596458435059},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1190187931060791},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.07133862376213074}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8131423592567444},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7306323051452637},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7199921607971191},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6747511625289917},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6675459146499634},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5656574964523315},{"id":"https://openalex.org/C142962650","wikidata":"https://www.wikidata.org/wiki/Q240838","display_name":"Reconfigurable computing","level":3,"score":0.48626387119293213},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4393470287322998},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4268583655357361},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.345508873462677},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3271510601043701},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.25565624237060547},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.19593596458435059},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1190187931060791},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.07133862376213074},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iolts.2017.8046168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2017.8046168","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:archive.ugent.be:8527652","is_oa":false,"landing_page_url":"http://hdl.handle.net/1854/LU-8527652","pdf_url":null,"source":{"id":"https://openalex.org/S4306400478","display_name":"Ghent University Academic Bibliography (Ghent University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I32597200","host_organization_name":"Ghent University","host_organization_lineage":["https://openalex.org/I32597200"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISBN: 9781538603529","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320337367","display_name":"Division of Materials Research","ror":"https://ror.org/01pc7k308"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1983942558","https://openalex.org/W2017517691","https://openalex.org/W2041252144","https://openalex.org/W2048944807","https://openalex.org/W2050044727","https://openalex.org/W2155417261","https://openalex.org/W2328083745","https://openalex.org/W2611861036","https://openalex.org/W2963186836","https://openalex.org/W6737626253"],"related_works":["https://openalex.org/W3006277082","https://openalex.org/W2610634993","https://openalex.org/W1612076744","https://openalex.org/W2097660413","https://openalex.org/W2081738003","https://openalex.org/W2129019972","https://openalex.org/W2943396510","https://openalex.org/W3164085601","https://openalex.org/W2139962137","https://openalex.org/W2126857316"],"abstract_inverted_index":{"Reassuring":[0],"fault":[1,89],"tolerance":[2],"in":[3,23,81],"computing":[4],"systems":[5],"that":[6],"contain":[7],"FPGA":[8,82],"devices":[9],"is":[10,30],"the":[11,21],"most":[12],"important":[13],"problem":[14],"for":[15],"mission":[16],"critical":[17],"space":[18],"components.":[19],"With":[20],"rise":[22],"interest":[24],"of":[25,88],"commercial":[26],"SRAM-based":[27],"FPGAs,":[28],"it":[29],"crucial":[31],"to":[32,72],"provide":[33,70],"runtime":[34,75],"reconfigurable":[35,49],"recovery":[36,63,76],"from":[37],"a":[38,45],"failure.":[39],"In":[40],"this":[41],"paper,":[42],"we":[43],"propose":[44],"superimposed":[46],"virtual":[47],"coarse-grained":[48],"architecture,":[50],"embedded":[51],"with":[52,77],"on-demand":[53],"three":[54],"level":[55],"fault-mitigation":[56],"technique.":[57],"The":[58],"proposed":[59],"method":[60],"performs":[61],"run-time":[62],"via":[64],"discrete":[65],"microscrubbing.":[66],"This":[67],"approach":[68],"can":[69],"up":[71],"3\u00d7":[73],"faster":[74],"10.2\u00d7":[78],"less":[79],"resources":[80],"devices,":[83],"by":[84],"providing":[85],"integrated":[86],"layers":[87],"mitigation.":[90]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}