{"id":"https://openalex.org/W2537767489","doi":"https://doi.org/10.1109/iolts.2016.7604678","title":"On-line write margin estimator to monitor performance degradation in SRAM cores","display_name":"On-line write margin estimator to monitor performance degradation in SRAM cores","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2537767489","doi":"https://doi.org/10.1109/iolts.2016.7604678","mag":"2537767489"},"language":"en","primary_location":{"id":"doi:10.1109/iolts.2016.7604678","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604678","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027850952","display_name":"B. Alorda","orcid":"https://orcid.org/0000-0002-5617-6254"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"B. Alorda","raw_affiliation_strings":["Physics Dept., Illes Balears University, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Physics Dept., Illes Balears University, Palma de Mallorca, Spain","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061993871","display_name":"Cristian Carmona","orcid":"https://orcid.org/0000-0001-7872-535X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C. Carmona","raw_affiliation_strings":["Physics Dept., Illes Balears University, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Physics Dept., Illes Balears University, Palma de Mallorca, Spain","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021213940","display_name":"Gabriel Torrens","orcid":"https://orcid.org/0000-0002-3676-9992"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Torrens","raw_affiliation_strings":["Physics Dept., Illes Balears University, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Physics Dept., Illes Balears University, Palma de Mallorca, Spain","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028591446","display_name":"S.A. Bota","orcid":"https://orcid.org/0000-0002-7653-0740"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Bota","raw_affiliation_strings":["Physics Dept., Illes Balears University, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Physics Dept., Illes Balears University, Palma de Mallorca, Spain","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5027850952"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6539,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.85710752,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"90","last_page":"95"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9194788932800293},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.7174457311630249},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6453347206115723},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6233181953430176},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5932956337928772},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5823354125022888},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5622103214263916},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4927394688129425},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4760187268257141},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4550505578517914},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44180095195770264},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4307734966278076},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3792315721511841},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35492247343063354},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.3383104205131531},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.258260041475296},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.21919676661491394},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13863080739974976},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07478174567222595},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07273682951927185}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9194788932800293},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.7174457311630249},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6453347206115723},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6233181953430176},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5932956337928772},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5823354125022888},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5622103214263916},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4927394688129425},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4760187268257141},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4550505578517914},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44180095195770264},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4307734966278076},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3792315721511841},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35492247343063354},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.3383104205131531},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.258260041475296},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21919676661491394},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13863080739974976},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07478174567222595},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07273682951927185},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iolts.2016.7604678","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iolts.2016.7604678","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1503396677","https://openalex.org/W1964338627","https://openalex.org/W1979280283","https://openalex.org/W1996188635","https://openalex.org/W2009080282","https://openalex.org/W2071159343","https://openalex.org/W2090481579","https://openalex.org/W2112628818","https://openalex.org/W2137706187","https://openalex.org/W2171922263","https://openalex.org/W2172173999","https://openalex.org/W2325147690","https://openalex.org/W2327678638","https://openalex.org/W2345094463","https://openalex.org/W2788433071","https://openalex.org/W4234157327","https://openalex.org/W6704848303"],"related_works":["https://openalex.org/W2119312496","https://openalex.org/W4247460323","https://openalex.org/W2537086382","https://openalex.org/W2107909712","https://openalex.org/W2153162275","https://openalex.org/W2079259690","https://openalex.org/W2108986771","https://openalex.org/W789543267","https://openalex.org/W2075972383","https://openalex.org/W2094295436"],"abstract_inverted_index":{"SRAM":[0,51],"cell":[1],"sensitivity":[2],"to":[3,32,49],"process":[4],"variation":[5],"increases":[6],"aggressively":[7],"with":[8,70],"technology":[9],"scaling":[10],"trends.":[11],"Long-term":[12],"aging":[13],"parameter":[14],"variability":[15],"degrades":[16],"6T-SRAM":[17],"cells":[18],"performance":[19,52],"in":[20,74],"the":[21,34],"nanometre":[22],"era.":[23],"More":[24],"accurate":[25],"and":[26,65],"non-invasive":[27],"methodologies":[28],"must":[29],"be":[30,68],"provided":[31],"extend":[33],"free-failure":[35],"period":[36],"for":[37],"high":[38],"reliability":[39],"systems.":[40],"This":[41],"paper":[42],"proposes":[43],"a":[44,75],"Word-Line":[45],"Voltage":[46],"Margin":[47],"estimator":[48,57],"observe":[50],"degradation.":[53],"The":[54],"proposed":[55],"on-line":[56],"approach":[58],"does":[59],"not":[60],"require":[61],"memory":[62],"array":[63],"modification":[64],"it":[66],"can":[67],"shared":[69],"all":[71],"embedded":[72],"memories":[73],"SoC":[76],"reducing":[77],"its":[78],"area":[79],"overhead.":[80]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}