{"id":"https://openalex.org/W2535138029","doi":"https://doi.org/10.1109/iolts.2016.7604705","title":"Power-side-channel analysis of carbon nanotube FET based design","display_name":"Power-side-channel analysis of carbon nanotube FET based design","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2535138029","doi":"https://doi.org/10.1109/iolts.2016.7604705","mag":"2535138029"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604705","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604705","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006632095","display_name":"Chandra K. H. Suresh","orcid":null},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chandra K. H. Suresh","raw_affiliation_strings":["New York University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103257320","display_name":"Bodhisatwa Mazumdar","orcid":"https://orcid.org/0000-0002-1833-4725"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bodhisatwa Mazumdar","raw_affiliation_strings":["New York University, Abu Dhabi"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University, Abu Dhabi","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039350964","display_name":"Sk Subidh Ali","orcid":"https://orcid.org/0000-0001-5942-4455"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sk Subidh Ali","raw_affiliation_strings":["New York University, Abu Dhabi"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University, Abu Dhabi","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["New York University, Abu Dhabi"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University, Abu Dhabi","institution_ids":["https://openalex.org/I57206974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I57206974"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"215","last_page":"218"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8028764724731445},{"id":"https://openalex.org/keywords/side-channel-attack","display_name":"Side channel attack","score":0.7829389572143555},{"id":"https://openalex.org/keywords/carbon-nanotube-field-effect-transistor","display_name":"Carbon nanotube field-effect transistor","score":0.6968594193458557},{"id":"https://openalex.org/keywords/power-analysis","display_name":"Power analysis","score":0.677248477935791},{"id":"https://openalex.org/keywords/carbon-nanotube","display_name":"Carbon nanotube","score":0.463195264339447},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.43664035201072693},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43454962968826294},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4301573932170868},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.42931652069091797},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4229170083999634},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.42237597703933716},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.42072439193725586},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36344918608665466},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3407987952232361},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26456838846206665},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.21477937698364258},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.21193993091583252},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.18066489696502686},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12364500761032104},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.10859414935112},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1078718900680542}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8028764724731445},{"id":"https://openalex.org/C49289754","wikidata":"https://www.wikidata.org/wiki/Q2267081","display_name":"Side channel attack","level":3,"score":0.7829389572143555},{"id":"https://openalex.org/C58916441","wikidata":"https://www.wikidata.org/wiki/Q1778563","display_name":"Carbon nanotube field-effect transistor","level":5,"score":0.6968594193458557},{"id":"https://openalex.org/C71743495","wikidata":"https://www.wikidata.org/wiki/Q2845210","display_name":"Power analysis","level":3,"score":0.677248477935791},{"id":"https://openalex.org/C513720949","wikidata":"https://www.wikidata.org/wiki/Q1778729","display_name":"Carbon nanotube","level":2,"score":0.463195264339447},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.43664035201072693},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43454962968826294},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4301573932170868},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.42931652069091797},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4229170083999634},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.42237597703933716},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.42072439193725586},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36344918608665466},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3407987952232361},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26456838846206665},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.21477937698364258},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.21193993091583252},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.18066489696502686},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12364500761032104},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.10859414935112},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1078718900680542},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2016.7604705","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604705","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W189008600","https://openalex.org/W1511729906","https://openalex.org/W1526219215","https://openalex.org/W1560640234","https://openalex.org/W1796231437","https://openalex.org/W1894646615","https://openalex.org/W1994356874","https://openalex.org/W2007737299","https://openalex.org/W2021658647","https://openalex.org/W2032793297","https://openalex.org/W2037616057","https://openalex.org/W2048314202","https://openalex.org/W2058151115","https://openalex.org/W2089463003","https://openalex.org/W2120773346","https://openalex.org/W2125740733","https://openalex.org/W2131862714","https://openalex.org/W2138117641","https://openalex.org/W2154869256","https://openalex.org/W2154909745","https://openalex.org/W2159745870","https://openalex.org/W2164276509","https://openalex.org/W2545774248","https://openalex.org/W3101159937","https://openalex.org/W4247544866","https://openalex.org/W4300106797","https://openalex.org/W6630778778","https://openalex.org/W6678158299","https://openalex.org/W6682554491","https://openalex.org/W6729365910"],"related_works":["https://openalex.org/W5280335","https://openalex.org/W2989964095","https://openalex.org/W2164725015","https://openalex.org/W2782264121","https://openalex.org/W4323926098","https://openalex.org/W4384807855","https://openalex.org/W2022533428","https://openalex.org/W182679101","https://openalex.org/W4244949874","https://openalex.org/W2425598453"],"abstract_inverted_index":{"Continuous":[0],"scaling":[1],"of":[2,89,135,138,169,174],"CMOS":[3,29,45,126,150],"technology":[4],"beyond":[5],"sub-nanometer":[6],"region":[7],"has":[8],"aggravated":[9],"short-channel":[10],"effects,":[11],"resulting":[12],"in":[13,172],"increased":[14],"leakage":[15,23],"current":[16,24,56],"and":[17,25,58,65,142,153],"high":[18,55],"power":[19,26,60,64,101,105,131,163],"densities.":[20,61],"Furthermore,":[21],"elevated":[22],"density":[27],"render":[28],"based":[30,117,127,151,159],"security-critical":[31],"applications":[32],"vulnerable":[33],"to":[34,44,68,185],"power-side-channel":[35,87,186],"attacks.":[36],"Carbon":[37],"Nanotubes":[38],"(CNT)":[39],"is":[40,111,121,147],"a":[41,182],"promising":[42],"alternative":[43],"technology.":[46],"It":[47],"offers":[48,181],"superior":[49],"transport":[50],"properties,":[51],"excellent":[52],"thermal":[53],"conductivities,":[54],"capacities,":[57],"low":[59],"Besides":[62],"area,":[63],"performance,":[66],"adherence":[67],"hardware":[69],"security":[70],"aspects":[71],"have":[72],"become":[73],"an":[74],"important":[75],"criteria":[76],"today.":[77],"In":[78],"this":[79],"work,":[80],"we":[81],"present":[82],"the":[83,103,133,139],"first":[84],"study":[85],"on":[86],"analysis":[88,106],"ciphers":[90,160],"implemented":[91],"using":[92],"CNTFETs.":[93,175],"Our":[94],"simulation":[95],"results":[96,177],"show":[97],"that":[98,179],"for":[99,115,125,149,157,161],"130":[100],"traces,":[102,164],"simple":[104],"(SPA)":[107],"attack":[108],"success":[109],"rate":[110],"less":[112,154],"than":[113,123,155,188],"0.35":[114],"CNTFET":[116,158],"ciphers,":[118],"whereas":[119],"it":[120],"greater":[122],"0.95":[124],"ciphers.":[128],"For":[129],"correlation":[130,136],"analysis,":[132],"difference":[134],"coefficient":[137],"correct":[140,170],"key":[141,145,171],"closest":[143],"wrong":[144],"guess":[146],"1.3":[148],"design,":[152],"0.56":[156],"20,000":[162],"which":[165],"implies":[166],"lesser":[167],"distinguishability":[168],"case":[173],"These":[176],"indicate":[178],"CNT":[180],"higher":[183],"resilience":[184],"attacks":[187],"CMOS.":[189]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}