{"id":"https://openalex.org/W2534471508","doi":"https://doi.org/10.1109/iolts.2016.7604707","title":"Single-event performance of differential flip-flop designs and hardening implication","display_name":"Single-event performance of differential flip-flop designs and hardening implication","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2534471508","doi":"https://doi.org/10.1109/iolts.2016.7604707","mag":"2534471508"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604707","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014521370","display_name":"Rongmei Chen","orcid":"https://orcid.org/0000-0003-3613-7626"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN","US"],"is_corresponding":true,"raw_author_name":"R. M. Chen","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA","Ministry of Education, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA","institution_ids":["https://openalex.org/I200719446"]},{"raw_affiliation_string":"Ministry of Education, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009879848","display_name":"En Xia Zhang","orcid":"https://orcid.org/0000-0002-8021-2411"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. X. Zhang","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN, USA","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5014521370"],"corresponding_institution_ids":["https://openalex.org/I200719446","https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10669635,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"221","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.8398035764694214},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.6656894683837891},{"id":"https://openalex.org/keywords/flip","display_name":"Flip","score":0.5506373047828674},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.5485143065452576},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5183550119400024},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4590725898742676},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.44996896386146545},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3003298044204712},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2084519863128662},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.16827860474586487},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.14900359511375427}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.8398035764694214},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.6656894683837891},{"id":"https://openalex.org/C2776591724","wikidata":"https://www.wikidata.org/wiki/Q5459651","display_name":"Flip","level":3,"score":0.5506373047828674},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.5485143065452576},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5183550119400024},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4590725898742676},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.44996896386146545},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3003298044204712},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2084519863128662},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.16827860474586487},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.14900359511375427},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C190283241","wikidata":"https://www.wikidata.org/wiki/Q14599311","display_name":"Apoptosis","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2016.7604707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604707","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1496452572","https://openalex.org/W1998173167","https://openalex.org/W2014215998","https://openalex.org/W2046641314","https://openalex.org/W2060193918","https://openalex.org/W2062118044","https://openalex.org/W2071068906","https://openalex.org/W2100888559","https://openalex.org/W2109195618","https://openalex.org/W2109769819","https://openalex.org/W2115043123","https://openalex.org/W2126292257","https://openalex.org/W2126605331","https://openalex.org/W2126709942","https://openalex.org/W2127365946","https://openalex.org/W2131631156","https://openalex.org/W2155603569","https://openalex.org/W3149586126","https://openalex.org/W4245063195"],"related_works":["https://openalex.org/W221087158","https://openalex.org/W2915471777","https://openalex.org/W318263151","https://openalex.org/W3032425875","https://openalex.org/W2013870538","https://openalex.org/W2079261375","https://openalex.org/W2413132533","https://openalex.org/W2497152992","https://openalex.org/W2482318635","https://openalex.org/W2733322820"],"abstract_inverted_index":{"Differential":[0],"flip-flop":[1,24],"designs":[2],"for":[3,8,31,39],"high-speed":[4],"operations":[5],"are":[6,41],"evaluated":[7],"single-event":[9],"(SE)":[10],"effects":[11],"using":[12],"circuit-level":[13],"simulations.":[14],"Results":[15],"show":[16],"input":[17],"dependent":[18],"SE":[19],"performance":[20],"of":[21],"some":[22],"differential":[23,33],"designs.":[25],"Radiation":[26],"hardenings":[27],"by":[28,36],"layout":[29],"optimization":[30],"all":[32],"flip-flops":[34],"and":[35],"circuit":[37],"design":[38],"SSTC":[40],"discussed.":[42]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}