{"id":"https://openalex.org/W2534302714","doi":"https://doi.org/10.1109/iolts.2016.7604683","title":"Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process","display_name":"Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2534302714","doi":"https://doi.org/10.1109/iolts.2016.7604683","mag":"2534302714"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604683","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604683","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050557990","display_name":"Konstantin Tscherkaschin","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Konstantin Tscherkaschin","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054389827","display_name":"Theodor Hillebrand","orcid":"https://orcid.org/0000-0003-0234-6884"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Theodor Hillebrand","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008083213","display_name":"Maike Taddiken","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Maike Taddiken","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101959993","display_name":"Steffen Paul","orcid":"https://orcid.org/0000-0003-3392-0471"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Steffen Paul","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017232274","display_name":"Dagmar Peters-Drolshagen","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dagmar Peters-Drolshagen","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5050557990"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":null,"apc_paid":null,"fwci":0.3675,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66481172,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"29","issue":null,"first_page":"121","last_page":"125"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.8592894077301025},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.714423418045044},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6126159429550171},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5832193493843079},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5439938306808472},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5324211120605469},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47172537446022034},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4606684446334839},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4215678870677948},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4192705750465393},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31917572021484375},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3190845251083374},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14671292901039124}],"concepts":[{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.8592894077301025},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.714423418045044},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6126159429550171},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5832193493843079},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5439938306808472},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5324211120605469},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47172537446022034},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4606684446334839},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4215678870677948},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4192705750465393},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31917572021484375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3190845251083374},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14671292901039124},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2016.7604683","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604683","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8100000023841858,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W268650034","https://openalex.org/W654799228","https://openalex.org/W1533614470","https://openalex.org/W1597620877","https://openalex.org/W1987940556","https://openalex.org/W2096434843","https://openalex.org/W2108324407","https://openalex.org/W2143033765","https://openalex.org/W2156824182","https://openalex.org/W2157389431","https://openalex.org/W2344193394","https://openalex.org/W2475944099","https://openalex.org/W2498970880"],"related_works":["https://openalex.org/W98453623","https://openalex.org/W2340624421","https://openalex.org/W2121982427","https://openalex.org/W2909296819","https://openalex.org/W2139891832","https://openalex.org/W2023668401","https://openalex.org/W2003183089","https://openalex.org/W2096016192","https://openalex.org/W2112520364","https://openalex.org/W1853015344"],"abstract_inverted_index":{"Inverters":[0],"are":[1],"one":[2],"of":[3,23,125,164],"the":[4,21,123,126,145],"most":[5],"basic":[6],"logic":[7],"blocks":[8],"and":[9,27,41,45,66,69,93,105,160],"exhibit":[10],"a":[11,60,64,83,102,111,150,161],"strong":[12],"temperature":[13,32,51,91,152],"dependency.":[14],"Additionally,":[15],"degradation":[16],"in":[17],"CMOS":[18],"transistors":[19],"affects":[20],"performance":[22],"circuits":[24],"over":[25,149],"time":[26,46,112,163],"is":[28,80],"strongly":[29],"dependent":[30],"on":[31,72,97],"during":[33],"circuit":[34,61,99],"operation.":[35],"In":[36],"order":[37],"to":[38,47,54,86,113,140,157],"design":[39,62,139,148],"robust":[40,65],"reliable":[42],"ring":[43,103],"oscillators":[44],"digital":[48,114],"converters,":[49],"both":[50],"dependencies":[52],"have":[53],"be":[55,132],"considered.":[56],"This":[57],"work":[58],"introduces":[59],"for":[63,101,110,128,136,144],"resilient":[67],"inverter":[68,79,130,138],"an":[70,106,129],"analysis":[71],"its":[73],"temperature-dependent":[74],"aging":[75,94],"characteristic.":[76],"The":[77,119],"implemented":[78],"driven":[81],"by":[82],"common-source":[84],"amplifier":[85],"achieve":[87],"high":[88],"robustness":[89],"against":[90],"variation":[92],"effects.":[95],"Based":[96],"this,":[98],"designs":[100],"oscillator":[104],"inverter-based":[107],"delay":[108,127],"line":[109],"converter":[115],"has":[116],"been":[117],"implemented.":[118],"results":[120],"show":[121],"that":[122],"deviation":[124],"can":[131],"minimized":[133],"from":[134,154],"13.2%":[135],"conventional":[137],"less":[141],"than":[142],"2%":[143],"temperature-and":[146],"aging-resistant":[147],"wide":[151],"range":[153],"-40\u00b0":[155],"C":[156,159],"150\u00b0":[158],"stress":[162],"ten":[165],"years.":[166]},"counts_by_year":[{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}