{"id":"https://openalex.org/W2537369590","doi":"https://doi.org/10.1109/iolts.2016.7604688","title":"HLS-based sensitivity-inductive soft error mitigation for satellite communication systems","display_name":"HLS-based sensitivity-inductive soft error mitigation for satellite communication systems","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2537369590","doi":"https://doi.org/10.1109/iolts.2016.7604688","mag":"2537369590"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604688","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604688","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100441949","display_name":"Xiang Chen","orcid":"https://orcid.org/0000-0002-9800-6472"},"institutions":[{"id":"https://openalex.org/I3131625388","display_name":"University Town of Shenzhen","ror":"https://ror.org/05f5j6225","country_code":"CN","type":"education","lineage":["https://openalex.org/I3131625388"]},{"id":"https://openalex.org/I157773358","display_name":"Sun Yat-sen University","ror":"https://ror.org/0064kty71","country_code":"CN","type":"education","lineage":["https://openalex.org/I157773358"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiang Chen","raw_affiliation_strings":["Key Lab of EDA, Research Institute of Tsinghua University in Shenzhen (RITS), Shenzhen, China","School of Electronics and Information Engineering, Sun Yat-Sen University, Guangzhou"],"affiliations":[{"raw_affiliation_string":"Key Lab of EDA, Research Institute of Tsinghua University in Shenzhen (RITS), Shenzhen, China","institution_ids":["https://openalex.org/I3131625388","https://openalex.org/I99065089"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Sun Yat-Sen University, Guangzhou","institution_ids":["https://openalex.org/I157773358"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059847282","display_name":"Wenhui Yang","orcid":"https://orcid.org/0000-0001-6794-9024"},"institutions":[{"id":"https://openalex.org/I4210162399","display_name":"Airport Shunyi District Hospital","ror":"https://ror.org/053ws4838","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210162399"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhui Yang","raw_affiliation_strings":["Beijing Capital International Airport Co. Ltd., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Beijing Capital International Airport Co. Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210162399"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103904350","display_name":"Ming Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Zhao","raw_affiliation_strings":["TNList, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"TNList, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100378697","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0003-3653-7013"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["TNList, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"TNList, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100441949"],"corresponding_institution_ids":["https://openalex.org/I157773358","https://openalex.org/I3131625388","https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.1838,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58759249,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"143","last_page":"148"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.8962063193321228},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8392219543457031},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7344747185707092},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6164312958717346},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.5005025863647461},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4800644814968109},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47333675622940063},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4506545066833496},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.420326292514801},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4046687185764313},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39507174491882324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21025609970092773},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1855609118938446},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.10125496983528137}],"concepts":[{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.8962063193321228},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8392219543457031},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7344747185707092},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6164312958717346},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.5005025863647461},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4800644814968109},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47333675622940063},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4506545066833496},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.420326292514801},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4046687185764313},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39507174491882324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21025609970092773},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1855609118938446},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10125496983528137},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2016.7604688","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604688","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","score":0.49000000953674316,"display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W639321487","https://openalex.org/W1832104134","https://openalex.org/W2025479829","https://openalex.org/W2045107834","https://openalex.org/W2071068906","https://openalex.org/W2115299214","https://openalex.org/W2116488959","https://openalex.org/W2120034842","https://openalex.org/W2128936514","https://openalex.org/W2144199499","https://openalex.org/W2160017847","https://openalex.org/W2161815502","https://openalex.org/W2162465831","https://openalex.org/W2164206238","https://openalex.org/W2985010850","https://openalex.org/W4300663557","https://openalex.org/W6638531267"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W3008821054","https://openalex.org/W2797678940","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2000379092","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W4245453130"],"abstract_inverted_index":{"Soft":[0],"errors":[1,130],"induced":[2],"by":[3,137],"space":[4,14],"radiation":[5],"environments":[6],"seriously":[7],"influence":[8],"the":[9,31,48,55,62,73,81,111,128,134,138,146,149,157,172,182,185],"reliability":[10,186],"of":[11,30,76,148,174],"spacecrafts":[12],"in":[13],"and":[15,25,99,131],"satellite":[16],"communications,":[17],"especially":[18],"with":[19,156,171],"ever":[20],"shrinking":[21],"geometries,":[22],"higher-density":[23],"circuits,":[24],"power":[26],"saving":[27],"techniques.":[28],"Most":[29],"existing":[32],"soft":[33,129],"error":[34],"mitigation":[35],"methods":[36],"depend":[37],"on":[38,83],"triple":[39],"modular":[40],"redundancy":[41,45],"(TMR)":[42],"or":[43,78],"dual-modular":[44],"(DMR)":[46],"to":[47,69,71,109,126,132,144,161,177],"original":[49],"design":[50,87],"target":[51],"directly,":[52],"which":[53,123],"enlarge":[54],"resource":[56,74],"overhead":[57,135],"dramatically.":[58],"In":[59,142],"this":[60],"paper,":[61],"high":[63],"level":[64],"synthesis":[65],"(HLS)":[66],"is":[67,168],"considered":[68],"help":[70,125],"reduce":[72],"consumptions":[75],"TMR":[77,102,178],"DMR.":[79],"By":[80,165],"HLS":[82,158],"node":[84],"sensitivity,":[85],"all":[86],"resources":[88],"can":[89,103,117,124,187],"be":[90,104,118],"classified":[91],"into":[92],"three":[93],"types:":[94],"sensitive":[95,107],"submodules,":[96],"semi-sensitive":[97,121],"sub-modules,":[98,122],"insensitive":[100],"submodules.":[101],"applied":[105,119],"for":[106,120,181],"sub-modules":[108],"provide":[110],"highest":[112],"reliability,":[113],"while":[114],"gate":[115],"sizing":[116],"mitigate":[127],"minimize":[133],"introduced":[136],"fault-tolerant":[139],"techniques":[140],"efficiently.":[141],"order":[143],"verify":[145],"effectiveness":[147],"above":[150],"proposal,":[151],"appropriate":[152],"scheduling":[153],"schemes":[154],"combined":[155],"are":[159],"performed":[160],"an":[162],"FIR":[163,183],"filter.":[164],"simulations":[166],"it":[167],"shown":[169],"that,":[170],"reduction":[173],"area":[175],"relative":[176],"over":[179,189],"60%":[180],"design,":[184],"reach":[188],"99.9%.":[190]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}